المؤلفون: Teo, Z, Sng, MK, Chan, JSK, Lim, MMK, Li, Y, Li, L, Phua, T, Lee, JYH, Tan, ZW, Zhu, P, Tan, NS

المصدر: Oncogene. 36(46):6408-6419

مصطلحات موضوعية: Medicin och hälsovetenskap

URL الوصول: http://kipublications.ki.se/Default.aspx?queryparsed=id:137131978

المؤلفون: Teo, Z., Birman, K., Van Renesse, R.

المصدر: 2016 46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshop (DSN-W) Dependable Systems and Networks Workshop, 2016 46th Annual IEEE/IFIP International Conference on. :97-104 Jun, 2016

Relation: 2016 46th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshop (DSN-W)

المؤلفون: Luo, L. Q., Teo, Z. Q., Kong, Y. J., Deng, F. X., Liu, J. Q., Zhang, F., Cai, X. S., Tan, K. M., Lim, K. Y., Khoo, P., Jung, S. M., Siah, S. Y., Shum, D., Wang, C. M., Xing, J. C., Liu, G. Y., Diao, Y., Lin, G. M., Tee, L., Lemke, S. M., Ghazavi, P., Liu, X., Do, N., Pey, K. L., Shubhakar, K.

المصدر: 2016 IEEE 8th International Memory Workshop (IMW) Memory Workshop (IMW), 2016 IEEE 8th International. :1-4 May, 2016

Relation: 2016 IEEE International Memory Workshop (IMW)

المؤلفون: Teo, Z., Kutsenko, V., Birman, K., Van Renesse, R.

المصدر: 2014 44th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Dependable Systems and Networks (DSN), 2014 44th Annual IEEE/IFIP International Conference on. :792-797 Jun, 2014

Relation: 2014 44th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)

المؤلفون: Hu, Y. Z., Ang, D. S., Teo, Z. Q., Du, G. A.

المصدر: 2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :1058-1062 May, 2010

Relation: 2010 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Ho, T. J. J., Ang, D. S., Boo, A. A., Teo, Z. Q., Leong, K. C.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 59(4):1013-1022 Apr, 2012

المؤلفون: Ang, D. S., Teo, Z. Q., Ho, T. J. J., Ng, C. M.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 11(1):19-34 Mar, 2011

المؤلفون: Hu, Y. Z., Ang, D. S., Teo, Z. Q.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 57(8):2027-2031 Aug, 2010

المؤلفون: Boo, A. A., Ang, D. S., Teo, Z. Q., Leong, K. C.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 33(4):486-488 Apr, 2012

المؤلفون: Teo, Z. Q., Ang, D. S., See, K. S.

المصدر: 2009 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2009 IEEE International. :1-4 Dec, 2009

Relation: 2009 IEEE International Electron Devices Meeting (IEDM)