يعرض 1 - 10 نتائج من 172 نتيجة بحث عن '"Tan, Jun Hao"', وقت الاستعلام: 1.24s تنقيح النتائج
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    مؤتمر

    المؤلفون: Tan, Jun Hao, Ho, Heng Wah

    المصدر: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2024 35th Annual. :01-04 May, 2024

    Relation: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

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    دورية أكاديمية

    المؤلفون: Wang, PengAff1, Aff2, Aff3, Liu, XupengAff1, Aff2, Aff3, Yao, ZiyueAff1, Aff2, Aff3, Chen, YuAff1, Aff2, Aff3, Luo, LanfangAff1, Aff2, Aff3, Liang, KunAff1, Aff2, Aff3, Tan, Jun-Hao ElwinAff4, Aff5, Aff6, Aff7, Chua, Min-Wen JasonAff4, Aff5, Aff6, Aff7, Chua, Yan-Jiang BenjaminAff4, Aff5, Aff6, Aff7, Ma, ShilinAff1, Aff2, Aff3, Zhang, LipingAff1, Aff2, Aff3, Ma, WenwuAff1, Aff2, Aff3, Liu, ShuqingAff1, Aff2, Aff3, Cao, WenhuaAff1, Aff2, Aff3, Guo, LuyaoAff1, Aff2, Aff3, Guang, LuAff1, Aff2, Aff3, Wang, YuefanAff1, Aff2, Aff3, Zhao, HeAff1, Aff2, Aff3, Ai, NaAff3, Aff8, Li, YunAff3, Aff8, Li, Chunwei, Wang, Ruiqi RachelAff1, Aff2, Teh, Bin TeanAff6, Aff7, Jiang, Lan, Yu, Kang, Shyh-Chang, NgAff1, Aff2, Aff3, IDs4142202300818y_cor26

    المصدر: Cell Research. 33(9):712-726

  3. 3
    مؤتمر

    المصدر: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2020 IEEE 33rd International Conference on. :1-4 May, 2020

    Relation: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)

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    دورية أكاديمية
  9. 9
    مؤتمر

    المصدر: 2020 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR) Lasers and Electro-Optics Pacific Rim (CLEO-PR), 2020 Conference on. :1-2 Aug, 2020

    Relation: 2020 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR)

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    كتاب إلكتروني

    المؤلفون: Ng, Han WeiAff11, Koh, AidenAff11, Aff12, Aff13, Foong, AntheaAff11, Aff12, Aff13, Ong, JeremyAff11, Aff12, Aff13, Tan, Jun HaoAff12, Aff13, Khoo, Eng TatAff12, Liu, GabrielAff12, Aff13

    المساهمون: Goos, Gerhard, Founding EditorAff1, Hartmanis, Juris, Founding EditorAff2, Bertino, Elisa, Editorial Board MemberAff3, Gao, Wen, Editorial Board MemberAff4, Steffen, Bernhard, Editorial Board MemberAff5, Yung, Moti, Editorial Board MemberAff6, Rodrigo, Maria Mercedes, editorAff7, Matsuda, Noburu, editorAff8, Cristea, Alexandra I., editorAff9, Dimitrova, Vania, editorAff10

    المصدر: Artificial Intelligence in Education : 23rd International Conference, AIED 2022, Durham, UK, July 27–31, 2022, Proceedings, Part I. 13355:640-646