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1دورية أكاديمية
المؤلفون: Choudhury, N., Parihar, N., Goel, N., Thirunavukkarasu, A., Mahapatra, S.
المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 8:1281-1288 2020
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2دورية أكاديمية
المؤلفون: Chaudhary, A., Fernandez, B., Parihar, N., Mahapatra, S.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(1):256-263 Jan, 2017
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3دورية أكاديمية
المؤلفون: Parihar, N., Goel, N., Chaudhary, A., Mahapatra, S.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 63(3):946-953 Mar, 2016
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المصدر: IEEE Journal of the Electron Devices Society, Vol 8, Pp 1281-1288 (2020)
مصطلحات موضوعية: Electron capture, NBTI, Kinetics, Silicon on insulator, Thermionic emission, 02 engineering and technology, RD model, 01 natural sciences, Planar, 0103 physical sciences, ABDWT, Electrical and Electronic Engineering, TTOM, 010302 applied physics, Physics, Stress recovery, Negative-bias temperature instability, Condensed matter physics, BAT, 021001 nanoscience & nanotechnology, Electronic, Optical and Magnetic Materials, Threshold voltage, lcsh:Electrical engineering. Electronics. Nuclear engineering, 0210 nano-technology, lcsh:TK1-9971, Biotechnology
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المؤلفون: Ankush Chaudhary, Narendra Parihar, Souvik Mahapatra, Beryl Fernandez
المصدر: IndraStra Global.
مصطلحات موضوعية: Process Dependence, Composite number, Model parameters, 02 engineering and technology, 01 natural sciences, Consistency (statistics), Trap Occupancy, Trap Generation And Passivation, 0103 physical sciences, Electrical and Electronic Engineering, 010302 applied physics, Physics, Negative-bias temperature instability, Condensed matter physics, business.industry, Component (thermodynamics), Electrical engineering, Time evolution, Negative Bias Temperature Instability (Nbti), 021001 nanoscience & nanotechnology, Transient Trap Occupancy Model (Ttom), Electronic, Optical and Magnetic Materials, Threshold voltage, Delta-v (physics), Reaction-Diffusion (Rd) Model, 0210 nano-technology, business, Hole Trapping And Detrapping
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::479ea4d83cf3af57eba115d65d40f38f