المؤلفون: Acquadro, J., Noel, S., Chretien, P., Houze, F., Teste, Ph., Genet, C., Azougaghe, H., Ansart, F., Gressier, M., Menu, M.J., Montpellaz, R., Gavard, O., Leroy, R., Tredan, G., Demarthon, S., Pichot, T., Raoul, F., Ladire, M.

المصدر: 2022 IEEE 67th Holm Conference on Electrical Contacts (HLM) Electrical Contacts (HLM), 2022 IEEE 67th Holm Conference on. :1-8 Oct, 2022

Relation: 2022 IEEE 67th Holm Conference on Electrical Contacts (HLM)

المؤلفون: Boukhlifa, M., Andrea, J., Klonowski, T., Landfried, R., Teste, Ph.

المصدر: 2019 IEEE Holm Conference on Electrical Contacts Electrical Contacts, 2019 IEEE Holm Conference on. :1-6 Sep, 2019

Relation: 2019 IEEE Holm Conference on Electrical Contacts

المؤلفون: Landfried, R., Houze, F., Leblanc, T., Teste, Ph.

المصدر: 2017 IEEE Holm Conference on Electrical Contacts Electrical Contacts, 2017 IEEE Holm Conference on. :205-208 Sep, 2017

Relation: 2017 IEEE Holm Conference on Electrical Contacts

المؤلفون: Andrea, J., Buffo, M., Guillard, E., Landfried, R., Boukadoum, R., Teste, Ph.

المصدر: 2017 IEEE Holm Conference on Electrical Contacts Electrical Contacts, 2017 IEEE Holm Conference on. :317-324 Sep, 2017

Relation: 2017 IEEE Holm Conference on Electrical Contacts

المؤلفون: Boukadoum, R., Landfried, R., Leblanc, T., Odic, E., Teste, Ph., Gavard, O.

المصدر: 2017 IEEE Electrical Insulation Conference (EIC) Electrical Insulation Conference (EIC), 2017 IEEE. :165-168 Jun, 2017

Relation: 2017 IEEE Electrical Insulation Conference (EIC)

المؤلفون: Mofakhami, D., Dessante, Ph., Teste, Ph., Landfried, R., Minea, T., Seznec, B., Mazellier, J.-P., Gautherin, P.-L.

المصدر: 2020 33rd International Vacuum Nanoelectronics Conference (IVNC) Vacuum Nanoelectronics Conference (IVNC), 2020 33rd International. :1-2 Jul, 2020

Relation: 2020 33rd International Vacuum Nanoelectronics Conference (IVNC)

المؤلفون: Boukadoum, R., Barbet, A., Dessante, Ph., Landfried, R., Leblanc, T., Teste, Ph.

المصدر: 2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm) Electrical Contacts (Holm), 2016 IEEE 62nd Holm Conference on. :179-186 Oct, 2016

Relation: 2016 IEEE 62nd IEEE Holm Conference on Electrical Contacts (Holm)

المؤلفون: Landfried, R., Leblanc, T., Andlauer, R., Klonowski, T., Teste, Ph.

المصدر: 2010 Proceedings of the 56th IEEE Holm Conference on Electrical Contacts Electrical Contacts (HOLM), 2010 Proceedings of the 56th IEEE Holm Conference on. :1-5 Oct, 2010

Relation: 2010 IEEE Holm Conference on Electrical Contacts (Holm 2010)

المؤلفون: Klonowski, T., Andlauer, R., Leblanc, T., Faure, F., Meyer, R., Teste, Ph.

المصدر: Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts Electrical Contacts, 2004. Electrical contacts Electrical Contacts, 2004. Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts. :459-466 2004

Relation: Proceedings of the 50th IEEE Holm Conference on Electrical Contacts and the 22nd International Conference on Electrical Contacts

المؤلفون: Piccoz, D., Teste, Ph., Andlauer, R., Leblanc, T., Chabrerie, J.P.

المصدر: Electrical Contacts - 1999. Proceedings of the Forty-Fifth IEEE Holm Conference on Electrical Contacts (Cat. No.99CB36343) Electrical contacts Electrical Contacts, 1999. Proceedings of the Forty-Fifth IEEE Holm Conference on. :129-135 1999

Relation: Electrical Contacts - 1999