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1
المؤلفون: T. Melde, J. P. Svenne, L. Canton
المصدر: Few-Body-Systems. 32:143-168
مصطلحات موضوعية: Physics, Diagram, Extrapolation, 01 natural sciences, Integral equation, Atomic and Molecular Physics, and Optics, 010305 fluids & plasmas, Theoretical physics, Dimension (vector space), Simple (abstract algebra), 0103 physical sciences, Line (geometry), Scattering theory, 010306 general physics, Nucleon
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2
المؤلفون: T Melde
المصدر: Canadian Journal of Physics. 77:167-175
مصطلحات موضوعية: Physics, Momentum operator, Photon, Ladder operator, Particle number operator, Quantum electrodynamics, Operator (physics), Quantum mechanics, Position operator, General Physics and Astronomy, Displacement operator, Exchange operator
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3
المؤلفون: Willibald Plessas, T. Melde
المصدر: Few-Body Systems. 44:83-85
مصطلحات موضوعية: Baryon, Physics, Particle physics, Operator (physics), Quantum mechanics, Nuclear Theory, High Energy Physics::Phenomenology, Resonance, High Energy Physics::Experiment, Covariant transformation, Classification scheme, Atomic and Molecular Physics, and Optics
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4
المؤلفون: T. Melde, Margaret Hawton
المصدر: Physical Review A. 51:4186-4190
مصطلحات موضوعية: Physics, Momentum operator, Ladder operator, Operator (computer programming), Quantum electrodynamics, Four-current, Displacement operator, Atomic and Molecular Physics, and Optics, Gluon field, Mathematical descriptions of the electromagnetic field, Vector potential
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c91c90c21dbeae5841c1a65a382e23ad
https://doi.org/10.1103/physreva.51.4186 -
5
المؤلفون: T. Melde, Thomas Mikolajick, Jan Paul, R. Hoffmann, Ekatarina Yurchuk
المصدر: 2010 IEEE International Integrated Reliability Workshop Final Report.
مصطلحات موضوعية: Stack (abstract data type), Chemistry, Memory cell, Charge trap flash, Electronic engineering, Charge loss, Charge (physics), Trapping, Nitride, Temperature measurement, Molecular physics
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c3ad0e8e68adc7d13382dd8af7c6b905
https://doi.org/10.1109/iirw.2010.5706502 -
6
المؤلفون: Malte Czernohorsky, V. Beyer, M. I. Vexler, T. Melde, M. Klawitter, A. Kuligk, C. D. Nguyen, Bernd Meinerzhagen
المصدر: 2010 International Conference on Simulation of Semiconductor Processes and Devices.
مصطلحات موضوعية: Scheme (programming language), Hardware_MEMORYSTRUCTURES, Computer science, Nand flash memory, business.industry, NAND gate, Hardware_GENERAL, Logic gate, Electronic engineering, Bit line, business, computer, Hot electron, Computer hardware, computer.programming_language
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::11e5bc38db20de799b2cc856204b3f9d
https://doi.org/10.1109/sispad.2010.5604512 -
7
المؤلفون: Malte Czernohorsky, T. Melde, R. Hoffmann, Konrad Seidel, Jan Paul, D. A. Lohr, M. F. Beug, V. Beyer
المصدر: 2009 10th Annual Non-Volatile Memory Technology Symposium (NVMTS).
مصطلحات موضوعية: Engineering, Hardware_MEMORYSTRUCTURES, business.industry, Electrical engineering, NAND gate, Chip, Noise (electronics), Threshold voltage, Trap (computing), Flash (photography), Reliability (semiconductor), Memory cell, Electronic engineering, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f0590f5a5b1bb2a597f614f3086fe520
https://doi.org/10.1109/nvmt.2009.5429788 -
8
المؤلفون: M.F. Beug, A.T. Tilke, R. Hoffmann, Malte Czernohorsky, L. Bach, D. A. Lohr, T. Melde, Roman Knoefler, U. Bewersdorff-Sarlette, Konrad Seidel, V. Beyer, Jan Paul
المصدر: 2009 IEEE International Memory Workshop.
مصطلحات موضوعية: 010302 applied physics, Materials science, medicine.diagnostic_test, business.industry, NAND gate, 020206 networking & telecommunications, Computed tomography, 02 engineering and technology, 01 natural sciences, Encapsulation (networking), Non-volatile memory, Logic gate, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, medicine, Optoelectronics, Breakdown voltage, business, Aluminum oxide
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c9cd257f86be1358a3aa6bd037de8196
https://doi.org/10.1109/imw.2009.5090595 -
9
المؤلفون: Malte Czernohorsky, Roman Knoefler, L. Bach, Thomas Mikolajick, U. Bewersdorff-Sarlette, A.T. Tilke, T. Melde, M.F. Beug, V. Beyer, Jan Paul
المساهمون: Publica
المصدر: IEEE Electron Device Letters
مصطلحات موضوعية: 010302 applied physics, Hardware_MEMORYSTRUCTURES, Computer science, String (computer science), NAND gate, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Flash memory, Electronic, Optical and Magnetic Materials, Threshold voltage, Non-volatile memory, Flash (photography), Hardware_GENERAL, Logic gate, 0103 physical sciences, Electronic engineering, Erasure, Electrical and Electronic Engineering, 0210 nano-technology
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10
المؤلفون: L. Canton, W. Plessas, T. Melde
المصدر: Physical review letters. 102(13)
مصطلحات موضوعية: Quantum chromodynamics, Physics, Particle physics, Nuclear Theory, Meson, 010308 nuclear & particles physics, High Energy Physics::Lattice, High Energy Physics::Phenomenology, Hadron, Quark model, FOS: Physical sciences, General Physics and Astronomy, Constituent quark, Lattice QCD, 01 natural sciences, Vertex (geometry), Nuclear Theory (nucl-th), Baryon, High Energy Physics - Phenomenology, High Energy Physics - Phenomenology (hep-ph), 0103 physical sciences, High Energy Physics::Experiment, Nuclear Experiment, 010306 general physics
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a3657fa099c052974772a0521604e78c
https://pubmed.ncbi.nlm.nih.gov/19392348