يعرض 1 - 10 نتائج من 942 نتيجة بحث عن '"TEST SETS"', وقت الاستعلام: 0.94s تنقيح النتائج
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    مؤتمر

    المؤلفون: Wen, Shilin, Deng, Hongjie, Qiu, Ke, Han, Rui

    المصدر: 2022 IEEE International Conference on Sensing, Diagnostics, Prognostics, and Control ( SDPC) Sensing, Diagnostics, Prognostics, and Control ( SDPC), 2022 IEEE International Conference on. :377-382 Aug, 2022

    Relation: 2022 IEEE International Conference on Sensing, Diagnostics, Prognostics, and Control ( SDPC)

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    دورية أكاديمية

    المؤلفون: Carraro, DiegoAff1, IDs1084402100651y_cor1, Bridge, Derek

    المصدر: Journal of Intelligent Information Systems: Integrating Artificial Intelligence and Database Technologies. 58(2):311-336

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    مؤتمر

    المؤلفون: Amati, L., Bolchini, C., Salice, F.

    المصدر: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on. :93-99 Oct, 2011

    Relation: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

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    مؤتمر

    المؤلفون: Pomeranz, Irith, Reddy, Sudhakar M.

    المصدر: 2010 28th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2010 28th. :221-226 Apr, 2010

    Relation: 2010 28th VLSI Test Symposium (VTS)

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    مؤتمر

    المؤلفون: Chakraborty, A.

    المصدر: 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design VLSI design VLSI Design, 2005. 18th International Conference on. :249-254 2005

    Relation: Proceedings. 18th International Conference on VLSI Design