المؤلفون: Thomas, Luc, Jan, Guenole, Le, Son, Serrano-Guisan, Santiago, Lee, Yuan-Jen, Liu, Huanlong, Zhu, Jian, Iwata-Harms, Jodi, Tong, Ru-Ying, Patel, Sahil, Sundar, Vignesh, Shen, Dongna, Yang, Yi, He, Renren, Haq, Jesmin, Teng, Zhongjian, Lam, Vinh, Liu, Paul, Wang, Yu-Jen, Zhong, Tom, Wang, Po-Kang

المصدر: 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2017 IEEE. :1-4 Oct, 2017

Relation: 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)

المؤلفون: Jan, Guenole, Thomas, Luc, Le, Son, Lee, Yuan-Jen, Liu, Huanlong, Zhu, Jian, Iwata-Harms, Jodi, Patel, Sahil, Tong, Ru-Ying, Sundar, Vignesh, Serrano-Guisan, Santiago, Shen, Dongna, He, Renren, Haq, Jesmin, Teng, Zhongjian Jeffrey, Lam, Vinh, Yang, Yi, Wang, Yu-Jen, Zhong, Tom, Fukuzawa, Hideaki, Wang, Po-Kang

المصدر: 2018 IEEE Symposium on VLSI Technology VLSI Technology, 2018 IEEE Symposium on. :65-66 Jun, 2018

Relation: 2018 IEEE Symposium on VLSI Technology

المؤلفون: Thomas, Luc, Jan, Guenole, Serrano-Guisan, Santiago, Liu, Huanlong, Zhu, Jian, Lee, Yuan-Jen, Le, Son, Iwata-Harms, Jodi, Tong, Ru-Ying, Patel, Sahil, Sundar, Vignesh, Shen, Dongna, Yang, Yi, He, Renren, Haq, Jesmin, Teng, Zhongjian, Lam, Vinh, Liu, Paul, Wang, Yu-Jen, Zhong, Tom, Fukuzawa, Hideaki, Wang, PoKang

المصدر: 2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :27.3.1-27.3.4 Dec, 2018

Relation: 2018 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Chen, Guannan, Hu, Hengyang, Chen, Rong, Teng, Zhongjian, Xu, DanEr

المصدر: 2012 International Conference on Systems and Informatics (ICSAI2012) Systems and Informatics (ICSAI), 2012 International Conference on. :1878-1881 May, 2012

Relation: 2012 International Conference on Systems and Informatics (ICSAI)

المؤلفون: Thomas, Luc, Jan, Guenole, Le, Son, Serrano-Guisan, Santiago, Lee, Yuan-Jen, Liu, Huanlong, Zhu, Jian, Iwata-Harms, Jodi, Tong, Ru-Ying, Patel, Sahil, Sundar, Vignesh, Shen, Dongna, Yang, Yi, He, Renren, Haq, Jesmin, Teng, Zhongjian, Lam, Vinh, Liu, Paul, Wang, Yu-Jen, Zhong, Tom, Wang, Po-Kang

المصدر: 2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :38.4.1-38.4.4 Dec, 2017

Relation: 2017 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Thomas, Luc, Jan, Guenole, Le, Son, Lee, Yuan-Jen, Liu, Huanlong, Zhu, Jian, Serrano-Guisan, Santiago, Tong, Ru-Ying, Pi, Keyu, Shen, Dongna, He, Renren, Haq, Jesmin, Teng, Zhongjian, Annapragada, Rao, Lam, Vinh, Wang, Yu-Jen, Zhong, Tom, Torng, Terry, Wang, Po-Kang

المصدر: 2015 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2015 IEEE International. :26.4.1-26.4.4 Dec, 2015

Relation: 2015 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Chen, ShengQun, Hong, Qin, Teng, ZhongJian, Lin, Yang

المصدر: 2008 International Conference on Computer Science and Software Engineering Computer Science and Software Engineering, 2008 International Conference on. 4:586-588 Dec, 2008

Relation: 2008 International Conference on Computer Science and Software Engineering (CSSE 2008)

المؤلفون: Iwata-Harms, Jodi M.^Aff1, Jan, Guenole, Serrano-Guisan, Santiago, Thomas, Luc, Liu, Huanlong, Zhu, Jian, Lee, Yuan-Jen, Le, Son, Tong, Ru-Ying, Patel, Sahil, Sundar, Vignesh, Shen, Dongna, Yang, Yi, He, Renren, Haq, Jesmin, Teng, Zhongjian, Lam, Vinh, Liu, Paul, Wang, Yu-Jen, Zhong, Tom, Fukuzawa, Hideaki, Wang, Po-Kang

المصدر: Scientific Reports. 9(1)

المؤلفون: Luc Thomas, Jesmin Haq, Ru-Ying Tong, Teng Zhongjian, Shen Dongna, Hideaki Fukuzawa, Po-Kang Wang, Guenole Jan, Son Thai Le, Vignesh Sundar, Vinh Lam, Yu-Jen Wang, Jian Zhu, Renren He, Yang Yi, Tom Zhong, Santiago Serrano-Guisan, Paul Y. Liu, Huanlong Liu, Sahil Patel, Yuan-Jen Lee, Jodi Iwata-Harms

المصدر: Scientific Reports, Vol 9, Iss 1, Pp 1-7 (2019)
Scientific Reports

مصطلحات موضوعية: Materials for devices, Materials science, Annealing (metallurgy), lcsh:Medicine, 02 engineering and technology, 01 natural sciences, Article, 0103 physical sciences, Monolayer, lcsh:Science, Anisotropy, 010302 applied physics, Multidisciplinary, business.industry, lcsh:R, Spin-transfer torque, Spintronics, Sputter deposition, 021001 nanoscience & nanotechnology, Non-volatile memory, Ferromagnetism, Optoelectronics, lcsh:Q, 0210 nano-technology, business, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0da8a16e79ec54d59a1371e363c41417
https://doi.org/10.1038/s41598-019-54466-7

المؤلفون: Tom Zhong, Santiago Serrano-Guisan, Jesmin Haq, Jodi Iwata-Harms, Guenole Jan, Sahil Patel, Teng Zhongjian, Yuan-Jen Lee, Renren He, Son T. Le, Yang Yi, Paul Liu, Vignesh Sundar, Shen Dongna, Luc Thomas, Ru-Ying Tong, Vinh Lam, Yu-Jen Wang, Jian Zhu, Hideaki Fukuzawa, Po-Kang Wang, Huanlong Liu

المصدر: 2018 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: 010302 applied physics, Magnetoresistive random-access memory, Materials science, Magnetic moment, business.industry, 020208 electrical & electronic engineering, 02 engineering and technology, Nanosecond, 01 natural sciences, Moment (mathematics), 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Data retention, business, Layer (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9ecf43055b69484aea50951849f27ca2
https://doi.org/10.1109/iedm.2018.8614700