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المؤلفون: Jang-ryul Kim, Hoeju Chung, Rajat Agarwal, Terry Grunzke, Kjersten E. Criss, Kuljit S. Bains, Munseon Jang, Tanj Bennett
المصدر: MEMSYS
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Computer science, CPU cache, Data integrity, Overhead (computing), DIMM, Fault (power engineering), Error detection and correction, Dram, Reliability (statistics), Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::97636f86048d4c0c4826b7651fba1786
https://doi.org/10.1145/3422575.3422803