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1دورية أكاديمية
المؤلفون: Tim Böckendorf, Jan Kirschbaum, Felix Kipke, Dominique Bougeard, John Lundsgaard Hansen, Arne Nylandsted Larsen, Matthias Posselt, Hartmut Bracht
المصدر: AIP Advances, Vol 14, Iss 6, Pp 065129-065129-8 (2024)
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2158-3226
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2
المؤلفون: Jan K. Prüßing, Tim Böckendorf, Felix Kipke, Jiushuai Xu, Prabowo Puranto, John Lundsgaard Hansen, Dominique Bougeard, Erwin Peiner, Hartmut Bracht
المصدر: Prüßing, J K, Böckendorf, T, Kipke, F, Xu, J, Puranto, P, Lundsgaard Hansen, J, Bougeard, D, Peiner, E & Bracht, H 2022, ' Retarded boron and phosphorus diffusion in silicon nanopillars due to stress induced vacancy injection ', Journal of Applied Physics, vol. 131, no. 7, 075702 . https://doi.org/10.1063/5.0078006
مصطلحات موضوعية: General Physics and Astronomy
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3
المؤلفون: Gerry Hamdana, Jan K. Prüßing, Hartmut Bracht, Erwin Peiner, Tim Böckendorf
المصدر: ECS Meeting Abstracts. :1097-1097
مصطلحات موضوعية: Materials science, Distribution (number theory), Spreading resistance profiling, business.industry, Doping, Microscopy, Optoelectronics, business, Silicon nanostructures
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4
المؤلفون: Hartmut Bracht, Jan K. Prüßing, Gerry Hamdana, Erwin Peiner, Tim Böckendorf
المصدر: Journal of Applied Physics. 127:055703
مصطلحات موضوعية: 010302 applied physics, Materials science, Spreading resistance profiling, Dopant, Silicon, business.industry, Doping, General Physics and Astronomy, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Secondary ion mass spectrometry, chemistry, 0103 physical sciences, Microscopy, Optoelectronics, Sample preparation, 0210 nano-technology, Boron, business