المؤلفون: Lan, Y.S., Chen, C.D., Sun, S.W., Yen, W.C., Wang, Y.T., Yang, Y.H., Day, J.M., Hua, K.L.

المصدر: 2019 IEEE International Conference on Image Processing (ICIP) Image Processing (ICIP), 2019 IEEE International Conference onhttps://idams.ieee.org/idams/custom/properties/properties.jsp#. :2460-2460 Sep, 2019

Relation: 2019 IEEE International Conference on Image Processing (ICIP)

المؤلفون: Nie, J.J., Sun, S.W., Song, Y.C., Lu, B., Soh, A.K., Zhang, J.Q.

المصدر: In Journal of Energy Storage March 2022 47

المؤلفون: Chan, C.T., Kuo, C.H., Tang, C.J., Chen, M.C., Wang, T., Lu, S.H., Hu, H.C., Chen, T.F., Yang, C.K., Lee, M.T., Wu, D.Y., Chen, J.K., Chien, S.C., Sun, S.W.

المصدر: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :49-52 2004

Relation: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004

المؤلفون: Chung, S.S., Feng, H.J., Hsich, Y.S., Liu, A., Lin, W.M., Chen, D.F., Ho, J.H., Huang, K.T., Yang, C.L., Cheng, O., Sheng, Y.C., Wu, D.Y., Shiau, W.T., Chien, S.C., Kuan Liao, Sun, S.W.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :477-480 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Yang, C.K., Chen, T.F., Liang, C.S., Chen, T.J., Chang, T.C., Cheng, L.W., Lin, H.S., Li, G., Wu, D.Y., Chen, J.K., Chien, S.C., Sun, S.W., Cheek, J., Michael, M., Wu, D., Fisher, P., Wristers, D.

المصدر: ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. Solid-state device research - ESSDERC '03 European Solid-State Device Research, 2003. ESSDERC '03. 33rd Conference on. :415-418 2003

Relation: ESSDERC 2003. Proceedings of the 33rd European Solid-State Device Research - ESSDERC '03

المؤلفون: Chang, Y.C., Chen, J.B., Wu, S.S., Chu, C.L., Lee, L.T., Pai, H.J., Hwang, P.K., Sun, S.W., Chang, W.T., Hwang, J.W., Lee, I.T.

المصدر: IEEE Intelligent Network 2001 Workshop. IN 2001 Conference Record (Cat. No.01TH8566) Intelligent network 2001 workshop Intelligent Network Workshop, 2001 IEEE. :29-35 2001

Relation: IEEE Intelligent Network 2001 Workshop. IN 2001 Conference Record

المؤلفون: Chang, Y.C., Chen, J.B., Hu, C.S., Wu, R., Guo, M.S., Sun, S.W., Lee, M.F., Shih, M.Y., Ho, T.H., Yen, C.C.

المصدر: IEEE Intelligent Network 2001 Workshop. IN 2001 Conference Record (Cat. No.01TH8566) Intelligent network 2001 workshop Intelligent Network Workshop, 2001 IEEE. :212-215 2001

Relation: IEEE Intelligent Network 2001 Workshop. IN 2001 Conference Record

المؤلفون: Ho, C.M., Chen, T.C., Hseih, P., Chu, C., Houn, E., Su, K.J., Wang, P.M., Yew, W.C., Sun, S.W.

المصدر: Proceedings of ISSM2000. Ninth International Symposium on Semiconductor Manufacturing (IEEE Cat. No.00CH37130) Semiconductor manufacturing Semiconductor Manufacturing, 2000. Proceedings of ISSM 2000. The Ninth International Symposium on. :63-66 2000

Relation: Proceedings of ISSM2000. Ninth International Symposium on Semiconductor Manufacturing

المؤلفون: Lin, T., Chen, C., Hsu, S.Y., Tsai, M.J., Yew, T.R., Chou, J.W., Huang, K.T., Wu, J.Y., Ku, Y.C., Liu, C.C., Yang, M.S., Yeh, W.K., Huang, C.H., Lur, W., Huang, H.S., Sun, S.W.

المصدر: 1998 Semiconductor Manufacturing Technology Workshop (Cat. No.98EX133) Semiconductor manufacturing technology Semiconductor Manufacturing Technology Workshop, 1998. :57-60 1998

Relation: 1998 Semiconductor Manufacturing Technology Workshop

المؤلفون: Sun, S.W.

المصدر: 1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105) Solid-state and integrated circuit technology Solid-State and Integrated Circuit Technology, 1998. Proceedings. 1998 5th International Conference on. :52-55 1998

Relation: Proceedings of Fifth International Conference on Solid-State and Integrated Circuit Technology-ICSICT'98