المؤلفون: Huang, Yangjue, Liu, Tong, Tai, Bin, Shen, Kaicheng, Yuan, Lyuzerui, Wang, Yin, Duan, Shuyin, Chen, Qianyi, Liu, Shisheng, Gu, Min

المصدر: 2023 7th International Conference on Smart Grid and Smart Cities (ICSGSC) Smart Grid and Smart Cities (ICSGSC), 2023 7th International Conference on. :462-467 Sep, 2023

Relation: 2023 7th International Conference on Smart Grid and Smart Cities (ICSGSC)

المؤلفون: La, Yuan, Yang, Xian, Zhou, Dan, Ma, Zhiqin, Cai, Linglong, Fu, Mingli, Chen, Qiulin, Tai, Bin, Jiang, Shuo, Shu, Xiang

المصدر: 2023 IEEE 6th International Electrical and Energy Conference (CIEEC) Electrical and Energy Conference (CIEEC), 2023 IEEE 6th International. :3035-3039 May, 2023

Relation: 2023 IEEE 6th International Electrical and Energy Conference (CIEEC)

المؤلفون: Zhou, Dan, Yang, Xian, Ma, Zhiqin, Cai, Linglong, Tai, Bin, Jin, Yuhui, Lin, Chunyao, Jiang, Shuo, Shu, Xiang, Liu, Hao, Ma, Guoming

المصدر: 2023 IEEE 4th International Conference on Electrical Materials and Power Equipment (ICEMPE) Electrical Materials and Power Equipment (ICEMPE), 2023 IEEE 4th International Conference on. :1-4 May, 2023

Relation: 2023 IEEE 4th International Conference on Electrical Materials and Power Equipment (ICEMPE)

المؤلفون: Tang, Ying, Li, Shitan, Lei, Jing, Tang, Mingjun, Wang, Yu, Tai, Bin, Yang, Cuiru, Chen, Tiansheng, Lu, Jian, Wen, Zuoneng

المصدر: 2023 IEEE 4th International Conference on Electrical Materials and Power Equipment (ICEMPE) Electrical Materials and Power Equipment (ICEMPE), 2023 IEEE 4th International Conference on. :1-4 May, 2023

Relation: 2023 IEEE 4th International Conference on Electrical Materials and Power Equipment (ICEMPE)

المؤلفون: Tai, Bin, Lv, Hong, Wang, Ling, Zhu, Yuanzhe

المصدر: 2022 IEEE 6th Conference on Energy Internet and Energy System Integration (EI2) Energy Internet and Energy System Integration (EI2), 2022 IEEE 6th Conference on. :2957-2962 Nov, 2022

Relation: 2022 IEEE 6th Conference on Energy Internet and Energy System Integration (EI2)

المؤلفون: Zhou, Dan, Yang, Xian, Ma, Zhiqin, Cai, Linglong, Tai, Bin, Li, Duanjiao, Jin, Yuhui, Lin, Chunyao, Jiang, Shuo, Shu, Xiang, Liu, Hao, Ma, Guoming

المصدر: 2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE) High Voltage Engineering and Applications (ICHVE), 2022 IEEE International Conference on. :1-4 Sep, 2022

Relation: 2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE)

المؤلفون: Cai, Linglong^{Aff38, Aff39}, Tai, Bin^{Aff38, Aff39}, Ma, Zhiqin^{Aff38, Aff39}, Jin, Yuhui^{Aff38, Aff39}, Jiang, Shuo^{Aff38, Aff39}, Li, Zhongxiang^{Aff38, Aff39}

المساهمون: Angrisani, Leopoldo, Series Editor^Aff1, Arteaga, Marco, Series Editor^Aff2, Chakraborty, Samarjit, Series Editor^Aff3, Chen, Jiming, Series Editor^Aff4, Chen, Shanben, Series Editor^Aff5, Chen, Tan Kay, Series Editor^Aff6, Dillmann, Rüdiger, Series Editor^Aff7, Duan, Haibin, Series Editor^Aff8, Ferrari, Gianluigi, Series Editor^Aff9, Ferre, Manuel, Series Editor^Aff10, Jabbari, Faryar, Series Editor^Aff11, Jia, Limin, Series Editor^Aff12, Kacprzyk, Janusz, Series Editor^Aff13, Khamis, Alaa, Series Editor^Aff14, Kroeger, Torsten, Series Editor^Aff15, Li, Yong, Series Editor^Aff16, Liang, Qilian, Series Editor^Aff17, Martín, Ferran, Series Editor^Aff18, Ming, Tan Cher, Series Editor^Aff19, Minker, Wolfgang, Series Editor^Aff20, Misra, Pradeep, Series Editor^Aff21, Mukhopadhyay, Subhas, Series Editor^Aff22, Ning, Cun-Zheng, Series Editor^Aff23, Nishida, Toyoaki, Series Editor^Aff24, Oneto, Luca, Series Editor^Aff25, Panigrahi, Bijaya Ketan, Series Editor^Aff26, Pascucci, Federica, Series Editor^Aff27, Qin, Yong, Series Editor^Aff28, Seng, Gan Woon, Series Editor^Aff29, Speidel, Joachim, Series Editor^Aff30, Veiga, Germano, Series Editor^Aff31, Wu, Haitao, Series Editor^Aff32, Zamboni, Walter, Series Editor^Aff33, Tan, Kay Chen, Series Editor^Aff34, Yang, Qingxin, editor^Aff35, Li, Zewen, editor^Aff36, Luo, An, editor^Aff37

