المؤلفون: Wang, Shih-Yu, Hao-Chan Huang, Chieh-Wei He, Yao-Wen Chang, Tao-Cheng Lu, Kuang-Chao Chen, Chih-Yuan Lu

المصدر: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2014 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th. :1-6 Sep, 2014

Relation: 2014 36th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

المؤلفون: Chen-Shang Lai, Meng-Hwang Liu, Shin Su, Tao-Cheng Lu

المصدر: 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672) VLSI technology, systems and applications VLSI Technology, Systems, and Applications, 2003 International Symposium on. :80-83 2003

Relation: 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers

المؤلفون: Yao-Wen Chang, Hsin-Wen Chang, Tao-Cheng Lu, Ya-Chin King, Wenchi Ting, Ku, J., Chih-Yuan Lu

المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 19(1):50-56 Feb, 2006

المؤلفون: Chih-Chieh Yeh, Tahui Wang, Wen-Jer Tsai, Tao-Cheng Lu, Ming-Shiang Chen, Yi-Ying Liao, Wenchi Ting, Yen-Hui Joseph Ku, Chih-Yuan Lu

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 52(4):541-546 Apr, 2005

المؤلفون: Zous, N.-K., Yin-Jen Chen, Chi-Yuan Chin, Tsai, W.-J., Tao-Cheng Lu, Ming-Shiang Chen, Wen-Pin Lu, Tahui Wang, Pan, S.C., Chih-Yuan Lu

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 51(5):720-725 May, 2004

المؤلفون: Chih-Yuan Lu, Tao-Cheng Lu, Liu, R.

المصدر: 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2006. 13th International Symposium on the. :18-23 Jul, 2006

Relation: 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits

المؤلفون: Yao-Wen Chang, Hsing-Wen Chang, Tao-Cheng Lu, Ya-Chin King, Wenchi Ting, Yen-Hui Joseph Ku, Chih-Yuan Lu

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 27(5):390-392 May, 2006

المؤلفون: Yao-Wen Chang, Guan-Wei Wu, I-Chen Yang, Yu-Hung Huang, Ya-Jui Lee, Chih-Hsiung Lee, Kuan-Fu Chen, Tao-Cheng Lu, Kuang-Chao Chen, Chih-Yuan Lu

المصدر: IEEE Electron Device Letters. 43:2077-2080

مصطلحات موضوعية: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f53a3f7e345bd73c70c25e979d0fb1ab
https://doi.org/10.1109/led.2022.3212444

المؤلفون: Chih-Chieh Yeh, Tahui Wang, Wen-Jer Tsai, Tao-Cheng Lu, Yi-Ying Liao, Hung-Yueh Chen, Nian-Kai Zous, Wenchi Ting, Ku, J., Chih-Yuan Lu

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 25(9):643-645 Sep, 2004

المؤلفون: Mu-Yi Liu, Yao-Wen Chang, Zous, N.-K., Ichen Yang, Tao-Cheng Lu, Tahui Wang, Wenchi Ting, Ku, J., Chih-Yuan Lu

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 25(7):495-497 Jul, 2004