المؤلفون: Chang-Chien, Y., Chung, C., Yang, C., Ma, C., Ye, X., Weng, Y., Chang, E.Y.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 24(3):407-413 Sep, 2024

المؤلفون: Wynocker, I.R., Xia Zhang, E., Reed, R.A., Schrimpf, R.D., Arreghini, A., Bastos, J.P., Van den Bosch, G., Linten, D., Fleetwood, D.M.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(8):1789-1797 Aug, 2024

المؤلفون: Zhang, Minming, Luo, Yuanjie, Cai, Jie

المصدر: 2024 IEEE 7th International Electrical and Energy Conference (CIEEC) Electrical and Energy Conference (CIEEC), 2024 IEEE 7th International. :1311-1315 May, 2024

Relation: 2024 IEEE 7th International Electrical and Energy Conference (CIEEC）

المؤلفون: Bennett, C.H., Xiao, T.P., Leonard, T., Zhan, X., Gearba-Dolocan, R., Young, J., Vizkelethy, G., Bielejec, E., Hughart, D., Marinella, M., Incorvia, J.A.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(4):454-460 Apr, 2024

المؤلفون: Xu, Shuai, Hou, Junyu, Li, Yuhe

المصدر: 2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI) Electronic Measurement & Instruments (ICEMI), 2023 IEEE 16th International Conference on. :103-107 Aug, 2023

Relation: 2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI)

المؤلفون: Beaumont, S., Lauenstein, J., Adams, J.S., Bandler, S.R., Chervenak, J.A., Finkbeiner, F.M., Hull, S.V., Kelley, R.L., Kilbourne, C.A., Le Roch, A., Muramatsu, H., Porter, F.S., Sakai, K., Smith, S.J., Wakeham, N.A., Wassell, E.J., Yoon, S.

المصدر: IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 33(5):1-6 Aug, 2023

المؤلفون: Li, J., Li, Y., Guo, Y., Li, R., Chen, W., Liu, Y., Peng, Z., Liu, J., He, C., Li, P.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 70(7):1459-1469 Jul, 2023

المؤلفون: Cao, Anni, Li, Xin, Wang, Liang, Zhang, Jianpeng, Gou, Chunliang, Liu, Liquan, Wang, Bi, Zhang, Xing, Zhao, Yuanfu

المصدر: 2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) Circuits and Systems (APCCAS), 2022 IEEE Asia Pacific Conference on. :528-531 Nov, 2022

Relation: 2022 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)

المؤلفون: Cao, J., Wynocker, I., Zhang, E.X., Reed, R.A., Alles, M.L., Schrimpf, R.D., Fleetwood, D.M., Arreghini, A., Rosmeulen, M., Bastos, J.P., Bosch, G.V.d., Linten, D.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 70(4):634-640 Apr, 2023

المؤلفون: Zhao, H., Zheng, Z., Zhu, H., Wang, L., Li, B., Zhang, Z., Wang, S., Yuan, Q., Jiao, J.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 23(1):109-115 Mar, 2023