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1دورية أكاديمية
المؤلفون: Evelyn T. Breyer, Halid Mulaosmanovic, Jens Trommer, Thomas Melde, Stefan Dunkel, Martin Trentzsch, Sven Beyer, Stefan Slesazeck, Thomas Mikolajick
المصدر: IEEE Journal of the Electron Devices Society, Vol 8, Pp 748-756 (2020)
مصطلحات موضوعية: Adder, ferroelectric FET (FeFET), hafnium oxide (HfO₂), logic-in-memory (LiM), look-up table (LUT), memory array, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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2دورية أكاديمية
المؤلفون: Dayane Reis, Kai Ni, Wriddhi Chakraborty, Xunzhao Yin, Martin Trentzsch, Stefan Dunkel, Thomas Melde, Johannes Muller, Sven Beyer, Suman Datta, Michael T. Niemier, Xiaobo Sharon Hu
المصدر: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, Vol 5, Iss 2, Pp 103-112 (2019)
مصطلحات موضوعية: Emerging technologies, FeFETs, memory, Computer engineering. Computer hardware, TK7885-7895
وصف الملف: electronic resource
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المؤلفون: Nicki Mika, Thomas Melde, Stefan Dunkel, Michael Otto, Francois Weisbuch, Peter Krottenthaler, Thomas Mikolajick
المصدر: ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d5d5dbfbb8d506612c19a4523080fd81
https://doi.org/10.1109/essderc55479.2022.9947160 -
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المؤلفون: Ralf Richter, Thomas Melde, Stefan Duenkel, H. Giesler, N. Weddeler, Sven Beyer, M. Trentzsch, M. Otto, F. Weisbuch
المصدر: 2021 IEEE International Memory Workshop (IMW).
مصطلحات موضوعية: 010302 applied physics, Hardware_MEMORYSTRUCTURES, Fabrication, Materials science, High interest, business.industry, Process (computing), Silicon on insulator, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Non-volatile memory, Flash (photography), 0103 physical sciences, Optoelectronics, 0210 nano-technology, business, Layer (electronics), Scaling
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c6ae2514b5570f787d3591913558983f
https://doi.org/10.1109/imw51353.2021.9439612 -
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المؤلفون: Johannes Müller, Thomas Melde, Kai Ni, Suman Datta, Stefan Dunkel, Michael Niemier, Xunzhao Yin, Xiaobo Sharon Hu, Wriddhi Chakraborty, Sven Beyer, Dayane Reis, Martin Trentzsch
المصدر: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, Vol 5, Iss 2, Pp 103-112 (2019)
مصطلحات موضوعية: lcsh:Computer engineering. Computer hardware, Computer science, lcsh:TK7885-7895, 02 engineering and technology, 01 natural sciences, Bottleneck, memory, Memory cell, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Figure of merit, System on a chip, Static random-access memory, Electrical and Electronic Engineering, Leakage (electronics), 010302 applied physics, Hardware_MEMORYSTRUCTURES, business.industry, Electrical engineering, 020202 computer hardware & architecture, Electronic, Optical and Magnetic Materials, Resistive random-access memory, Emerging technologies, Hardware and Architecture, Logic gate, business, FeFETs
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المؤلفون: Xinwang Liu, Tom Herrmann, G. Festes, B. Bertello, Yuri Tkachev, Boris Bayha, M. Duggan, Ralf Richter, Alban Zaka, Decobert Catherine, Thomas Melde, S. Wittek, Stefan Dunkel, N. Do, P. Ghazav, N. Bollon, F. Mauersberger, Sven Beyer, Kim Jinho, Viktor Markov, B. Muller, Zhou Feng, S. Jourba, M. Trentzsch
المصدر: 2020 IEEE International Memory Workshop (IMW).
مصطلحات موضوعية: 010302 applied physics, Computer science, business.industry, Transistor, 020206 networking & telecommunications, 02 engineering and technology, 01 natural sciences, law.invention, Flash (photography), Reliability (semiconductor), CMOS, Memory cell, law, 0103 physical sciences, Process integration, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Data retention, Metal gate, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::68d6b99bb8692b55d9511f87f7674fd4
https://doi.org/10.1109/imw48823.2020.9108118 -
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المؤلفون: Sven Beyer, Thomas Melde, S. Wittek, L. Perniola, S. Duenkel, C. Cagli, M. Trentzsch, F. Gaillard, B. Mueller
المصدر: IRPS
مصطلحات موضوعية: Data stability, Hardware_MEMORYSTRUCTURES, Materials science, business.industry, Bit error rate, Optoelectronics, Field-effect transistor, Performance improvement, business, Stability (probability), Ferroelectricity
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cef8dc8e7d157e02c01119ad77f5c94f
https://doi.org/10.1109/irps.2019.8720449 -
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المؤلفون: Stefan Dunkel, Thomas Mikolajick, Halid Mulaosmanovic, Martin Trentzsch, Jens Trommer, Stefan Slesazeck, Evelyn T. Breyer, Sven Beyer, Thomas Melde
المصدر: ESSDERC
مصطلحات موضوعية: 010302 applied physics, Ultra dense, Computer science, Transistor, active area sharing, ferroelectric FET (FeFET), hafnium oxide, look-up table (LUT), Logic-in-Memory (LiM), multiplexer (MUX), ultra-dense integration, 02 engineering and technology, Aufteilung der aktiven Fläche, ferroelektrischer FET (FeFET), Hafniumoxid, Look-up-Table (LUT), Logic-in-Memory (LiM), Multiplexer (MUX), ultra-dichte Integration, 021001 nanoscience & nanotechnology, 01 natural sciences, Multiplexer, Ferroelectricity, Hafnium oxide, law.invention, CMOS, law, 0103 physical sciences, Electronic engineering, ddc:621, 0210 nano-technology, Scaling, Electronic circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::609455ee6d0898d838710e70e1660e4b
https://tud.qucosa.de/id/qucosa:79724 -
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المؤلفون: Steve Knebel, Ekaterina Yurchuk, Thomas Mikolajick, Thomas Melde, Jonas Sundqvist, Uwe Schröder, Johannes Müller, Andrew P. Graham
المصدر: Thin Solid Films. 533:88-92
مصطلحات موضوعية: Diffraction, Materials science, Silicon, Annealing (metallurgy), Doping, Metals and Alloys, chemistry.chemical_element, Surfaces and Interfaces, Ferroelectricity, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Capacitor, chemistry, law, Materials Chemistry, Thin film, Composite material, Crystallization