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1مؤتمر
المؤلفون: Maeda, S., You-Seung Jin, Jung-A Choi, Sun-Young Oh, Hyun-Woo Lee, Jae-Yoon Yoo, Min-Chul Sun, Ja-Hum Ku, Kwon Lee, Su-Gon Bae, Sung-Gun Kang, Jeong-Hwan Yang, Young-Wug Kim, Kwang-Pyuk Suh
المصدر: Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. VLSI technology VLSI Technology, 2004. Digest of Technical Papers. 2004 Symposium on. :102-103 2004
Relation: 2004 Symposium on VLSI Technology. Digest of Technical Papers
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المؤلفون: Nak-Jin Son, Yongmin Park, Hwa-Sung Rhee, Sung Gun Kang, Sung-il Cho, Kyung-Hwan Yeo, Eun-Cheol Lee, Yun-Ki Choi, Jong Shik Yoon, Heebum Hong, Jeong-Hoon Ahn, Dongwoo Kim, Il-Ryong Kim, Jungtae Kim, Jong Mil Youn, Jae-Hun Jeong
المصدر: 2018 IEEE Symposium on VLSI Technology.
مصطلحات موضوعية: 010302 applied physics, Cryptocurrency, Computer science, Volume (computing), Process (computing), 01 natural sciences, Automotive engineering, High volume manufacturing, Power (physics), Reduction (complexity), Logic gate, 0103 physical sciences, 010301 acoustics, Scaling
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::40b1037773b5c94d6df5444162cc2a3a
https://doi.org/10.1109/vlsit.2018.8510673 -
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المؤلفون: Ping Liu, Sung-Gun Kang, Jackie Yang, S. C. Song, Xiao-Yong Wang, Yanxiang Liu, Jedon Kim, Yandong Gao, Lixin Ge, Suh Youseok, Sam Yang, Jie Deng, Sung-Won Kim, Xiangdong Chen, Peijie Feng, Ken Rim, John Jianhong Zhu, Ming Cai, Chul-Yong Park, Da Yang, Jun Yuan, Hao Wang, Jihong Choi, Esin Terzioglu, P. R. Chidi Chidambaram, Jerry Bao, Paul Ivan Penzes
المصدر: 2017 Symposium on VLSI Technology.
مصطلحات موضوعية: 010302 applied physics, Engineering, Stress effects, business.industry, Electrical engineering, 02 engineering and technology, 01 natural sciences, 020202 computer hardware & architecture, Power (physics), Gigabit, Logic gate, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Technology scaling, Mobile telephony, Design and Technology, business, Scaling
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5fb3c14e2e395aa29531c80076ca0460
https://doi.org/10.23919/vlsit.2017.7998203 -
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المؤلفون: Dong-Won Kim, JiYeon Ku, Y. S. Bang, Junha Lee, S. M. Lim, Bum-Suk Kim, J. H. Do, S. D. Kwon, Jung-Chak Ahn, Jeong-Hyuk Choi, Y. C. Kim, H.-J. Cho, Sang-il Jung, Sung-Gun Kang, Taejoong Song, S. W. Paek, Won-Cheol Jeong, J. H. Jung, S. W. Ahn, Y. S. Yoon, Jong Shik Yoon
المصدر: 2017 Symposium on VLSI Technology.
مصطلحات موضوعية: Very-large-scale integration, Random access memory, Engineering, Optics, business.industry, Scalability, ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION, Optoelectronics, Static random-access memory, business, Lithography
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::018cd547c8f07b2981b2a159d22ddf67
https://doi.org/10.23919/vlsit.2017.7998156 -
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المؤلفون: sung-gun Kang, Inhyae Yi
المصدر: Korean Journal of Health Psychology. 16:501-520
مصطلحات موضوعية: Addiction, media_common.quotation_subject, Cognition, Psychology, Function (engineering), Pathological, media_common, Clinical psychology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0b1a279faf92a3e80f0e7a6647fbd3f8
https://doi.org/10.17315/kjhp.2011.16.3.005 -
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المؤلفون: Cheong-Sig Kim, Sung-gun Kang, Seung-Yeon Hahm, Tae-Cheon Rho
المصدر: Journal of JSEE. 54:50-54
مصطلحات موضوعية: International level, Financial engineering, Engineering, ComputingMilieux_THECOMPUTINGPROFESSION, business.industry, Engineering education, Quality education, ComputingMilieux_COMPUTERSANDEDUCATION, Position (finance), Engineering ethics, business, Accreditation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ffcd136fdc6b7cad86652afa415a4d8a
https://doi.org/10.4307/jsee.54.6_50 -
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المؤلفون: Sung Hun Kim, Sun Jong Wang, Sung Gun Kang, Jun Sup Lee, Yong-han Roh
المصدر: 2012 SEMI Advanced Semiconductor Manufacturing Conference.
مصطلحات موضوعية: Stress (mechanics), Void (astronomy), Materials science, CMOS, law, Shallow trench isolation, Transistor, Trench, Electronic engineering, Composite material, NMOS logic, law.invention, PMOS logic
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d75ca9bafc6ffeaac3a45eb360ae7cf4
https://doi.org/10.1109/asmc.2012.6212900 -
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المؤلفون: Min-Chul Sun, Kwon Lee, Jeong-Hwan Yang, You-Seung Jin, Hyun-Woo Lee, Young-Wug Kim, Shigenobu Maeda, Jung-A Choi, Sun-Young Oh, Su-Gon Bae, Jae-Yoon Yoo, Sung-Gun Kang, Kwang-Pyuk Suh, Ja-hum Ku
المصدر: Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004..
مصطلحات موضوعية: Engineering, Stress effects, business.industry, Gate dielectric, Transistor, ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION, law.invention, Stress (mechanics), CMOS, law, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Flicker noise, business, Performance enhancement, Degradation (telecommunications)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b0de98c1922e9f4624e544ab2af31ec0
https://doi.org/10.1109/vlsit.2004.1345417