المؤلفون: Li, Jin-Fu, Tsai, Tsai-Ling, Hsu, Chun-Lung, Sun, Chi-Tien

المصدر: 2020 IEEE 29th Asian Test Symposium (ATS) Asian Test Symposium (ATS), 2020 IEEE 29th. :1-5 Nov, 2020

Relation: 2020 IEEE 29th Asian Test Symposium (ATS)

المؤلفون: Sugiarto, Tommy, Hsu, Chun-Lung, Sun, Chi-Tien, Ye, Shu-Hao, Lu, Kuan-Ting, Hsu, Wei-Chun

المصدر: 2020 Fourth IEEE International Conference on Robotic Computing (IRC) IRC Robotic Computing (IRC), 2020 Fourth IEEE International Conference on. :183-186 Nov, 2020

Relation: 2020 Fourth IEEE International Conference on Robotic Computing (IRC)

المؤلفون: Lu, Shyue-Kung, Tsai, Zeng-Long, Hsu, Chun-Lung, Sun, Chi-Tien

المصدر: 2020 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2020 IEEE International. :47-52 Sep, 2020

Relation: 2020 IEEE International Test Conference in Asia (ITC-Asia)

المؤلفون: Tsai, Tsai-Ling, Li, Jin-Fu, Hsu, Chun-Lung, Sun, Chi-Tien

المصدر: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2019 IEEE International Symposium on. :1-4 Oct, 2019

Relation: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

المؤلفون: Yang, Wei-Hsuan, Li, Jin-Fu, Hsu, Chun-Lung, Sun, Chi-Tien, Huang, Shih-Hsu

المصدر: 2019 International 3D Systems Integration Conference (3DIC) 3D Systems Integration Conference (3DIC), 2019 International. :1-3 Oct, 2019

Relation: 2019 International 3D Systems Integration Conference (3DIC)

المؤلفون: Chen, Han-Chun, Li, Jin-Fu, Hsu, Chun-Lung, Sun, Chi-Tien

المصدر: 2019 2nd International Conference on Communication Engineering and Technology (ICCET) Communication Engineering and Technology (ICCET), 2019 2nd International Conference on. :139-142 Apr, 2019

Relation: 2019 2nd International Conference on Communication Engineering and Technology (ICCET)

المؤلفون: Lu, Shyue-Kung, Tsai, Zeng-Long, Hsu, Chun-Lung, Sun, Chi-Tien

المصدر: 2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) VLSI Design, Automation and Test (VLSI-DAT), 2020 International Symposium on. :1-2 Aug, 2020

Relation: 2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)

المؤلفون: Li, Yu-Ting, Li, Jin-Fu, Hsu, Chun-Lung, Sun, Chi-Tien

المصدر: 2018 International SoC Design Conference (ISOCC) SoC Design Conference (ISOCC), 2018 International. :23-24 Nov, 2018

Relation: 2018 International SoC Design Conference (ISOCC)

المؤلفون: Cheng, Chun-Yuan, Wang, Jinn-Shyan, Chou, Pei-Yuan, Chen, Shiou-Ching, Sun, Chi-Tien, Chu, Yuan-Hua, Yang, Tzu-Yi

المصدر: 2014 IEEE Asian Solid-State Circuits Conference (A-SSCC) Solid-State Circuits Conference (A-SSCC), 2014 IEEE Asian. :361-364 Nov, 2014

Relation: 2014 IEEE Asian Solid-State Circuits Conference (A-SSCC)

المؤلفون: Tsai, Tsai-Ling, Li, Jin-Fu, Hsu, Chun-Lung, Sun, Chi-Tien

المصدر: In Microelectronics Reliability August 2021 123