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المؤلفون: Marinela Barci, Daniele Leonelli, Xue Zhou, Xiaojie Wang, Daniele Garbin, Ganesh Jayakumar, Thomas Witters, Nathali Franchina Vergel, Shreya Kundu, Senthil Vadakupudhu Palayam, Huifang Jiao, Hao Wu, Gouri Sankar Kar
المصدر: IEEE Transactions on Electron Devices. 69:6106-6112
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المؤلفون: Taras Ravsher, Andrea Fantini, Adrian Vaisman Chasin, Shamin Houshmand Sharifi, Hubert Hody, Harold Dekkers, Thomas Witters, Jan Van Houdt, Valeri Afanas'ev, Sebastien Couet, Gouri Sankar Kar
المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS).
مصطلحات موضوعية: breakdown, cross-point memory array, STT-MRAM, IGZO, selector
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b5952c415f8c71fe590a491d09e91b55
https://doi.org/10.1109/irps48227.2022.9764424 -
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المؤلفون: Xavier Rottenberg, Anabel De Proft, Kristof Lodewijks, G. L. Donadio, Daniele Garbin, Romain Delhougne, Ludovic Goux, Gouri Sankar Kar, H. Hody, Thomas Witters
المصدر: IEEE Transactions on Electron Devices. 67:4228-4233
مصطلحات موضوعية: 010302 applied physics, Materials science, 01 natural sciences, Finite element method, Electronic, Optical and Magnetic Materials, Phase-change memory, Heat generation, 0103 physical sciences, Electrode, Pillar Cell, Electrical and Electronic Engineering, Composite material, Current (fluid), Layer (electronics), Reset (computing)
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المؤلفون: Negin Golshani, Thomas Witters, John McGurk, Peter De Heyn, Jeroen De Coster, Alexey Milenin, Arame Thiam, Andrea Mingardi, Peter Verheyen, Marianna Pantouvaki, Joris Van Campenhout
المصدر: 2021 IEEE 17th International Conference on Group IV Photonics (GFP).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7fab1cb0ace7aad06a6a42edecb8de55
https://doi.org/10.1109/gfp51802.2021.9673874 -
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المؤلفون: Philippe Leray, N. Jourdan, O. Varela Pedreira, E. Dentoni-Litta, Thomas Witters, Werner Gillijns, Nancy Heylen, L. Ramakers, E. Grieten, Zaid El-Mekki, Gayle Murdoch, V. Vega-Gonzalez, Anne-Laure Charley, Ivan Ciofi, Zsolt Tokei, H. Vats, S. V. Gompel, M. H. van der Veen, L. Halipre, J. Swerts, A. Haider, Bilal Chehab, S. Park, N. Bazzazian, Quoc Toan Le, B. De Wachter, T. Peissker, Harinarayanan Puliyalil, Naoto Horiguchi, Miroslav Cupak, J. Versluijs, G. T. Martinez, Y. Kimura, R. Kim, J. Geypen, J. Uk-Lee, N. Nagesh, D. Montero, L. Rynders, M. Ercken, D. Batuk, K. Croes, Patrick Verdonck, Manoj Jaysankar, Y. Drissi, T. Webers
المصدر: 2021 IEEE International Interconnect Technology Conference (IITC).
مصطلحات موضوعية: chemistry.chemical_compound, Atomic layer deposition, Materials science, chemistry, Analytical chemistry, Nucleation, chemistry.chemical_element, Chemical vapor deposition, Tin, Cobalt, Layer (electronics), Titanium nitride, Titanium oxide
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::775097fabe7d875876eeac9844668bb1
https://doi.org/10.1109/iitc51362.2021.9537535 -
6Threshold switching in a-Si and a-Ge based MSM selectors and its implications for device reliability
المؤلفون: H. Hody, Andrea Fantini, S. H. Sharifi, Robin Degraeve, Thomas Witters, J. Van Houdt, D. Crotti, Ludovic Goux, Valery V. Afanas'ev, Gouri Sankar Kar, Daniele Garbin, T. Ravsher
المصدر: 2021 IEEE International Memory Workshop (IMW).
