المؤلفون: Hyung-Suk Jung, Sung Kee Han, Min Joo Kim, Jong Pyo Kim, Yun-Seok Kim, Ha Jin Lim, Seok Joo Doh, Jung Hyoung Lee, Mi Young Yu, Jong-Ho Lee, Nae-In Lee, Ho-Kyu Kang, Seong Geon Park, Sang Bom Kang

المصدر: 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. Reliability physics Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International. :50-54 2005

Relation: 2005 IEEE International Reliability Physics Symposium. Proceedings 43rd Annual

المؤلفون: Jong Pyo Kim, Yun-Seok Kim, Ha Jin Lim, Jung Hyoung Lee, Seok Joo Doh, Hyung-Suk Jung, Sung-Kee Han, Min-Joo Kim, Jong-Ho Lee, Nae-In Lee, Ho-Kyu Kang, Kwang-Pyuk Suh, Young-Su Chung

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :125-128 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Yun-Seok Kim, Ha Jin Lim, Hyung-Suk Jung, Jong-Ho Lee, Jae-Eun Park, Sung Kee Han, Jung Hyoung Lee, Seok-Joo Doh, Jong Pyo Kim, Nae In Lee, Ho-Kyu Kang, Youngsu Chung, Hae Young Kim, Nam Kyu Lee, Ramanathan, S., Seidel, T., Boleslawski, M., Irvine, G., Byung-Ki Kim, Hyeung-Ho Lee

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :511-514 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Hyung-Suk Jung, Jong-Ho Lee, Sung Kee Han, Yun-Seok Kim, Ha Jin Lim, Min Joo Kim, Seok Joo Doh, Mi Young Yu, Nae-In Lee, Hye-Lan Lee, Taek-Soo Jeon, Hag-Ju Cho, Sang Bom Kang, Sang Yong Kim, Im Soo Park, Dongchan Kim, Hion Suck Baik, Young Su Chung

المصدر: Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005. VLSI Technology VLSI Technology, 2005. Digest of Technical Papers. 2005 Symposium on. :232-233 2005

Relation: 2005 Symposium on VLSI Technology

المؤلفون: Seok Joo Doh, Jung Hyoung Lee, Jong Pyo Kim, Jong-Ho Lee, Yun-Seok Kim, Ha-Jin Lim, Hyung-Suk Jung, Sung Kee Han, Min Joo Kim, Nae-In Lee, Ho-Kyu Kang, Seong Geon Park, Sang Bom Kang

المصدر: 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. Reliability physics Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. 2005 IEEE International. :630-631 2005

Relation: 2005 IEEE International Reliability Physics Symposium. Proceedings 43rd Annual

المؤلفون: Hong-jae Shin, Woon-kyung Lee, Sungwoo Hwang, H. K. Kang, Hyung-Jong Lee, S. J. Kim, W. Chang, R. Ashcraft, S.O. Park, J.H. Song, Gwan-Hyeob Koh, Sung-Kee Han, Jinseong Heo, J.Y. Lee, Y.S. Choi, T. Ha, Duhyun Lee

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: Scope (project management), business.industry, Computer science, Deep learning, Scale (chemistry), Neural processing, Systems engineering, Artificial intelligence, business, AI winter, Quantum computer

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7d337892c91ec6342538cc1444c76258
https://doi.org/10.1109/iedm13553.2020.9372061

المؤلفون: E. S. Jung, Jin-Seong Park, Shin-Deuk Kim, Hyeongsun Hong, Jung-hyeon Kim, J.M. Park, C. H. Cho, G. Y. Jin, S.W. Nam, Sung-Kee Han, Kwan-Heum Lee, Byoung-Ho Kim, Soo-Ho Shin, Jeong-Wook Seo, Young-Nam Hwang

المصدر: 2015 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: Materials science, business.industry, Extreme ultraviolet lithography, Nanotechnology, Capacitance, law.invention, Capacitor, law, Extreme ultraviolet, Optoelectronics, Breakdown voltage, business, Lithography, Next-generation lithography, Dram

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7205fb853918535489514bc82307ea4f
https://doi.org/10.1109/iedm.2015.7409774

المؤلفون: Cheol-kyu Lee, Eun Ha Lee, Jong-Ho Lee, Hionsuck Baik, Mong sub Lee, Youngsu Chung, Nae-In Lee, Sung Kee Han, Ho-Kyu Kang, Yun Ki Choi, Young-Sub You, Hyung-Suk Jung, Hajin Lim, Jong-Bong Park

المصدر: 2007 IEEE Symposium on VLSI Technology.

مصطلحات موضوعية: Materials science, Negative-bias temperature instability, Fabrication, business.industry, Etching, Doping, Electrical engineering, Optoelectronics, Metal gate, business, NMOS logic, Voltage, PMOS logic

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::addd3f2b638b2d9f05be693ff9c4b954
https://doi.org/10.1109/vlsit.2007.4339690

المؤلفون: Cheol-kyu Lee, Min-Joo Kim, Jong-Ho Lee, Hyung-Suk Jung, Young-Sub You, Young Su Chung, Ho-Kyu Kang, Hionsuck Baik, Hajin Lim, Sung Kee Han, Mong sub Lee, Nae In Lee, Eunha Lee

المصدر: 2006 International Electron Devices Meeting.

مصطلحات موضوعية: Materials science, Silicon, business.industry, chemistry.chemical_element, Nanotechnology, PMOS logic, Atomic layer deposition, Stack (abstract data type), chemistry, MOSFET, Optoelectronics, Metal gate, business, NMOS logic, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a2b4619b61ccca2ba78077b45f374fbb
https://doi.org/10.1109/iedm.2006.346860

المؤلفون: Cheol-kyu Lee, Jong-Ho Lee, Youngsu Chung, Hionsuck Baik, Yunseok Kim, Nae-In Lee, Hajin Lim, Seul-Gi Kim, Ho-Kyu Kang, Min-Joo Kim, Young-Sub You, Mi Young Yu, Mong sub Lee, Sung Kee Han, Hyung-Suk Jung

المصدر: 2006 Symposium on VLSI Technology, 2006. Digest of Technical Papers..

مصطلحات موضوعية: Electron mobility, Materials science, Stack (abstract data type), business.industry, Gate oxide, Doping, Gate dielectric, Electronic engineering, Optoelectronics, business, NMOS logic, High-κ dielectric, PMOS logic

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::290527b97d90facc5eeb35d38d03da8b
https://doi.org/10.1109/vlsit.2006.1705267