المؤلفون: Choudhury, N., Parihar, N., Goel, N., Thirunavukkarasu, A., Mahapatra, S.

المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 8:1281-1288 2020

المؤلفون: Chaudhary, A., Fernandez, B., Parihar, N., Mahapatra, S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(1):256-263 Jan, 2017

المؤلفون: Parihar, N., Goel, N., Chaudhary, A., Mahapatra, S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 63(3):946-953 Mar, 2016

المؤلفون: Nilotpal Choudhury, Narendra Parihar, Nilesh Goel, A. Thirunavukkarasu, Souvik Mahapatra

المصدر: IEEE Journal of the Electron Devices Society, Vol 8, Pp 1281-1288 (2020)

مصطلحات موضوعية: NBTI, BAT, RD model, ABDWT, TTOM, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9195441/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/309e7036b1174d82a2c68859e89cd321

المؤلفون: Souvik Mahapatra, Nilesh Goel, Nilotpal Choudhury, A. Thirunavukkarasu, Narendra Parihar

المصدر: IEEE Journal of the Electron Devices Society, Vol 8, Pp 1281-1288 (2020)

مصطلحات موضوعية: Electron capture, NBTI, Kinetics, Silicon on insulator, Thermionic emission, 02 engineering and technology, RD model, 01 natural sciences, Planar, 0103 physical sciences, ABDWT, Electrical and Electronic Engineering, TTOM, 010302 applied physics, Physics, Stress recovery, Negative-bias temperature instability, Condensed matter physics, BAT, 021001 nanoscience & nanotechnology, Electronic, Optical and Magnetic Materials, Threshold voltage, lcsh:Electrical engineering. Electronics. Nuclear engineering, 0210 nano-technology, lcsh:TK1-9971, Biotechnology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0c2d44f1b94f7a18983f5495235df75a
https://ieeexplore.ieee.org/document/9195441/

المؤلفون: Ankush Chaudhary, Narendra Parihar, Souvik Mahapatra, Beryl Fernandez

المصدر: IndraStra Global.

مصطلحات موضوعية: Process Dependence, Composite number, Model parameters, 02 engineering and technology, 01 natural sciences, Consistency (statistics), Trap Occupancy, Trap Generation And Passivation, 0103 physical sciences, Electrical and Electronic Engineering, 010302 applied physics, Physics, Negative-bias temperature instability, Condensed matter physics, business.industry, Component (thermodynamics), Electrical engineering, Time evolution, Negative Bias Temperature Instability (Nbti), 021001 nanoscience & nanotechnology, Transient Trap Occupancy Model (Ttom), Electronic, Optical and Magnetic Materials, Threshold voltage, Delta-v (physics), Reaction-Diffusion (Rd) Model, 0210 nano-technology, business, Hole Trapping And Detrapping

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::479ea4d83cf3af57eba115d65d40f38f