يعرض 1 - 10 نتائج من 992 نتيجة بحث عن '"Thermal variables control"', وقت الاستعلام: 1.07s تنقيح النتائج
  1. 1
    مؤتمر
    Stochastic Model Predictive Control for Electric Vehicles Thermal Management

    المؤلفون: Hu, Qiuhao, Amini, Mohammad Reza, Kolmanovsky, Ilya, Sun, Jing

    المصدر: 2024 American Control Conference (ACC) American Control Conference (ACC), 2024. :4585-4590 Jul, 2024

    Relation: 2024 American Control Conference (ACC)

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  2. 2
    مؤتمر
    Do Radiation and Aging Impact DVFS? TCAD-based Analysis on 22 nm FDSOI Latches

    المؤلفون: Zhang, Zhe, Weis, Christian, Wehn, Norbert, Tahoori, Mehdi, Nassif, Sani

    المصدر: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2024 IEEE 30th International Symposium on. :1-6 Jul, 2024

    Relation: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS)

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  3. 3
    دورية أكاديمية
    Performance and Threshold Voltage Reliability of Quaternary InAlGaN/GaN MIS-HEMT on Si for Power Device Applications

    المؤلفون: Rathaur, S.K., Ma, C., Dixit, A., Lee, C., Chang, E.Y.

    المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 24(3):428-436 Sep, 2024

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  4. 4
    دورية أكاديمية
    Investigation on Traps Dynamics & Negative Bias Stress in D-Mode GaN-on-Si Power MIS HEMTs Under High-Temperature

    المؤلفون: Rathaur, S.K., Hieu, L.T., Yang, T., Tsai, S.H., Lin, W.Y., Dixit, A., Chang, E.Y.

    المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 24(3):414-421 Sep, 2024

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  5. 5
    دورية أكاديمية
    Significant Lifetime Improvement of Negative Bias Thermal Instability by Plasma Enhanced Atomic Layer Deposition SiN in Stress Memorization Technique

    المؤلفون: Liang, C., Li, Z., Liu, H., Jiang, Y.

    المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 37(3):405-409 Aug, 2024

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  6. 6
    مؤتمر
    Variable frequency control strategy for transformers surge current reduction in DAB converters

    المؤلفون: Vilella, Manel, Zaragoza, Jordi, Berbel, Nestor, Capella, Gabriel, Lamich, Manuel

    المصدر: 2024 IEEE 33rd International Symposium on Industrial Electronics (ISIE) Industrial Electronics (ISIE), 2024 IEEE 33rd International Symposium on. :1-6 Jun, 2024

    Relation: 2024 IEEE 33rd International Symposium on Industrial Electronics (ISIE)

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  7. 7
    مؤتمر
    Electric Field Modeling in Cable Terminals with Defects and Fed by Power Converters

    المؤلفون: Barrera-Chavez, Monserrat, Espino-Cortes, Fermin P., Nuricumbo-Guillen, Rodrigo

    المصدر: 2024 IEEE Electrical Insulation Conference (EIC) Electrical Insulation Conference (EIC), 2024 IEEE. :287-290 Jun, 2024

    Relation: 2024 IEEE Electrical Insulation Conference (EIC)

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  8. 8
    مؤتمر
    Interface Trap Analysis in Multi-Fin FinFET Technology: a Crucial Reliability Issue in Digital Application

    المؤلفون: Patel, Jyoti, Rai, Sankalp, Kumar, Vivek, Dasgupta, Sudeb

    المصدر: 2024 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2024 IEEE International Symposium on. :1-5 May, 2024

    Relation: 2024 IEEE International Symposium on Circuits and Systems (ISCAS)

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  9. 9
    مؤتمر
    Establishment of Degradation Model and Transfer Model for P-channel Power MOSFETs Under Negative Bias Temperature Stress

    المؤلفون: Chen, Cen, Wang, Haodong, Yin, Haonan, Zheng, Wei, Zhai, Guofu

    المصدر: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia) Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia), 2024 IEEE 10th International. :4280-4284 May, 2024

    Relation: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia)

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  10. 10
    مؤتمر
    An Efficient Aged Timing Analysis Method for Digital Integrated Circuit Under NBTI Effect

    المؤلفون: Zhang, Yang, Tang, Zhengguang, Jin, Yawei, Zhang, Hong, Sun, Yongsheng, Chen, Chen, Lin, Xiaoling, Li, Cong, You, Hailong

    المصدر: 2024 2nd International Symposium of Electronics Design Automation (ISEDA) Electronics Design Automation (ISEDA), 2024 2nd International Symposium of. :474-479 May, 2024

    Relation: 2024 2nd International Symposium of Electronics Design Automation (ISEDA)

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