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1مؤتمر
المؤلفون: Yoshiharu Tosaka, Ryozo Takasu, Taiki Uemura, Hideo Ehara, Hideya Matsuyama, Satoh, Shigeo, Atsushi Kawai, Masahiko Hayashi
المصدر: 2008 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2008. IRPS 2008. IEEE International. :727-728 Apr, 2008
Relation: 2008 IEEE International Reliability Physics Symposium (IRPS)
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المؤلفون: Taiki Uemura, Byungjin Chung, Shinyoung Chung, Seungbae Lee, Yuchul Hwang, Sangwoo Pae
المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6d4dc8ef55c67c9ea991fecd18e4a84c
https://doi.org/10.1109/irps48203.2023.10117908 -
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المؤلفون: Sungman Rhee, Hyunjin Kim, Sangku Park, Taiki Uemura, Yuchul Hwang, Seungjin Choo, Jinju Kim, Hwasung Rhee, Shinyoung Chung
المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cd1ae2da3bcc4160d771a959855311dd
https://doi.org/10.1109/irps48203.2023.10117962 -
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المؤلفون: Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shinyoung Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida
المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b2e2dd4d202c0200df824c88fccac35f
https://doi.org/10.1109/irps48227.2022.9764581 -
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المؤلفون: Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shinyoung Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida
المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3a0c4740261d3e46c7b67300ba21dcb0
https://doi.org/10.1109/irps48227.2022.9764438 -
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المؤلفون: Jaehee Choi, Seungbae Lee, Mijoung Kim, Brandon Lee, Jeongmin Jo, Dalhee Lee, Taesjoong Song, Byungjin Chung, Gunrae Kim, Hwa-Sung Rhee, Taiki Uemura
المصدر: IRPS
مصطلحات موضوعية: 010302 applied physics, Random access memory, Materials science, 010308 nuclear & particles physics, business.industry, Extreme ultraviolet lithography, 01 natural sciences, Upset, law.invention, Soft error, law, 0103 physical sciences, Optoelectronics, Static random-access memory, business, Flip-flop
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::91bd174cab3981c9026ccef7955619b5
https://doi.org/10.1109/irps46558.2021.9405101 -
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المؤلفون: Minjung Jin, Soonwan Kwon, Taiki Uemura, Y. Kim, J.M. Park, Hwa-Sung Rhee, Young-Joon Cho, Mi-Hyang Lee, Bomi Kim, Kihyun Choi, Tae-Young Jeong, Myeong-cheol Kim, Hyewon Shim, Hai Jiang, Hyunchul Sagong, K. Kim, Won-Jin Kim, Hyeonwoo Nam, D. Mun, Sangwoo Pae, E. Kwon, Myungsoo Yeo, Bang-Lin Lee
المصدر: 2020 IEEE Symposium on VLSI Technology.
مصطلحات موضوعية: business.industry, Computer science, Extreme ultraviolet lithography, Transistor, Electromagnetic compatibility, Automotive industry, Chip, law.invention, law, Electronic engineering, Static random-access memory, business, 5G, Common emitter
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::612047cdc3eb0b3d16f46a21e99263a3
https://doi.org/10.1109/vlsitechnology18217.2020.9265018 -
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المؤلفون: Seungbae Lee, Taiki Uemura, Hai Jiang, Tae-Young Jeong, Sangwoo Pae, Hwa-Sung Rhee, Shota Ohnishi, Ki-il Hong, Byungjin Chung, Yongsung Ji, Jeongmin Jo, Eun-Cheol Lee, Park Young-In, Jaehee Choi, Rakesh Ranjan, Ken Machida
المصدر: IRPS
مصطلحات موضوعية: 010302 applied physics, Physics, Proton, 010308 nuclear & particles physics, 01 natural sciences, Molecular physics, Alpha (programming language), Planar, Soft error, 0103 physical sciences, Neutron, Irradiation, AND gate, Electronic circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d281594f5ded80b7ed2436e03973bd61
https://doi.org/10.1109/irps45951.2020.9129644 -
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المؤلفون: Hyungu Kahng, Jiyoon Lee, Seoung Bum Kim, Yoon Sang Cho, Yongsun Ji, Dongkyun Kwon, Taiki Uemura, Sena Park, Giwon Lee, Tae-Young Jeong, Hyungrok Do, Dong-Joon Lee, Heung-Kook Ko, Hia Jiang, Sangwoo Pae, Sung-Ryul Kim, Jihyun Ryu, Eun-Cheol Lee
المصدر: IRPS
مصطلحات موضوعية: business.industry, Computer science, media_common.quotation_subject, 020208 electrical & electronic engineering, ComputerApplications_COMPUTERSINOTHERSYSTEMS, 020206 networking & telecommunications, 02 engineering and technology, Machine learning, computer.software_genre, Stress (mechanics), Automotive systems, 0202 electrical engineering, electronic engineering, information engineering, Wafer testing, Quality (business), Wafer, Gradient boosting, Artificial intelligence, business, computer, media_common, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4014b289efa19ab9e2093d469a38ebf0
https://doi.org/10.1109/irps45951.2020.9128932 -
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المؤلفون: Hwa-Sung Rhee, Tae-Young Jeong, Junekyun Park, Hyewon Shim, Brandon Lee, Taiki Uemura, Yoohwan Kim, Hyunchul Sagong, Yongsung Ji, Sangwoo Pae, Jinju Kim, Dongkyun Kwon, Hai Jiang
المصدر: IRPS
مصطلحات موضوعية: 010302 applied physics, Work (thermodynamics), Computer science, Thermal resistance, 02 engineering and technology, Integrated circuit, 021001 nanoscience & nanotechnology, 01 natural sciences, law.invention, Superposition principle, Matrix (mathematics), Reliability (semiconductor), law, 0103 physical sciences, Thermal, Proximity effect (audio), Electronic engineering, 0210 nano-technology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c6521431ade2f3e6169f88462c53fb75
https://doi.org/10.1109/irps45951.2020.9128322
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