المصدر: The proceedings of the 18th Annual Conference of China Electrotechnical Society : Volume VII. 1169:693-701

المؤلفون: Sun, Shuai^Aff38, Li, Xingwang^Aff38, Yao, Congwei^Aff38, Tai, Bin^Aff38, Cai, Linglong^Aff38, Li, Jianjun^Aff38, Pang, Xiaofeng^Aff38

المساهمون: Angrisani, Leopoldo, Series Editor^Aff1, Arteaga, Marco, Series Editor^Aff2, Chakraborty, Samarjit, Series Editor^Aff3, Chen, Jiming, Series Editor^Aff4, Chen, Shanben, Series Editor^Aff5, Chen, Tan Kay, Series Editor^Aff6, Dillmann, Rüdiger, Series Editor^Aff7, Duan, Haibin, Series Editor^Aff8, Ferrari, Gianluigi, Series Editor^Aff9, Ferre, Manuel, Series Editor^Aff10, Jabbari, Faryar, Series Editor^Aff11, Jia, Limin, Series Editor^Aff12, Kacprzyk, Janusz, Series Editor^Aff13, Khamis, Alaa, Series Editor^Aff14, Kroeger, Torsten, Series Editor^Aff15, Li, Yong, Series Editor^Aff16, Liang, Qilian, Series Editor^Aff17, Martín, Ferran, Series Editor^Aff18, Ming, Tan Cher, Series Editor^Aff19, Minker, Wolfgang, Series Editor^Aff20, Misra, Pradeep, Series Editor^Aff21, Mukhopadhyay, Subhas, Series Editor^Aff22, Ning, Cun-Zheng, Series Editor^Aff23, Nishida, Toyoaki, Series Editor^Aff24, Oneto, Luca, Series Editor^Aff25, Panigrahi, Bijaya Ketan, Series Editor^Aff26, Pascucci, Federica, Series Editor^Aff27, Qin, Yong, Series Editor^Aff28, Seng, Gan Woon, Series Editor^Aff29, Speidel, Joachim, Series Editor^Aff30, Veiga, Germano, Series Editor^Aff31, Wu, Haitao, Series Editor^Aff32, Zamboni, Walter, Series Editor^Aff33, Tan, Kay Chen, Series Editor^Aff34, Yang, Qingxin, editor^Aff35, Li, Zewen, editor^Aff36, Luo, An, editor^Aff37

المصدر: The Proceedings of the 18th Annual Conference of China Electrotechnical Society : Volume V. 1167:320-329

المؤلفون: Lei, Jing^Aff38, Lu, Jian^Aff39, Li, Shitao^Aff38, Tai, Bin^Aff38, Yang, Cuiru^Aff38, Li, Jia^Aff38, Zheng, Yaru^Aff38, Wu, Yingshan^Aff40

المساهمون: Angrisani, Leopoldo, Series Editor^Aff1, Arteaga, Marco, Series Editor^Aff2, Chakraborty, Samarjit, Series Editor^Aff3, Chen, Jiming, Series Editor^Aff4, Chen, Shanben, Series Editor^Aff5, Chen, Tan Kay, Series Editor^Aff6, Dillmann, Rüdiger, Series Editor^Aff7, Duan, Haibin, Series Editor^Aff8, Ferrari, Gianluigi, Series Editor^Aff9, Ferre, Manuel, Series Editor^Aff10, Jabbari, Faryar, Series Editor^Aff11, Jia, Limin, Series Editor^Aff12, Kacprzyk, Janusz, Series Editor^Aff13, Khamis, Alaa, Series Editor^Aff14, Kroeger, Torsten, Series Editor^Aff15, Li, Yong, Series Editor^Aff16, Liang, Qilian, Series Editor^Aff17, Martín, Ferran, Series Editor^Aff18, Ming, Tan Cher, Series Editor^Aff19, Minker, Wolfgang, Series Editor^Aff20, Misra, Pradeep, Series Editor^Aff21, Mukhopadhyay, Subhas, Series Editor^Aff22, Ning, Cun-Zheng, Series Editor^Aff23, Nishida, Toyoaki, Series Editor^Aff24, Oneto, Luca, Series Editor^Aff25, Panigrahi, Bijaya Ketan, Series Editor^Aff26, Pascucci, Federica, Series Editor^Aff27, Qin, Yong, Series Editor^Aff28, Seng, Gan Woon, Series Editor^Aff29, Speidel, Joachim, Series Editor^Aff30, Veiga, Germano, Series Editor^Aff31, Wu, Haitao, Series Editor^Aff32, Zamboni, Walter, Series Editor^Aff33, Zhang, Junjie James, Series Editor^Aff34, Tan, Kay Chen, Series Editor^Aff35, Dong, Xuzhu, editor^Aff36, Cai, Li Cai, editor^Aff37

المصدر: The Proceedings of 2023 4th International Symposium on Insulation and Discharge Computation for Power Equipment (IDCOMPU2023) : Volume II. 1101:239-249

المؤلفون: Xiong, Xiao, Zhao, Hai-Tao, Hu, Tai-Bin

المصدر: 2019 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE) Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 2019 International Conference on. :689-694 Aug, 2019

Relation: 2019 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE)