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المؤلفون: E. Nieuwkoop, Diederik Maas, M. van Putten, N.B. Koster, T. Huijser, J. van Veldhoven
المصدر: Panning, E.M., Extreme Ultraviolet (EUV) Lithography VII, Proceedings of SPIE 2015, 22-25 February 2015
مصطلحات موضوعية: Materials science, Xenon, Extreme ultraviolet lithography, NI - Nano Instrumentation, High Tech Systems & Materials, 02 engineering and technology, Pulsed power, 01 natural sciences, Signal, EUV power sensor, 010305 fluids & plasmas, Optics, Optical path, Contamination, 0103 physical sciences, EUV, Emission spectrum, Spectral purity, Sensor, TS - Technical Sciences, Industrial Innovation, business.industry, Photoelectric effect, 021001 nanoscience & nanotechnology, Carbon, Reproducibility, DPP EUV source, Beamline, Optoelectronics, Nano Technology, Electronics, 0210 nano-technology, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dfb57b207766a995e7eb0de14308fbd2
http://resolver.tudelft.nl/uuid:e91df2b1-9f09-4003-98b8-a73c63136ba5 -
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المؤلفون: G. Siegl, T. Huijser, S. Huygen, Helmut Faugel, R. D'Inca, M. Vervier, A. Onyshchenko, D. Hangan, Pierre Dumortier, A. Messiaen, N. C. J. van der Valk
المصدر: Fusion Engineering and Design, 6-8, 86, 831-834
مصطلحات موضوعية: Risetimes, Materials science, Optical signatures, Photodetector, Arc detection, ICRF antennas, Test benches, Optoelectronic devices, Stainless steel, Arc (geometry), Optics, Physics & Electronics, Band-pass filter, General Materials Science, Dedicated measurements, Gas pressures, Emission spectrum, Fusion machines, ICRF system, Civil and Structural Engineering, Light intensity, OPT - Optics, TS - Technical Sciences, Time evolutions, Spectral signature, ICRF, Spectrometer, business.industry, Physics, Mechanical Engineering, Time-resolved intensity, RF breakdown, Bandpass filters, High-speed, Emission spectroscopy, ICRH, Emission spectrums, Safety issues, Steel components, Nuclear Energy and Engineering, Rise time, Optical characterization, business, Pressure conditions, Frequency ranges, Optical arc detection
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المؤلفون: A. van der Heijden, T. Huijser, E. Marino, Y.L.M. Creyghton
المصدر: Surface and Coatings Technology. 201:9205-9208
مصطلحات موضوعية: Propellant, Copper oxide, Materials science, Nucleation, chemistry.chemical_element, Nanoparticle, Atmospheric-pressure plasma, Surfaces and Interfaces, General Chemistry, Dielectric barrier discharge, engineering.material, Condensed Matter Physics, Copper, Surfaces, Coatings and Films, chemistry.chemical_compound, Chemical engineering, chemistry, Coating, Materials Chemistry, engineering
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المؤلفون: M. Koops, W. Karthaus, T. Huijser
المساهمون: Prins Maurits Laboratorium TNO
المصدر: IEEE Transactions on Magnetics, 33 (1)
IEEE Transactions on Magnetics, 1 PART 1, 33, 119-124مصطلحات موضوعية: Finite element method, Design, Materials science, Electric resistance measurement, chemistry.chemical_element, Mechanical properties, Fiber reinforced materials, Molybdenum fiber armatures, law.invention, Armatures, Railgun, Segmented armatures, Carbon fiber reinforced launch packages, law, Carbon fibers, Electrical and Electronic Engineering, Composite material, Materials, Magnetic field diffusion, Experimentation, Armature (electrical engineering), Molybdenum, Electric coils, Significant difference, Computer simulation, Copper, Launching, Electronic, Optical and Magnetic Materials, Magnetic field, Electromagnetic launchers, chemistry, Magnetic fields, Probes, Copper fiber armatures, Rogowski coil
وصف الملف: application/pdf
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المؤلفون: J.C.J. van der Donck, R. Koops, T. Huijser, O. Kievit, F. T. Molkenboer, A.J. de Jong, N.B. Koster, A. M. M. G. Theulings
المصدر: Metrology, Inspection, and Process Control for Microlithography XXVI, 13-16 February 2012, San Jose, CA, USA, 8324
مصطلحات موضوعية: Particle cleaning, TS - Technical Sciences, Contamination control, Industrial Innovation, Cleaning methods, Plasma cleaning, 450 mm wafers, Tacky rollers, Nanotechnology, Plasma, Contamination, High voltage cleaning, Chemistry, Grippers, Cleaning of molecular layers, Building Engineering & Civil Engineering Physics & Electronics, ECS - Energy & Comfort Systems NI - Nano Instrumentation, Wafer, Small particles, Vacuum compatible cleaning
وصف الملف: application/x-www-form-urlencoded; charset=utf-8; application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f9387250fdb762617b4d9838589c8084
https://doi.org/10.1117/12.916366 -
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المؤلفون: B. Roodenburg, T. Huijser, B.H. Evenblij
المصدر: IEE Pulsed Power Symposium 2005.
مصطلحات موضوعية: Dc circuit, symbols.namesake, Engineering, business.industry, Electrical engineering, symbols, Mixed-signal integrated circuit, Current (fluid), business, Lorentz force, Circuit breaker, Electrical contacts
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::58f998801a72f30501ffe3d5f90554d2
https://doi.org/10.1049/ic:20050033 -
7
المؤلفون: B. Roodenburg, M.A.M. Kaanders, T. Huijser
المصدر: 2005 European Conference on Power Electronics and Applications.
مصطلحات موضوعية: Acceleration, Engineering, business.industry, Electrical engineering, Linear drive, business, Electrical contacts, Circuit breaker, High acceleration, Voltage, Magnetic field
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::52d39ae1f62cf7d5ff7b50188dd68ee8
https://doi.org/10.1109/epe.2005.219704 -
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المؤلفون: T. Huijser, W.J. Kolkert, W. Karthaus
المساهمون: Prins Maurits Laboratorium TNO
المصدر: IEEE Transactions on Magnetics, 1 PART 1, 35, 68-73
مصطلحات موضوعية: Materials science, Current distribution, Velocity, Current density distribution, Geometry, Fibre armatures, Transition velocity, law.invention, Railgun, symbols.namesake, Weapon systems, Lorentz force, law, Current density, Electrical and Electronic Engineering, Armature (electrical engineering), Armature rail geometry, Three dimensional, Rail guns, Brush, Computer simulation, Electronic, Optical and Magnetic Materials, Electromagnetic launchers, symbols
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0640b5a89a8eb4753a12c5bb47d0950f
http://resolver.tudelft.nl/uuid:c8f47e92-3402-43b8-910e-d1000333d8d7 -
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