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1دورية أكاديمية
المؤلفون: Mahwish Sarwar, Renata Ratajczak, Vitalii Yu. Ivanov, Sylwia Gieraltowska, Aleksandra Wierzbicka, Wojciech Wozniak, René Heller, Stefan Eisenwinder, Elżbieta Guziewicz
المصدر: Materials, Vol 17, Iss 16, p 3979 (2024)
مصطلحات موضوعية: Ga2O3, Yb, Rutherford backscattering, photoluminescence, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85
وصف الملف: electronic resource
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2دورية أكاديمية
المؤلفون: Sylwia Gieraltowska, Lukasz Wachnicki, Piotr Dluzewski, Bartlomiej S. Witkowski, Marek Godlewski, Elzbieta Guziewicz
المصدر: Materials, Vol 16, Iss 11, p 4077 (2023)
مصطلحات موضوعية: ALD, high-k dielectric, HfO2, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85
وصف الملف: electronic resource
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3دورية أكاديمية
المؤلفون: Renata Ratajczak, Elzbieta Guziewicz, Slawomir Prucnal, Cyprian Mieszczynski, Przemysław Jozwik, Marek Barlak, Svitlana Romaniuk, Sylwia Gieraltowska, Wojciech Wozniak, René Heller, Ulrich Kentsch, Stefan Facsko
المصدر: Materials, Vol 16, Iss 5, p 1756 (2023)
مصطلحات موضوعية: wide bandgap oxides, zinc oxide, rare earth, ion implantation, annealing, RTA, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85
وصف الملف: electronic resource
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4دورية أكاديمية
المؤلفون: Aleksandra Seweryn, Krystyna Lawniczak-Jablonska, Piotr Kuzmiuk, Sylwia Gieraltowska, Marek Godlewski, Robert Mroczynski
المصدر: Materials, Vol 14, Iss 18, p 5395 (2021)
مصطلحات موضوعية: ALD, AFM, MIS, high-k dielectric, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85
وصف الملف: electronic resource
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5دورية أكاديمية
المؤلفون: Rafal Pietruszka, Bartlomiej S. Witkowski, Grzegorz Luka, Lukasz Wachnicki, Sylwia Gieraltowska, Krzysztof Kopalko, Eunika Zielony, Piotr Bieganski, Ewa Placzek-Popko, Marek Godlewski
المصدر: Beilstein Journal of Nanotechnology, Vol 5, Iss 1, Pp 173-179 (2014)
مصطلحات موضوعية: atomic layer deposition, hydrothermal method, solar cells, zinc oxide, zinc oxide nanorods, Technology, Chemical technology, TP1-1185, Science, Physics, QC1-999
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2190-4286
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6
المؤلفون: Sylwia Gieraltowska, M. Sobanska, Zbigniew R. Zytkiewicz, Piotr Kuzmiuk, K. Klosek, Krystyna Lawniczak-Jablonska
المصدر: RSC Advances. 10:27932-27939
مصطلحات موضوعية: 010302 applied physics, Materials science, General Chemical Engineering, chemistry.chemical_element, 02 engineering and technology, General Chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, Nitrogen, Amorphous solid, Atomic layer deposition, Chemical state, X-ray photoelectron spectroscopy, Chemical bond, Chemical engineering, chemistry, 0103 physical sciences, Sapphire, 0210 nano-technology, Stoichiometry
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::71f6d1d74f5364acc2eee14bbe4865b0
https://doi.org/10.1039/d0ra05104g -
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المؤلفون: Krystyna Lawniczak-Jablonska, Robert Mroczyński, Sylwia Gieraltowska, Aleksandra Seweryn, Piotr Kuzmiuk, Marek Godlewski
المصدر: Materials
Volume 14
Issue 18
Materials, Vol 14, Iss 5395, p 5395 (2021)مصطلحات موضوعية: Technology, Materials science, Ozone, Relative permittivity, Dielectric, Article, chemistry.chemical_compound, Vacancy defect, General Materials Science, high-k dielectric, Thin film, High-κ dielectric, Microscopy, QC120-168.85, Dopant, biology, QH201-278.5, MIS, Engineering (General). Civil engineering (General), Hafnia, biology.organism_classification, TK1-9971, Descriptive and experimental mechanics, chemistry, Chemical engineering, ALD, Electrical engineering. Electronics. Nuclear engineering, TA1-2040, AFM
وصف الملف: application/pdf
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8
المؤلفون: Lukasz Wachnicki, Sylwia Gieraltowska, Bartlomiej S. Witkowski, Marek Godlewski, Elzbieta Guziewicz
المصدر: Materials Science in Semiconductor Processing. 148:106792
مصطلحات موضوعية: Mechanics of Materials, Mechanical Engineering, General Materials Science, Condensed Matter Physics
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9
المؤلفون: Lukasz Wachnicki, Marek Godlewski, Sylwia Gieraltowska
المصدر: Acta Physica Polonica A. 134:1221-1225
مصطلحات موضوعية: Atomic layer deposition, Spin coating, Materials science, business.industry, White light, General Physics and Astronomy, Optoelectronics, Phosphor, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::85ec4bc94a0b86df8dc0b1b8ad7c070c
https://doi.org/10.12693/aphyspola.134.1221 -
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المؤلفون: Marta, Sobanska, Zbigniew R, Zytkiewicz, Kamil, Klosek, Renata, Kruszka, Krystyna, Golaszewska, Marek, Ekielski, Sylwia, Gieraltowska
المصدر: Nanotechnology. 31(18)