يعرض 1 - 10 نتائج من 147 نتيجة بحث عن '"Terry, Jonathan"', وقت الاستعلام: 1.04s تنقيح النتائج
  1. 1
    مؤتمر
    Test structure for chemiluminescence measurement in aqueous solutions: initial design

    المؤلفون: Moreno-Guerrero, A. A., Dunare, Camelia, Walton, Anthony J., Lomax, Peter, Terry, Jonathan G., Underwood, Ian

    المصدر: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2024 IEEE 36th International Conference on. :1-5 Apr, 2024

    Relation: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)

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  2. 2
    مؤتمر
    Droplet Impact Sensing with Low Noise Coplanar Reverse-Electrowetting Test Structures

    المؤلفون: Moyo, Anotidaishe, Shahzad, Muhammad Wakil, Smith, Stewart, Terry, Jonathan, Mita, Yoshio, Lewis, Joseph, Li, Yifan

    المصدر: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2024 IEEE 36th International Conference on. :1-5 Apr, 2024

    Relation: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)

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  3. 3
    مؤتمر
    Test Structures for Studying Coplanar Reverse- Electrowetting for Vibration Sensing and Energy Harvesting

    المؤلفون: Moyo, Anotidaishe, Shahzad, Muhammad Wakil, Terry, Jonathan G., Smith, Stewart, Mita, Yoshio, Li, Yifan

    المصدر: 2023 35th International Conference on Microelectronic Test Structure (ICMTS) Microelectronic Test Structure (ICMTS), 2023 35th International Conference on. :1-4 Mar, 2023

    Relation: 2023 35th International Conference on Microelectronic Test Structure (ICMTS)

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  4. 4
    مؤتمر
    Application of Greek cross structures for process development of electrochemical sensors

    المؤلفون: Zhang, Minxing, Zhang, Shan, Dunare, Camelia, Marland, Jamie R. K., Terry, Jonathan G, Smith, Stewart

    المصدر: 2023 35th International Conference on Microelectronic Test Structure (ICMTS) Microelectronic Test Structure (ICMTS), 2023 35th International Conference on. :1-5 Mar, 2023

    Relation: 2023 35th International Conference on Microelectronic Test Structure (ICMTS)

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  5. 5
    مؤتمر
    A facile coplanar reverse electrowetting-on-dielectric configuration for more flexible and integratable force/motion sensing applications

    المؤلفون: Moyo, Anotidaishe, Shahzad, Muhammad Wakil, Terry, Jonathan, Mita, Yoshio, Li, Yifan

    المصدر: 2022 IEEE Sensors Sensors, 2022 IEEE. :1-5 Oct, 2022

    Relation: 2022 IEEE Sensors

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  6. 6
    مؤتمر
    Test Structures for Characterising the Fabrication of Miniature Reference Electrodes

    المؤلفون: Dunare, Camelia, Zhang, Shan, Marland, Jamie R. K., Tsiamis, Andreas, Sullivan, Paul, Underwood, Ian, Terry, Jonathan G., Walton, Anthony J., Smith, Stewart

    المصدر: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2022 IEEE 34th International Conference on. :1-6 Mar, 2022

    Relation: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)

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  7. 7
    مؤتمر
    Application of a Test Structure for Minimising Seed Layer Thickness of Electroplated Ferromagnetic Films

    المؤلفون: Ross, Alan W.S., Dover, Coinneach M., Smith, Stewart, Terry, Jonathan G., Mount, Andrew R., Walton, Anthony J.

    المصدر: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2022 IEEE 34th International Conference on. :1-4 Mar, 2022

    Relation: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)

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  8. 8
    مؤتمر
    Microheater isolation characterisation to aid the optimisation of a MEMS Leidenfrost engine

    المؤلفون: Buchoux, Anthony, Agrawal, Prashant, Wells, Garry G., Ledesma-Aguilar, Rodrigo, Walton, Anthony J., Terry, Jonathan G., Mchale, Glen, Sefiane, Khellil, Stokes, Adam A.

    المصدر: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2020 IEEE 33rd International Conference on. :1-6 May, 2020

    Relation: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)

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  9. 9
    مؤتمر
    Automated Wafer-Level Characterisation of Electrochemical Test Structures for Wafer Scanning

    المؤلفون: Schmueser, Ilka, Mackay, C. Logan, Moore, Fiona, Doherty, Kayleigh, Elliott, Justin P., Mount, Andrew R., Walton, Anthony J., Smith, Stewart, Terry, Jonathan G.

    المصدر: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2020 IEEE 33rd International Conference on. :1-5 May, 2020

    Relation: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)

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  10. 10
    مؤتمر
    Test Structure for Measuring the Selectivity in Vapour Etch Processes

    المؤلفون: Ronde, Markus, Walton, Anthony J., Terry, Jonathan G.

    المصدر: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2020 IEEE 33rd International Conference on. :1-5 May, 2020

    Relation: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)

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