-
1دورية أكاديمية
Alternate Title: L’échographie pour l’évaluation des traumatismes de la main chez les enfants : revue de littérature (French)
المؤلفون: Ma, Y., Taylor, L., Swift, C., Mitchell, S., Thyagarajan, M., Jester, A., Al-Ani, S.
المصدر: In Annales de chirurgie plastique esthétique June 2023 68(3):260-269
-
2دورية أكاديمية
المؤلفون: Martin, M., Zielinski, C., Ruiz-Borrego, M., Carrasco, E., Turner, N., Ciruelos, E.M., Muñoz, M., Bermejo, B., Margeli, M., Anton, A., Kahan, Z., Csöszi, T., Casas, M.I., Murillo, L., Morales, S., Alba, E., Gal-Yam, E., Guerrero-Zotano, A., Calvo, L., de la Haba-Rodriguez, J., Ramos, M., Alvarez, I., Garcia-Palomo, A., Huang Bartlett, C., Koehler, M., Caballero, R., Corsaro, M., Huang, X., Garcia-Sáenz, J.A., Chacón, J.I., Swift, C., Thallinger, C., Gil-Gil, M.
المصدر: In Annals of Oncology April 2021 32(4):488-499
-
3مؤتمر
المؤلفون: Kuo, C., Chrudimsky, D., Jew, T., Gallun, C., Choy, J., Wang, B., Pessoney, S., Choe, H., Harrington, C., Eguchi, R., Strauss, T., Prinz, E., Swift, C.
المصدر: Seventh Biennial IEEE International Nonvolatile Memory Technology Conference. Proceedings (Cat. No.98EX141) Nonvolatile memory technology Nonvolatile Memory Technology Conference, 1998. 1998 Proceedings. Seventh Biennial IEEE. :28-33 1998
Relation: Seventh Biennial IEEE International Nonvolatile Memory Technology Conference. Proceedings
-
4دورية أكاديمية
المؤلفون: Swift, C., Reisman, S.
المصدر: IT Professional IT Prof. IT Professional. 8(1):25-31 Jan, 2006
-
5مؤتمر
المؤلفون: Steimle, R.F., Rao, R., Sadd, M., Swift, C., Hradsky, B., Straub, S., Merchant, T., Stoker, M., Parikh, C., Anderson, S., Rossow, M., Yater, J., Acred, B., Harber, K., Prinz, E., White, B.E., Jr., Muralidhar, R.
المصدر: 4th IEEE Conference on Nanotechnology, 2004. Nanotechnology Nanotechnology, 2004. 4th IEEE Conference on. :290-292 2004
Relation: 2004 4th IEEE Conference on Nanotechnology
-
6مؤتمر
المؤلفون: Bennett, E., Knapp, E., Swift, C.
المصدر: 1995 International Geoscience and Remote Sensing Symposium, IGARSS '95. Quantitative Remote Sensing for Science and Applications IGARSS '95 Geoscience and Remote Sensing Symposium, 1995. IGARSS '95. 'Quantitative Remote Sensing for Science and Applications', International. 1:422-425 vol.1 1995
Relation: 1995 International Geoscience and Remote Sensing Symposium, IGARSS '95. Quantitative Remote Sensing for Science and Applications
-
7مؤتمر
المؤلفون: Le Vine, D.M., Carver, K., Swift, C., Goodberlet, M., Popstefanija, I., Mead, J.
المصدر: IGARSS 2000. IEEE 2000 International Geoscience and Remote Sensing Symposium. Taking the Pulse of the Planet: The Role of Remote Sensing in Managing the Environment. Proceedings (Cat. No.00CH37120) Geoscience and remote sensing Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International. 7:2994-2996 vol.7 2000
Relation: IGARSS 2000. IEEE 2000 International Geoscience and Remote Sensing Symposium. Taking the Pulse of the Planet: The Role of Remote Sensing in Managing the Environment
-
8مؤتمر
المؤلفون: Galloway, J., Goodberlet, M., Swift, C.
المصدر: IGARSS'97. 1997 IEEE International Geoscience and Remote Sensing Symposium Proceedings. Remote Sensing - A Scientific Vision for Sustainable Development IGARSS '97 Geoscience and Remote Sensing, 1997. IGARSS '97. Remote Sensing - A Scientific Vision for Sustainable Development., 1997 IEEE International. 2:1012-1014 vol.2 1997
Relation: IGARSS'97. 1997 IEEE International Geoscience and Remote Sensing Symposium Proceedings. Remote Sensing - A Scientific Vision for Sustainable Development
-
9مؤتمر
المؤلفون: Prinz, E.J., Yater, J., Steimle, R., Sadd, M., Swift, C., Ko-Min Chang
المصدر: 2006 21st IEEE Non-Volatile Semiconductor Memory Workshop Non-Volatile Semiconductor Memory Workshop, 2006. IEEE NVSMW 2006. 21st. :62-63 2006
Relation: 2006 21st IEEE Non-Volatile Semiconductor Memory Workshop
-
10دورية أكاديمية
المؤلفون: Kuo-Tung Chang, Wei-Ming Chen, Swift, C., Higman, J.M., Paulson, W.M., Ko-Min Chang
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 19(7):253-255 Jul, 1998