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1مؤتمر
المؤلفون: Moreno-Guerrero, A. A., Dunare, Camelia, Walton, Anthony J., Lomax, Peter, Terry, Jonathan G., Underwood, Ian
المصدر: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2024 IEEE 36th International Conference on. :1-5 Apr, 2024
Relation: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)
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2مؤتمر
المؤلفون: Moyo, Anotidaishe, Shahzad, Muhammad Wakil, Smith, Stewart, Terry, Jonathan, Mita, Yoshio, Lewis, Joseph, Li, Yifan
المصدر: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2024 IEEE 36th International Conference on. :1-5 Apr, 2024
Relation: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)
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3مؤتمر
المؤلفون: Moyo, Anotidaishe, Shahzad, Muhammad Wakil, Terry, Jonathan G., Smith, Stewart, Mita, Yoshio, Li, Yifan
المصدر: 2023 35th International Conference on Microelectronic Test Structure (ICMTS) Microelectronic Test Structure (ICMTS), 2023 35th International Conference on. :1-4 Mar, 2023
Relation: 2023 35th International Conference on Microelectronic Test Structure (ICMTS)
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4مؤتمر
المؤلفون: Zhang, Minxing, Zhang, Shan, Dunare, Camelia, Marland, Jamie R. K., Terry, Jonathan G, Smith, Stewart
المصدر: 2023 35th International Conference on Microelectronic Test Structure (ICMTS) Microelectronic Test Structure (ICMTS), 2023 35th International Conference on. :1-5 Mar, 2023
Relation: 2023 35th International Conference on Microelectronic Test Structure (ICMTS)
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5مؤتمر
المصدر: 2022 IEEE Sensors Sensors, 2022 IEEE. :1-5 Oct, 2022
Relation: 2022 IEEE Sensors
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6مؤتمر
المؤلفون: Dunare, Camelia, Zhang, Shan, Marland, Jamie R. K., Tsiamis, Andreas, Sullivan, Paul, Underwood, Ian, Terry, Jonathan G., Walton, Anthony J., Smith, Stewart
المصدر: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2022 IEEE 34th International Conference on. :1-6 Mar, 2022
Relation: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)
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7مؤتمر
المؤلفون: Ross, Alan W.S., Dover, Coinneach M., Smith, Stewart, Terry, Jonathan G., Mount, Andrew R., Walton, Anthony J.
المصدر: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2022 IEEE 34th International Conference on. :1-4 Mar, 2022
Relation: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)
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8مؤتمر
المؤلفون: Buchoux, Anthony, Agrawal, Prashant, Wells, Garry G., Ledesma-Aguilar, Rodrigo, Walton, Anthony J., Terry, Jonathan G., Mchale, Glen, Sefiane, Khellil, Stokes, Adam A.
المصدر: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2020 IEEE 33rd International Conference on. :1-6 May, 2020
Relation: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)
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9مؤتمر
المؤلفون: Schmueser, Ilka, Mackay, C. Logan, Moore, Fiona, Doherty, Kayleigh, Elliott, Justin P., Mount, Andrew R., Walton, Anthony J., Smith, Stewart, Terry, Jonathan G.
المصدر: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2020 IEEE 33rd International Conference on. :1-5 May, 2020
Relation: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)
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10مؤتمر
المؤلفون: Ronde, Markus, Walton, Anthony J., Terry, Jonathan G.
المصدر: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2020 IEEE 33rd International Conference on. :1-5 May, 2020
Relation: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)