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1دورية أكاديمية
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2دورية أكاديمية
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3دورية أكاديمية
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4دورية أكاديمية
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5
المؤلفون: T. Benoist, Daniele Garbin, G. Molas, M. Reyboz, Fabien Clermidy, E. Vianello, Olivier P. Thomas, N. Jovanovic, O. Turkyilmaz, J. Coignus, Alain Toffoli, L. Perniola, C. Nguyen, Bastien Giraud, C. Charpin, Giorgio Palma, M. Alayan
المصدر: 2014 IEEE International Electron Devices Meeting.
مصطلحات موضوعية: ComputingMilieux_GENERAL, Ultra low power, Resistive touchscreen, Engineering, business.industry, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit design, Hardware_ARITHMETICANDLOGICSTRUCTURES, Field-programmable gate array, business, Hardware_LOGICDESIGN
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::54d6c3bae7b379553c04215e5339cb1e
https://doi.org/10.1109/iedm.2014.7046995 -
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المؤلفون: G. Molas, M. Reyboz, G. Suraci, T. Benoist, F. Longnos, N. Jovanovic, Olivier P. Thomas, E. Vianello, Alexandre Levisse, B. De Salvo, L. Perniola
المصدر: 2014 14th Annual Non-Volatile Memory Technology Symposium (NVMTS).
مصطلحات موضوعية: Robust design, Matrix (mathematics), Engineering, Range (mathematics), Programmable metallization cell, business.industry, Memory window, Electronic engineering, business, Simulation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6b8491b09597a79ba6d7cd99b7d9e8ee
https://doi.org/10.1109/nvmts.2014.7060850 -
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المؤلفون: Nicolas Planes, J. Pradelle, Pierre Perreau, P. Brun, Olivier Weber, Konstantin Bourdelle, Thierry Poiroux, Bich-Yen Nguyen, J. Ducote, Claire Fenouillet-Beranger, Remi Beneyton, R. Bianchini, B. Orlando, Francois Andrieu, A. Margain, L. Tosti, F. Abbate, C. Borowiak, C. Richard, D. Pellissier-Tanon, O. Faynot, C. Richier, T. Benoist, Magali Gregoire, Pascal Gouraud, Frederic Boeuf, Thomas Skotnicki, J. Bustos, Sebastien Haendler, E. Gourvest
المساهمون: Laboratoire d'Electronique et des Technologies de l'Information (CEA-LETI), Université Grenoble Alpes (UGA)-Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), STMicroelectronics [Crolles] (ST-CROLLES), Institut de Recherches sur les lois Fondamentales de l'Univers (IRFU), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay, Unité Commune d'Expérimentation Animale, Institut National de la Recherche Agronomique (INRA), Silicon-on-Insulator Technologies (SOITEC), Parc Technologique des Fontaines, Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS), Centre National de la Recherche Scientifique (CNRS)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Université Grenoble Alpes (UGA)
المصدر: Solid-State Electronics
Solid-State Electronics, Elsevier, 2013, 88, pp.15-20,. ⟨10.1016/j.sse.2013.04.008⟩
Solid-State Electronics, 2013, 88, pp.15-20,. ⟨10.1016/j.sse.2013.04.008⟩مصطلحات موضوعية: Power management, Engineering, Materials science, Silicon on insulator, 02 engineering and technology, 01 natural sciences, law.invention, law, 0103 physical sciences, Materials Chemistry, Electrical and Electronic Engineering, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Metal gate, ComputingMilieux_MISCELLANEOUS, Ground plane, High-κ dielectric, 010302 applied physics, business.industry, Transistor, Electrical engineering, Biasing, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Threshold voltage, Modulation, Logic gate, Optoelectronics, 0210 nano-technology, business
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8دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
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المؤلفون: Pierre Perreau, T. Benoist, Olivier Weber, L. Tosti, O. Faynot, Konstantin Bourdelle, A. Bajolet, Sebastien Haendler, F. Bouf, Claire Fenouillet-Beranger, X. Garros, Francois Andrieu, M. Casse, Olivier P. Thomas, J.-P. Noel, F. Boedt
المصدر: 2011 IEEE International Conference on IC Design & Technology.
مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, Silicon on insulator, Biasing, Hardware_PERFORMANCEANDRELIABILITY, Logic gate, Low-power electronics, Hardware_INTEGRATEDCIRCUITS, Node (circuits), System on a chip, Static random-access memory, business, Metal gate
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2ee3d692da83028f81e5a93ffea2de99
https://doi.org/10.1109/icicdt.2011.5783186 -
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المؤلفون: Thomas Ernst, Olivier Weber, C. Lapeyre, Laurent Grenouillet, M-A. Jaud, Claude Tabone, Nicolas Posseme, Thierry Poiroux, Sylvain Barraud, J. Mazurier, L. Brevard, T. Benoist, P. Gaud, Pierre Perreau, O. Faynot, X. Garros, G. Cibrario, Francois Andrieu, Olivier P. Thomas, Claire Fenouillet-Beranger, Mikael Casse, Sébastien Barnola, O. Rozeau, François Martin, Simon Deleonibus, Maud Vinet, L. Tosti, J.-P. Noel
المصدر: 2010 International Electron Devices Meeting.
مصطلحات موضوعية: Electrostatic discharge, business.industry, Computer science, Electrical engineering, Silicon on insulator, Hardware_PERFORMANCEANDRELIABILITY, Planar, Logic gate, MOSFET, Scalability, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Node (circuits), Wafer, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::de374cb34812f9fd1e480083305c85e6
https://doi.org/10.1109/iedm.2010.5703287