المؤلفون: Fujisaki, Y., Tsugawa, H., Sakai, K., Kumagai, H., Nakamura, R., Ogita, T., Endo, S., Iwase, T., Takase, H., Yokochi, K., Yoshida, S., Shimada, S., Otake, Y., Wakano, T., Hiyama, H., Hagiwara, K., Arakawal, M., Matsumotol, S., Maeda, H., Sugihara, K., Takabayashi, K., Ono, M., Ishibashi, K., Yamamoto, K.

المصدر: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023

Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Shimada, S., Otake, Y., Yoshida, S., Jibiki, Y., Fujii, M., Endo, S., Nakamura, R., Tsugawa, H., Fujisaki, Y., Yokochi, K., Iwase, J., Takabayashi, K., Maeda, H., Sugihara, K., Yamamoto, K., Ono, M., Ishibashi, K., Matsumoto, S., Hiyama, H., Wakano, T.

المصدر: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :37.3.1-37.3.4 Dec, 2022

Relation: 2022 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Konoike, R., Matsuura, H., Suzuki, K., Matsumoto, T., Kurahashi, T., Uetake, A., Takabayashi, K., Akiyama, S., Sekiguchi, S., Namiki, S., Kawashima, H., Ikeda, K.

المصدر: Journal of Lightwave Technology J. Lightwave Technol. Lightwave Technology, Journal of. 38(11):2930-2937 Jun, 2020

المؤلفون: Shimada, S., Otake, Y., Yoshida, S., Endo, S., Nakamura, R., Tsugawa, H., Ogita, T., Ogasahara, T., Yokochi, K., Inoue, Y., Takabayashi, K., Maeda, H., Yamamoto, K., Ono, M., Matsumoto, S., Hiyama, H., Wakano, T.

المصدر: 2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :20.1.1-20.1.4 Dec, 2021

Relation: 2021 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Nakane, R., Takabayashi, K., Kato, K., Okubo, H.

المصدر: 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon (CEIDP) Electrical Insulation and Dielectric Phenomenon (CEIDP), 2017 IEEE Conference on. :621-624 Oct, 2017

Relation: 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon (CEIDP)

المؤلفون: Takabayashi, K., Nakane, R., Okubo, H.

المصدر: 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon (CEIDP) Electrical Insulation and Dielectric Phenomenon (CEIDP), 2017 IEEE Conference on. :584-587 Oct, 2017

Relation: 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon (CEIDP)

المؤلفون: Okubo, H., Nakane, R., Takabayashi, K., Kato, K.

المصدر: 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon (CEIDP) Electrical Insulation and Dielectric Phenomenon (CEIDP), 2017 IEEE Conference on. :600-604 Oct, 2017

Relation: 2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon (CEIDP)

المؤلفون: Matsumoto, T., Kurahashi, T., Konoike, R., Suzuki, K., Tanizawa, K., Uetake, A., Takabayashi, K., Ikeda, K., Kawashima, H., Akiyama, S., Sekiguchi, S.

المصدر: Journal of Lightwave Technology J. Lightwave Technol. Lightwave Technology, Journal of. 37(2):307-313 Jan, 2019

المؤلفون: Konoike, R., Suzuki, K., Inoue, T., Matsumoto, T., Kurahashi, T., Uetake, A., Takabayashi, K., Akiyama, S., Sekiguchi, S., Namiki, S., Kawashima, H., Ikeda, K.

المصدر: Journal of Lightwave Technology J. Lightwave Technol. Lightwave Technology, Journal of. 37(1):123-130 Jan, 2019

المؤلفون: Quan, D.T., Hiep, P.T., Kobayashi, T., Takabayashi, K., Kohno, R.

المصدر: 2017 11th International Symposium on Medical Information and Communication Technology (ISMICT) Medical Information and Communication Technology (ISMICT), 2017 11th International Symposium on. :19-22 Feb, 2017

Relation: 2017 11th International Symposium on Medical Information and Communication Technology (ISMICT)