المؤلفون: Tan, Ben, Feng, Huizong, Xu, Hua, Zhou, Mingliang, Cen, Ming

المصدر: 2023 35th Chinese Control and Decision Conference (CCDC) Control and Decision Conference (CCDC), 2023 35th Chinese. :779-784 May, 2023

Relation: 2023 35th Chinese Control and Decision Conference (CCDC)

المؤلفون: Chao, Yafeng, Zhang, Liu, Peng, Xiaoliang, Zhou, Pan, Tan, Ben, Yue, Yishi

المصدر: 2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE) High Voltage Engineering and Applications (ICHVE), 2022 IEEE International Conference on. :1-4 Sep, 2022

Relation: 2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE)

المؤلفون: Wei, YueQiang, Yang, Run, Tan, Ben, Xu, Song, Cen, Ming

المصدر: 2022 34th Chinese Control and Decision Conference (CCDC) Control and Decision Conference (CCDC), 2022 34th Chinese. :2756-2761 Aug, 2022

Relation: 2022 34th Chinese Control and Decision Conference (CCDC)

المؤلفون: Chao, Yafeng, Zhang, Liu, Liao, Xinghua, Xiong, Jie, Tan, Ben, Yue, Yishi

المصدر: 2021 International Conference on Advanced Electrical Equipment and Reliable Operation (AEERO) Advanced Electrical Equipment and Reliable Operation (AEERO), 2021 International Conference on. :1-4 Oct, 2021

Relation: 2021 International Conference on Advanced Electrical Equipment and Reliable Operation (AEERO)

المؤلفون: Chao, Yafeng, Zhang, Liu, Liao, Xinghua, Xiong, Jie, Tan, Ben, Yue, Yishi

المصدر: 2021 International Conference on Advanced Electrical Equipment and Reliable Operation (AEERO) Advanced Electrical Equipment and Reliable Operation (AEERO), 2021 International Conference on. :1-3 Oct, 2021

Relation: 2021 International Conference on Advanced Electrical Equipment and Reliable Operation (AEERO)

المؤلفون: Li, Shijun, Li, Shengtao, Yang, Liuqing, Ge, Zhao, Tan, Ben, Mao, Ganlin, Guo, Qirui

المصدر: IEEE Transactions on Dielectrics and Electrical Insulation IEEE Trans. Dielect. Electr. Insul. Dielectrics and Electrical Insulation, IEEE Transactions on. 28(4):1363-1371 Aug, 2021

المؤلفون: Ju, Ce, Gao, Dashan, Mane, Ravikiran, Tan, Ben, Liu, Yang, Guan, Cuntai

المصدر: 2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC) Engineering in Medicine & Biology Society (EMBC), 2020 42nd Annual International Conference of the IEEE. :3040-3045 Jul, 2020

Relation: 2020 42nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC) in conjunction with the 43rd Annual Conference of the Canadian Medical and Biological Engineering Society

المؤلفون: Tan, Ben, Tian, Xiao-Li, Lu, Jiang, Bai, Yun, Deng, Xiao-Chuan, Li, Cheng-Zhan, Liu, Xin-Yu

المصدر: 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) Solid-State and Integrated Circuit Technology (ICSICT), 2018 14th IEEE International Conference on. :1-3 Oct, 2018

Relation: 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

المؤلفون: Deng, Xiao-Chuan, Tan, Ben, Li, Jun-Tao, Li, Xuan, Zhang, Bo

المصدر: 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) Solid-State and Integrated Circuit Technology (ICSICT), 2018 14th IEEE International Conference on. :1-3 Oct, 2018

Relation: 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

المؤلفون: Gao, Dashan, Tan, Ben, Ju, Ce, Zheng, Vincent W., Yang, Qiang

مصطلحات موضوعية: Computer Science - Cryptography and Security, Computer Science - Machine Learning, Statistics - Machine Learning

URL الوصول: http://arxiv.org/abs/2007.01587