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1
المؤلفون: Ajay S. Karakoti, Ian M. Ross, G Möbus, Dean C. Sayle, David L. Reid, T X T Sayle, Sudipta Seal, Umananda M. Bhatta
المصدر: 2012 12th IEEE International Conference on Nanotechnology (IEEE-NANO).
مصطلحات موضوعية: Optics, Materials science, Nanocrystal, business.industry, Transmission electron microscopy, Resolution (electron density), Cathode ray, Nanoparticle, Optoelectronics, business, Nanoscopic scale, Electronic mail, Ion
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1c4b7e5e2cf7e0419ba1fa437782b22a
https://doi.org/10.1109/nano.2012.6322226 -
2
المصدر: Philosophical Magazine A. 68:565-573
مصطلحات موضوعية: Aluminium oxides, chemistry.chemical_classification, Physics and Astronomy (miscellaneous), Coincidence site lattice, Condensed matter physics, Metals and Alloys, Mineralogy, Crystal structure, Condensed Matter Physics, Stability (probability), Electronic, Optical and Magnetic Materials, Ion, Condensed Matter::Materials Science, chemistry, Condensed Matter::Superconductivity, visual_art, visual_art.visual_art_medium, General Materials Science, Ceramic, Thin film, Inorganic compound
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3
المؤلفون: Umananda M. Bhatta, Ajay S. Karakoti, Andrew Stringfellow, David L. Reid, Günter Möbus, Ian M. Ross, T X T Sayle, Dean C. Sayle, Sudipta Seal, Zineb Saghi
المصدر: Journal of Physics: Conference Series. 371:012007
مصطلحات موضوعية: History, Materials science, Degree (graph theory), business.industry, Resolution (electron density), chemistry.chemical_element, Nanoparticle, Molecular physics, Computer Science Applications, Education, Scanning probe microscopy, Optics, chemistry, Electron beam processing, Particle, business, High-resolution transmission electron microscopy, Carbon
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4دورية أكاديمية
المؤلفون: M G Matshaba, D C Sayle, T X T Sayle, P E Ngoepe
المصدر: IOP Conference Series: Materials Science & Engineering; Feb2017, Vol. 169 Issue 1, p1-1, 1p
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5دورية أكاديمية
المؤلفون: A V Chadwick, A Düvel, P Heitjans, D M Pickup, S Ramos, D C Sayle, T X T Sayle
المصدر: IOP Conference Series: Materials Science & Engineering; 12/2/2015, Vol. 80 Issue 1, p1-1, 1p