المؤلفون: Byung Yong Choi, Choong-Ho Lee, Yong Kyu Lee, Hyungcheol Shin, Jong Duk Lee, Byung-Gook Park, Dong-Won Kim, Suk-Kang Sung, Se Hoon Lee, Byung-Kyu Cho, Tae-Yong Kim, Eun Suk Cho, Jong Jin Lee, Donggun Park

المصدر: 2006 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on. :47-50 2006

Relation: Proceedings of the 2006 International Conference on Microelectronic Test Structures

المؤلفون: Young Joon Ahn, Hye Jin Cho, Hee Soo Kang, Choong-Ho Lee, Chul Lee, Jae-man Yoon, Tae Yong Kim, Eun Suk Cho, Suk-Kang Sung, Donggun Park, Kinam Kim, Byung-Il Ryu

المصدر: 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. Reliability physics Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International. :352-355 2005

Relation: 2005 IEEE International Reliability Physics Symposium. Proceedings 43rd Annual

المؤلفون: Young Joon Ahn, Hye Jin Cho, Hee Soo Kang, Choong-Ho Lee, Chul Lee, Jae-man Yoon, Tae Yong Kim, Eun Suk Cho, Suk-kang Sung, Donggun Park, Kinam Kim, Byung-Il Ryu

المصدر: Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. Microelectronic Test Structures Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on. :59-62 2005

Relation: ICMTS 2005. Proceedings of the 2005 International Conference on Microelectronic Test Structures

المؤلفون: Chul Lee, Jae-man Yoon, Choong-Ho Lee, Jong Chul Park, Tae Yong Kim, Hee Soo Kang, Suk Kang Sung, Eun Suk Cho, Hye Jin Cho, Young Joon Ahn, Donggun Park, Kinam Kim, Byung-Il Ryu

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :61-64 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Chang Woo Oh, Sung Dae Suk, Yong Kyu Lee, Suk Kang Sung, Jung-Dong Choe, Sung-Young Lee, Dong Uk Choi, Kyoung Hwan Yeo, Min Sang Kim, Sung-Min Kim, Ming Li, Sung Hwan Kim, Eun-Jung Yoon, Dong-Won Kim, Donggun Park, Kinam Kim, Byung-Il Ryu

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :893-896 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Suk-Kang Sung, Tae-Yong Kim, Eun Suk Cho, Hye Jin Cho, Byung Yong Choi, Chang Woo Oh, Byung-Kyu Cho, Choong-Ho Lee, Donggun Park

المصدر: IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 5(3):174-179 May, 2006

المؤلفون: Suk-Kang Sung, Il-Han Park, Chang Ju Lee, Yong Kyu Lee, Jong Duk Lee, Byung-Gook Park, Soo Doo Chae, Chung Woo Kim

المصدر: IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 2(4):258-264 Dec, 2003

المؤلفون: Dae Hwan Kim, Suk-Kang Sung, Kyung Rok Kim, Jong Duk Lee, Byung-Gook Park

المصدر: IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 1(4):170-175 Dec, 2002

المؤلفون: Dae Hwan Kim, Suk-Kang Sung, Kyung Rok Kim, Jong Duk Lee, Byung-Gook Park, Bum Ho Choi, Sung Woo Hwang, Doyeol Ahn

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 49(4):627-635 Apr, 2002

المؤلفون: Kyoung Hwan Yeo, Keun Hwi Cho, Ming Li, Sung Dae Suk, Yun-young Yeoh, Min-Sang Kim, Hyunjun Bae, Ji-Myoung Lee, Suk-Kang Sung, Jun Seo, Park, Bokkyoung, Dong-Won Kim, Park, Donggun, Won-Seoung Lee

المصدر: 2008 Symposium on VLSI Technology VLSI Technology, 2008 Symposium on. :138-139 Jun, 2008

Relation: 2008 Symposium on VLSI Technology