المؤلفون: Kim, J., Loveless, T. D., Pew, J., Young, R., Rcising, D., Nour, M., Manos, P., Chambers, M., Barnaby, H. J., Neucndank, J.

المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024

Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Wynocker, I.R., Xia Zhang, E., Reed, R.A., Schrimpf, R.D., Arreghini, A., Bastos, J.P., Van den Bosch, G., Linten, D., Fleetwood, D.M.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(8):1789-1797 Aug, 2024

المؤلفون: Jouni, A., Mamdy, B., Malherbe, V., Lalucaa, V., Virmontois, C., Gasiot, G., Goiffon, V.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(8):1753-1765 Aug, 2024

المؤلفون: Benfante, M., Reverchon, J., Durnez, C., Virmontois, C., Demiguel, S., Goiffon, V.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(8):1783-1788 Aug, 2024

المؤلفون: Antonsanti, A., Ryder, L.D., Le Roch, A., Waczynski, A., Miko, L., Delo, G., Cillis, A., Waczynski, S., Feggans, K., Barth, J.D., Goiffon, V., Virmontois, C., Hill, R.J., Wollack, E., Lauenstein, J.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(8):1738-1746 Aug, 2024

المؤلفون: Zanotti, T., Ranjan, A., O'Shea, S.J., Raghavan, N., Thamankar, R., Leong Pey, K., Maria Puglisi, F.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 24(2):184-193 Jun, 2024

المؤلفون: Jinno, Souma, Kitora, Shuji, Toki, Hiroshi, Abe, Masayuki

المصدر: 2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa) Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa), 2024 IEEE Joint International Symposium on. :20-23 May, 2024

Relation: 2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa)

المؤلفون: Mizutani, Tomoko, Takeuchi, Kiyoshi, Saraya, Takuya, Oka, Hiroshi, Mori, Takahiro, Kobayashi, Masaharu, Hiramoro, Toshiro

المصدر: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2024 IEEE 36th International Conference on. :1-5 Apr, 2024

Relation: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Varanasi, Anirudh, Degraeve, Robin, Roussel, Philippe J., Vici, Andrea, Merckling, Clement

المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-7 Apr, 2024

Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Millesimo, M., Fiegna, C., Bakeroot, B., Borga, M., Posthuma, N., Decoutere, S., Sangiorgi, E., Tallarico, A. N.

المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024

Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)