المؤلفون: Yadav, Surbhi, Birajdar, B. I., Kraschewski, S. M., Apeleo Zubiri, B., Antesberger, T., Stutzmann, M., Spiecker, E.

المصدر: Journal of Applied Physics; 8/28/2024, Vol. 136 Issue 8, p1-18, 18p

مصطلحات موضوعية: TRANSMISSION electron microscopy, MICROSCOPY, SCANNING electron microscopy, SUBSTRATES (Materials science), CRYSTALLIZATION, NEAR-field microscopy, SCANNING transmission electron microscopy

المؤلفون: Craig, Isaac M., Van Winkle, Madeline, Ophus, Colin, Bediako, D. Kwabena

المصدر: Journal of Applied Physics; 8/21/2024, Vol. 136 Issue 7, p1-12, 12p

مصطلحات موضوعية: SCANNING transmission electron microscopy, TRANSMISSION electron microscopy, DIFFRACTION patterns, CAPABILITIES approach (Social sciences), SPATIAL resolution, BORON nitride

المؤلفون: Patterson, Alexandra L., Song, Hyunwoo, Kang, Jeeun, Boctor, Emad M., Spicer, James B.

المصدر: 2024 IEEE 24th International Conference on Nanotechnology (NANO) Nanotechnology (NANO), 2024 IEEE 24th International Conference on. :272-276 Jul, 2024

Relation: 2024 IEEE 24th International Conference on Nanotechnology (NANO)

المؤلفون: Weng, You-Chen, Yang, Chin-Yi, Yang, Tsung-Ying, Chung, Chin-Han, Chiang, Tsung-Han, Tung, Fu-Chin, Lai, Shih-Hsiang, Yu, Hung-Wei, Chang, Edward Yi

المصدر: 2024 IEEE International Conference on Semiconductor Electronics (ICSE) Semiconductor Electronics (ICSE), 2024 IEEE International Conference on. :78-80 Aug, 2024

Relation: 2024 IEEE International Conference on Semiconductor Electronics (ICSE)

المؤلفون: Myasoedov, A. V., Mynbaeva, M. G., Lebedev, S. P., Priobrazhenskii, S. Iu., Amelchuk, D. G., Kirilenko, D. A., Lebedev, A. A.

المصدر: Journal of Applied Physics; 9/21/2024, Vol. 136 Issue 11, p1-9, 9p

مصطلحات موضوعية: CHEMICAL vapor deposition, SUBSTRATES (Materials science), TRANSMISSION electron microscopy, DIFFRACTION patterns, ELECTRON diffraction

المؤلفون: Shanmugham, Sathish Kumar, le Febvrier, Arnaud, Palisaitis, Justinas, Persson, Per O. Å., Frost, Robert J. W., Primetzhofer, Daniel, Petrov, Ivan, Högberg, Hans, Birch, Jens, Rosen, Johanna, Eklund, Per, Nayak, Sanjay

المصدر: Journal of Applied Physics; 9/21/2024, Vol. 136 Issue 11, p1-10, 10p

مصطلحات موضوعية: SCANNING transmission electron microscopy, THIN films, SUBSTRATES (Materials science), SURFACE roughness, MAGNETRON sputtering

المؤلفون: Wang, Yukun, Hu, Yifeng

المصدر: Journal of Chemical Physics; 8/28/2024, Vol. 161 Issue 8, p1-9, 9p

مصطلحات موضوعية: ATOMIC force microscopy, TRANSMISSION electron microscopy, TRANSITION temperature, SUBSTRATES (Materials science), THIN films

المؤلفون: Babayode, Daniel A., Peterson, Stena C., Haber, Louis H.

المصدر: Journal of Chemical Physics; 8/28/2024, Vol. 161 Issue 8, p1-14, 14p

مصطلحات موضوعية: SECOND harmonic generation, TRANSMISSION electron microscopy, SURFACE morphology, NANOPARTICLES, NANOSTRUCTURED materials

المؤلفون: Lopez Morales, Angelica M., Chen, Wei-Ying, Kaoumi, Djamel

المصدر: Journal of Applied Physics; 8/21/2024, Vol. 136 Issue 7, p1-8, 8p

مصطلحات موضوعية: METAL-insulator transitions, TRANSMISSION electron microscopy, LATTICE constants, AMORPHIZATION, HETEROSTRUCTURES

المؤلفون: Lin, Y. H. G., Cheng, C. K., Young, L. B., Chiang, L. S., Chen, W. S., Lai, K. H., Chiu, S. P., Wu, C. T., Liang, C. T., Lin, J. J., Hsu, C. H., Lin, Y. H., Kwo, J., Hong, M.

المصدر: Journal of Applied Physics; 8/21/2024, Vol. 136 Issue 7, p1-8, 8p

مصطلحات موضوعية: SCANNING transmission electron microscopy, MOLECULAR beam epitaxy, SURFACE roughness, ALUMINUM ores, SUPERCONDUCTING circuits