مصطلحات موضوعية: Materials science, Equivalent series resistance, business.industry, Thermal resistance, Process (computing), law.invention, Reliability (semiconductor), Semiconductor, law, Optoelectronics, Resistor, business, Quantum tunnelling, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::446e51f1f056f5600d0b19ad1e999fb7
https://doi.org/10.1109/imw51353.2021.9439629 -
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المؤلفون: Zaid El-Mekki, F. Schleicher, Frederic Lazzarino, D. Trivkovic, Zsolt Tokei, B. De-Wachter, S. V. Gompel, L. Halipre, E. Vancoille, S. Decoster, G. Muroch, Thomas Witters, L. Dupas, O. Varela-Pereira, B. Briggs, Quoc Toan Le, Harinarayanan Puliyalil, Christopher J. Wilson, Philippe Leray, N. Jourdan, I. Demonie, C. Lorant, Joost Bekaert, Nancy Heylen, Y. Kimura, Rogier Baert, M. H. van der Veen, J. Versluijs, Miroslav Cupak, Patrick Verdonck, K. Croes, Manoj Jaysankar, Anne-Laure Charley, J. Heijlen, J. Uk-Lee, Ivan Ciofi, Y. Drissi, V. Vega-Gonzalez, S. Paolillo, H. Vats, D. Montero, L. Rynders, Els Kesters, M. Ercken, A. Lesniewska, R. Kim, Lieve Teugels, T. Webers
المصدر: 2020 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: Thermal shock, Reliability (semiconductor), Materials science, chemistry, Process integration, Analytical chemistry, chemistry.chemical_element, Time-dependent gate oxide breakdown, Dielectric, Tin, Ruthenium
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9d5b5a73112c7be6f5016d4aa4c44eb7
https://doi.org/10.1109/iedm13553.2020.9372096 -
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المصدر: physica status solidi (RRL) – Rapid Research Letters
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المؤلفون: Wouter Devulder, Gouri Sankar Kar, Thomas Witters, J. Radhakrishnan, Attilio Belmonte, Augusto Redolfi, Guy Vereecke, Laura Nyns, P. Kumbhare, Ludovic Goux, A. Covello, Alexis Franquet, G. L. Donadio, Valentina Spampinato, M. Mao, Romain Delhougne, H. Hody, Shreya Kundu
المصدر: 2019 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Yield (engineering), Materials science, business.industry, Programmable metallization cell, 02 engineering and technology, Active electrode, 021001 nanoscience & nanotechnology, 01 natural sciences, 0103 physical sciences, Optoelectronics, Data retention, 0210 nano-technology, business, Layer (electronics), Electrical conductor, Scaling, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6b5320d0020c3fe494bd88dbc76dea29
https://doi.org/10.1109/iedm19573.2019.8993527 -
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المؤلفون: Shreya Kundu, J. Radhakrishnan, Attilio Belmonte, Thomas Witters, Wouter Devulder, Ludovic Goux, Michel Houssa, Gouri Sankar Kar, Augusto Redolfi
المصدر: Faraday discussions. 213
مصطلحات موضوعية: Materials science, Programmable metallization cell, Chalcogenide, 02 engineering and technology, Electrolyte, 010402 general chemistry, 01 natural sciences, law.invention, chemistry.chemical_compound, law, Thermal stability, Physical and Theoretical Chemistry, Electrical conductor, Science & Technology, Chemistry, Physical, CONDUCTIVE-BRIDGING RAM, business.industry, MEMORY, Transistor, 021001 nanoscience & nanotechnology, 0104 chemical sciences, Chemistry, CMOS, chemistry, Physical Sciences, Electrode, Optoelectronics, 0210 nano-technology, business, TRANSITION
وصف الملف: Print
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b322c57f4dff94a1b3f742618665443f
https://pubmed.ncbi.nlm.nih.gov/30346458