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1مؤتمر
المؤلفون: Hi-Deok Lee, Hee-Hwan Ji, In-Sik Han, Han-Soo Joo, Dae-Mann Kim, Sung-Hyung Park, Heui-Seung Lee, Won-Joon Ho, Dae-Byung Kim, Ihl-Hyun Cho, Sang-Young Kim, Sung-Bo Hwang, Jeong-Gon Lee, Jin-Won Park
المصدر: 2006 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on. :218-221 2006
Relation: Proceedings of the 2006 International Conference on Microelectronic Test Structures
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2مؤتمر
المؤلفون: Sung-Hyung Park, Hi-Deok Lee, Key-Min Lee, Myoung-Jun Jang, Joo-Hyoung Lee, Geun-Suk Park, Ki-Seok Yoon, Jung-Hoon Choi, Young-Jin Park, Hee-Goo Youn
المصدر: 2001 6th International Symposium on Plasma- and Process-Induced Damage (IEEE Cat. No.01TH8538) Plasma- and process-induced damage Plasma- and Process-Induced Damage, 2001 6th International Symposium on. :124-127 2001
Relation: 2001 6th International Symposium on Plasma- and Process-Induced Damage
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3دورية أكاديمية
المؤلفون: Joo-Hyoung Lee, Sung-Hyung Park, Key-Min Lee, Ki-Seok Youn, Young-Jin Park, Chel-Jong Choi, Tae-Yeon Seong, Hi-Deok Lee
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 49(11):1985-1992 Nov, 2002
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4مؤتمر
المؤلفون: Hee-Hwan Ji, Yong-Goo Kim, In-Shik Han, Kyung-Min Kim, Jin-Suk Wang, Hi-Deok Lee, Won-Joon Ho, Sung-Hyung Park, Heui-Seung Lee, Young-Seok Kang, Dae-Byung Kim, Chang-Young Lee, Ihl-Hyun Cho, Sang-Young Kim, Sung-Bo Hwang, Jeong-Gun Lee, Jin-Won Park
المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :4 pp.-707 2005
Relation: International Electron Devices Meeting 2005
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5
المؤلفون: Sung-Hyung Park, Youn-sik Park, Youngjin Park
المصدر: International Journal of Automotive Technology. 17:1045-1053
مصطلحات موضوعية: 0209 industrial biotechnology, Engineering, business.industry, 020209 energy, Control engineering, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Active fault, Residual, Fault (power engineering), System dynamics, Fault indicator, Stuck-at fault, 020901 industrial engineering & automation, Control theory, Automotive Engineering, Fault coverage, 0202 electrical engineering, electronic engineering, information engineering, Actuator, business
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6
المؤلفون: Heui-Seung Lee, Kyong-Jin Hwang, Sung-Hyung Park, Jung-Eun Lim, In-Shik Han, Ook-Sang You, Won-Ho Choi, Hee-Hwan Ji, Hi-Deok Lee, Dae-Byung Kim
المصدر: IEEE Transactions on Electron Devices. 55:1352-1358
مصطلحات موضوعية: Stress (mechanics), Compressive strength, Negative-bias temperature instability, Materials science, Ultimate tensile strength, Stress–strain curve, Electronic engineering, Strained silicon, Electrical and Electronic Engineering, Composite material, NMOS logic, Electronic, Optical and Magnetic Materials, PMOS logic
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4ee4fc53cd53673f05433baec5a564b9
https://doi.org/10.1109/ted.2008.921061
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7
المؤلفون: Dae-Byung Kim, Young-Seok Kang, Heui-Seung Lee, In-Shik Han, Min-Ki Na, Tae-Gyu Goo, Ook-Sang Yoo, Yong-Goo Kim, Hee-Hwan Ji, Hi-Deok Lee, Won-Ho Choi, Sung-Hyung Park
المصدر: Japanese Journal of Applied Physics. 47:2628-2632
مصطلحات موضوعية: Negative-bias temperature instability, Recovery effect, Materials science, Physics and Astronomy (miscellaneous), business.industry, General Engineering, Oxide, Dangling bond, General Physics and Astronomy, Dielectric, chemistry.chemical_compound, chemistry, Degradation (geology), Optoelectronics, Field-effect transistor, business, Nitriding
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8
المؤلفون: Jang-Gn Yun, Soon-Young Oh, Yong-Goo Kim, Yong-Jin Kim, Heui-Seung Lee, Han-Seob Cha, Ui-Sik Kim, Hee-Hwan Ji, Hi-Deok Lee, Sung-Hyung Park, Bin-Feng Huang, Sang-Bum Hu, Dae-Byung Kim, Jeong-Gun Lee
المصدر: IEEE Transactions On Nanotechnology. 6:485-491
مصطلحات موضوعية: Materials science, Silicon, Annealing (metallurgy), Alloy, Metallurgy, Analytical chemistry, chemistry.chemical_element, engineering.material, Salicide, Computer Science Applications, Overlayer, chemistry, engineering, Thermal stability, Electrical and Electronic Engineering, Tin, Sheet resistance
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::10b16acd0c9d15f4ab8fa6febef2f673
https://doi.org/10.1109/tnano.2007.897083
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9
المؤلفون: Sung-Hyung Park, Heui-Seung Lee, Hee-Hwan Ji, Hi-Deok Lee, Tae-Gyu Goo, Ook-Sang You, In-Shik Han, Won-Ho Choi, Young-Seok Kang, Dae-Byung Kim
المصدر: Journal of the Korean Institute of Electrical and Electronic Material Engineers. 20:569-574
مصطلحات موضوعية: Stress (mechanics), chemistry.chemical_compound, Materials science, chemistry, Gate oxide, Oxide, Analytical chemistry, Degradation (geology), chemistry.chemical_element, Plasma, Nitrogen, Capacitance, Nitriding
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3854d705ab96c3bb172d8b865accbc09
https://doi.org/10.4313/jkem.2007.20.7.569 -
10
المؤلفون: Hi Deok Lee, Yu−Be Park, Dong−Sun Kim, Dae Byung Kim, Won−Joon Ho, Jae−Yeong Kim, In Shik Han, Sung Hyung Park
المصدر: Japanese Journal of Applied Physics. 45:2455-2458
مصطلحات موضوعية: Materials science, Negative-bias temperature instability, Physics and Astronomy (miscellaneous), Passivation, business.industry, Annealing (metallurgy), Transistor, General Engineering, General Physics and Astronomy, Sintering, Nitride, law.invention, Back end of line, law, Optoelectronics, business, NMOS logic
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