-
1مؤتمرALow-Bitwidth Integer-STBP Algorithm for Efficient Training and Inference of Spiking Neural Networks
المؤلفون: Tan, Pai-Yu, Wu, Cheng-Wen
المصدر: 2023 28th Asia and South Pacific Design Automation Conference (ASP-DAC) Design Automation Conference (ASP-DAC), 2023 28th Asia and South Pacific. :651-656 Jan, 2023
Relation: 2023 28th Asia and South Pacific Design Automation Conference (ASP-DAC)
-
2مؤتمر
المؤلفون: Cheng, Ya-Chi, Tan, Pai-Yu, Wu, Cheng-Wen, Shieh, Ming-Der, Chuang, Chien-Hui, Liao, Gordon
المصدر: 2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :601-608 Sep, 2022
Relation: 2022 IEEE International Test Conference (ITC)
-
3مؤتمر
المؤلفون: Cheng, Ya-Chi, Tan, Pai-Yu, Wu, Cheng-Wen, Shieh, Ming-Der, Chuang, Chien-Hui, Liao, Gordon
المصدر: 2022 IEEE International Test Conference in Asia (ITC-Asia) ITC-ASIA Test Conference in Asia (ITC-Asia), 2022 IEEE International. :19-24 Aug, 2022
Relation: 2022 IEEE International Test Conference in Asia (ITC-Asia)
-
4مؤتمر
المؤلفون: Lin, Shian-Yu, Tan, Pai-Yu, Wu, Cheng-Wen, Shieh, Ming-Der, Chuang, Chien-Hui, Liao, Gordon
المصدر: 2022 IEEE International Test Conference in Asia (ITC-Asia) ITC-ASIA Test Conference in Asia (ITC-Asia), 2022 IEEE International. :25-30 Aug, 2022
Relation: 2022 IEEE International Test Conference in Asia (ITC-Asia)
-
5مؤتمر
المؤلفون: Tan, Pai-Yu, Tung, Chih-Hsuan, Wu, Cheng-Wen, Lee, Mincent, Liao, Gordon
المصدر: 2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) VLSI Design, Automation and Test (VLSI-DAT), 2022 International Symposium on. :1-4 Apr, 2022
Relation: 2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
-
6مؤتمر
المؤلفون: Tan, Pai-Yu, Wu, Cheng-Wen, Lu, Juin-Ming
المصدر: 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2021. :575-580 Feb, 2021
Relation: 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)
-
7مؤتمر
المؤلفون: Chuang, Po-Yao, Tan, Pai-Yu, Wu, Cheng-Wen, Lu, Juin-Ming
المصدر: 2020 57th ACM/IEEE Design Automation Conference (DAC) Design Automation Conference (DAC), 2020 57th ACM/IEEE. :1-6 Jul, 2020
Relation: 2020 57th ACM/IEEE Design Automation Conference (DAC)
-
8تقرير
المؤلفون: Tan, Pai-Yu, Chuang, Po-Yao, Lin, Yen-Ting, Wu, Cheng-Wen, Lu, Juin-Ming
مصطلحات موضوعية: Electrical Engineering and Systems Science - Signal Processing, Computer Science - Hardware Architecture, Computer Science - Computer Vision and Pattern Recognition, Computer Science - Neural and Evolutionary Computing
URL الوصول: http://arxiv.org/abs/2003.06310
-
9دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.