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1
المؤلفون: Johan Wouters, Stefan Kubicek, D. L. Diehl, Malgorzata Jurczak, Katia Devriendt, Rita Rooyackers, Virginie Gravey, T. Y. Hoffmann, Naoto Horiguchi, Denis Shamiryan, T. Vandeweyer, A. Cockburn, Erik Sleeckx, Augusto Redolfi, M. Togo, Tinne Delande, Min-Soo Kim
المصدر: Solid-State Electronics. 71:106-112
مصطلحات موضوعية: Fabrication, Fin, Materials science, business.industry, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Planar, CMOS, Etching (microfabrication), Trench, Materials Chemistry, Electronic engineering, Optoelectronics, Wafer, Electrical and Electronic Engineering, business, Lithography
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2
المؤلفون: Lars-Ake Ragnarsson, T. Y. Hoffmann, Marc Aoulaiche, Thomas Kauerauf, Guido Groeseneken, Philippe Roussel, B. Kaczer, Robin Degraeve, Moonju Cho, Jacopo Franco
المصدر: IEEE Transactions on Electron Devices. 58:3342-3349
مصطلحات موضوعية: Materials science, Silicon, business.industry, Analytical chemistry, Oxide, chemistry.chemical_element, Equivalent oxide thickness, Ring oscillator, Sweep frequency response analysis, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, Logic gate, MOSFET, Optoelectronics, Electrical and Electronic Engineering, business, Quantum tunnelling
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3
المؤلفون: B. De Jaeger, Maksym Myronov, Cor Claeys, Geert Eneman, Jerome Mitard, Eddy Simoen, A. Dobbie, Terry E. Whall, Marc Meuris, T. Y. Hoffmann, David R. Leadley
المصدر: IEEE Transactions on Electron Devices. 58:3132-3139
مصطلحات موضوعية: 010302 applied physics, Electron mobility, Materials science, Silicon, business.industry, Infrasound, Noise spectral density, Electrical engineering, chemistry.chemical_element, Germanium, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Electronic, Optical and Magnetic Materials, Ion implantation, chemistry, Gate oxide, 0103 physical sciences, MOSFET, Optoelectronics, Electrical and Electronic Engineering, 0210 nano-technology, business, QC
وصف الملف: application/pdf
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4
المؤلفون: S. Yamaguchi, Masaharu Kobayashi, Jerome Mitard, Liesbeth Witters, Roger Loo, Geert Eneman, T. Y. Hoffmann, Andriy Hikavyy, C. Ortolland, S. Takeoka
المصدر: IEEE Transactions on Electron Devices. 58:2544-2550
مصطلحات موضوعية: Materials science, business.industry, Transistor, Electrical engineering, chemistry.chemical_element, Germanium, Electronic, Optical and Magnetic Materials, Silicon-germanium, Threshold voltage, law.invention, chemistry.chemical_compound, chemistry, law, Optoelectronics, Field-effect transistor, Wafer, Electrical measurements, Electrical and Electronic Engineering, business, Scaling
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5
المؤلفون: Jerome Mitard, Liesbeth Witters, Jacopo Franco, B. Kaczer, Guido Groeseneken, Geert Eneman, T. Y. Hoffmann, Ph. Hehenberger, Ph. J. Roussel, Tibor Grasser, Maria Toledano-Luque
المصدر: Microelectronic Engineering. 88:1388-1391
مصطلحات موضوعية: Materials science, Negative-bias temperature instability, Condensed matter physics, Passivation, Relaxation (NMR), Step height, Dielectric, Condensed Matter Physics, Layer thickness, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Threshold voltage, Electrical and Electronic Engineering, Layer (electronics)
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6
المؤلفون: L.-A. Ragnarsson, T. Y. Hoffmann, Philippe Absil, T. Chiarella, Tom Schram, M. Togo
المصدر: Microelectronic Engineering. 88:1317-1322
مصطلحات موضوعية: Electron mobility, Materials science, business.industry, chemistry.chemical_element, Nanotechnology, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, Atomic layer deposition, Tantalum nitride, chemistry, Physical vapor deposition, MOSFET, Optoelectronics, Electrical and Electronic Engineering, Tin, business, Metal gate, High-κ dielectric
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7
المؤلفون: Anne Lauwers, M. Togo, Jorge A. Kittl, Erik Rosseel, Sofie Mertens, Philippe Absil, T. Y. Hoffmann, C. Ortolland
المصدر: Microelectronic Engineering. 88:578-582
مصطلحات موضوعية: Materials science, Silicon, Process (computing), chemistry.chemical_element, Hardware_PERFORMANCEANDRELIABILITY, Condensed Matter Physics, Engineering physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, CMOS, chemistry, Scalability, Thermal, Hardware_INTEGRATEDCIRCUITS, Forensic engineering, Process window, Thermal stability, Electrical and Electronic Engineering, Carbon
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8
المؤلفون: Jerome Mitard, Krishna C. Saraswat, Marc Meuris, T. Y. Hoffmann, M.M. Heyns, Yoshio Nishi, Toshifumi Irisawa, Masaharu Kobayashi
المصدر: IEEE Transactions on Electron Devices. 58:384-391
مصطلحات موضوعية: Materials science, Passivation, Silicon, business.industry, Scattering, Phonon, Transistor, chemistry.chemical_element, Germanium, Electronic, Optical and Magnetic Materials, law.invention, chemistry, law, Ballistic conduction, MOSFET, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, business
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9
المؤلفون: Shawn G. Thomas, Ernst Hendrik August Granneman, Peter Verheyen, C.S. Kim, Roger Loo, Y. Zhang, Matthias Bauer, W. Vandervorst, Naoto Horiguchi, Sebastian Koelling, Philippe Absil, Vladimir Machkaoutsan, Anne Lauwers, T. Y. Hoffmann, K. Vanormelingen, Alexis Franquet, Christoph Kerner
المصدر: Microelectronic Engineering. 87:306-310
مصطلحات موضوعية: Dynamic random-access memory, Materials science, business.industry, Annealing (metallurgy), Transistor, Condensed Matter Physics, Epitaxy, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, chemistry.chemical_compound, chemistry, law, Silicide, Silicon carbide, Optoelectronics, Thermal stability, Electrical and Electronic Engineering, business, NMOS logic
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10
المؤلفون: Y. Okuno, Marc Aoulaiche, Naoto Horiguchi, C. Ortolland, T. Y. Hoffmann, Christoph Kerner, C. Stapelmann, Peter Verheyen
المصدر: IEEE Transactions on Electron Devices. 56:1690-1697
مصطلحات موضوعية: Computer science, Strained silicon, Hardware_PERFORMANCEANDRELIABILITY, Memorization, Electronic, Optical and Magnetic Materials, PMOS logic, CMOS, Logic gate, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Electrical and Electronic Engineering, NMOS logic, Maskless lithography, Hardware_LOGICDESIGN