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1دورية أكاديمية
المؤلفون: Satoshi Nashimoto, Tatsuro Inoue, Kazuki Hotta, Yuichi Sugito, Susumu Iida, Atsuhiro Tsubaki
المصدر: Physiological Reports, Vol 10, Iss 8, Pp n/a-n/a (2022)
مصطلحات موضوعية: activities of daily living, aortic valve stenosis, conservative management, rehabilitation, symptomatic, Physiology, QP1-981
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2051-817X
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2دورية أكاديمية
المصدر: Physiological Reports, Vol 9, Iss 5, Pp n/a-n/a (2021)
مصطلحات موضوعية: aerobic threshold, atrial fibrillation, cardiopulmonary exercise test, elderly, Face Scale, physiological parameters, Physiology, QP1-981
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2051-817X
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3دورية أكاديمية
المؤلفون: Susumu Iida, Takayuki Uchiyama
المصدر: Micro and Nano Engineering, Vol 3, Iss , Pp 44-49 (2019)
مصطلحات موضوعية: Electronics, TK7800-8360, Technology (General), T1-995
وصف الملف: electronic resource
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المؤلفون: Tetsuro Kobayashi, Takashi Takata, Yoshiyuki Narumiya, Susumu Iida
المصدر: Journal of the Atomic Energy Society of Japan. 63:50-54
مصطلحات موضوعية: 2019-20 coronavirus outbreak, Nuclear Energy and Engineering, Coronavirus disease 2019 (COVID-19), business.industry, Severe acute respiratory syndrome coronavirus 2 (SARS-CoV-2), Pandemic, Medicine, business, Virology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d4960bc39b11699c0fc0d2e9f104ae89
https://doi.org/10.3327/jaesjb.63.1_50 -
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المؤلفون: Takayuki Uchiyama, Susumu Iida
المصدر: Micro and Nano Engineering, Vol 3, Iss, Pp 44-49 (2019)
مصطلحات موضوعية: Standard sample, Materials science, business.industry, lcsh:Electronics, lcsh:TK7800-8360, Condensed Matter Physics, Space (mathematics), Line edge roughness, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, stomatognathic diseases, Optics, lcsh:Technology (General), Micro defects, lcsh:T1-995, Electrical and Electronic Engineering, Line (text file), business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::700aec207afb0da2a4d5c4812907c796
http://www.sciencedirect.com/science/article/pii/S2590007219300152 -
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المؤلفون: Tadashi Narabayashi, Masanobu Kamiya, Katsuya Kuroiwa, Susumu Iida, Katsumi Ebisawa, Toshihiro Aida
المصدر: Journal of the Atomic Energy Society of Japan. 59:530-534
مصطلحات موضوعية: Accident (fallacy), Nuclear Energy and Engineering, Accident management, Computer science, Forensic engineering, Fault (power engineering), Risk evaluation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::166c6cca7aca16baf1c620e2e2ab9090
https://doi.org/10.3327/jaesjb.59.9_530 -
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المؤلفون: Ryoichi Hirano, Susumu Iida, Hidehiro Watanabe, Kaoru Ohya
المصدر: Applied Surface Science. 384:244-250
مصطلحات موضوعية: 010302 applied physics, Auger electron spectroscopy, Work (thermodynamics), Chemistry, Monte Carlo method, Analytical chemistry, Oxide, General Physics and Astronomy, 02 engineering and technology, Surfaces and Interfaces, General Chemistry, Electron, Contamination, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Surfaces, Coatings and Films, chemistry.chemical_compound, 0103 physical sciences, Rectangular potential barrier, 0210 nano-technology, Deposition (law)
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المؤلفون: Shunko Magoshi, Satoshi Tanaka, Susumu Iida, Takashi Kamo, Takayuki Uchiyama, Yasutaka Morikawa, Takeshi Yamane
المصدر: Extreme Ultraviolet (EUV) Lithography X.
مصطلحات موضوعية: Reduction (complexity), Materials science, business.industry, Extreme ultraviolet lithography, Extreme ultraviolet, Optoelectronics, business, Lithography, Small field
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6c087f180a3305c18a54f40ce7922141
https://doi.org/10.1117/12.2515273 -
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المؤلفون: Takamitsu Nagai, Takayuki Uchiyama, Susumu Iida
المصدر: Metrology, Inspection, and Process Control for Microlithography XXXIII.
مصطلحات موضوعية: Microscope, Materials science, business.industry, Substrate (electronics), law.invention, Wafer fabrication, Etching (microfabrication), law, Distortion, Charge control, Optoelectronics, Wafer, business, Electron-beam lithography
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d1d46b175f6bf736b5049a248ba80448
https://doi.org/10.1117/12.2514897 -
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المؤلفون: Takamitsu Nagai, Susumu Iida, Takayuki Uchiyama
المصدر: Journal of Micro/Nanolithography, MEMS, and MOEMS. 18:1
مصطلحات موضوعية: Materials science, business.industry, Scanning electron microscope, Mechanical Engineering, Resolution (electron density), 02 engineering and technology, Surface finish, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Metrology, 010309 optics, 0103 physical sciences, Charge control, Optoelectronics, Node (circuits), Wafer, Electrical and Electronic Engineering, 0210 nano-technology, business, Lithography
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6057ae9fd0b2b91133718c4c1e8614c9
https://doi.org/10.1117/1.jmm.18.3.033503