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1
المؤلفون: Said Bakkar, Elora Zucha, Joseph Beam, Will H Flanagan, Satish Dixit, Tim Z Hossain
المصدر: Journal of the American Ceramic Society.
مصطلحات موضوعية: Materials Chemistry, Ceramics and Composites
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2
المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 18:1690-1693
مصطلحات موضوعية: Materials science, Silicon, Analytical chemistry, chemistry.chemical_element, Surfaces and Interfaces, Condensed Matter Physics, Surfaces, Coatings and Films, Auger, symbols.namesake, X-ray photoelectron spectroscopy, chemistry, Attenuation coefficient, symbols, Thin film, Spectroscopy, Raman spectroscopy, Cobalt
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3
المؤلفون: Krishnan Chari, Tim Z. Hossain
المصدر: The Journal of Physical Chemistry. 95:3302-3305
مصطلحات موضوعية: chemistry.chemical_classification, Aqueous solution, Air water interface, Inorganic chemistry, technology, industry, and agriculture, General Engineering, macromolecular substances, Polymer, Surface tension, chemistry.chemical_compound, Adsorption, chemistry, Chemical engineering, Desorption, Phase (matter), Physical and Theoretical Chemistry, Sodium dodecyl sulfate
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1cadd452f64ff43a2029f44aa721d38c
https://doi.org/10.1021/j100161a062 -
4Measurement and Control of the Boron and Phosphorus Concentration in LPCVD Borophosphosilicate Glass
المصدر: Journal of The Electrochemical Society. 137:3917-3922
مصطلحات موضوعية: Renewable Energy, Sustainability and the Environment, Phosphorus concentration, Analytical chemistry, chemistry.chemical_element, Chemical vapor deposition, Condensed Matter Physics, Silicate, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, Materials Chemistry, Electrochemistry, Boron, Borophosphosilicate glass, Refractive index, Nuclear chemistry
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5
المؤلفون: Chu Wei-Kan, M. L. Swanson, Eric C. Frey, R.Greg Downing, Hans Hofsäss, Tim Z. Hossain, Nalin R. Parikh
المصدر: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 45:70-74
مصطلحات موضوعية: Nuclear and High Energy Physics, Chemistry, Resolution (electron density), Solid angle, Neutron depth profiling, Atomic physics, Mass spectrometry, Instrumentation, Order of magnitude, Coincidence, FOIL method, Ion
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6
المؤلفون: Alan Campion, Tim Z. Hossain, Lynette K. Ballast
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Materials science, business.industry, Analytical chemistry, chemistry.chemical_element, Nanotechnology, Fingerprint recognition, symbols.namesake, Crystallinity, chemistry, Phase (matter), symbols, Microelectronics, Cobalt silicide, Thin film, Raman spectroscopy, business, Cobalt
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::232faa2e8f81cb4a96893cc61c8e8c33
https://doi.org/10.1117/12.410082 -
7
المؤلفون: Tim Z. Hossain, Michael Allen, Joseph Lebowitz
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Total internal reflection, Optics, Fabrication, Semiconductor, Reflection (mathematics), Silicon, business.industry, Chemistry, Cleanroom, X-ray fluorescence, chemistry.chemical_element, Wafer, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4f8252f3cd0ebe5e105f1d359b0a4d53
https://doi.org/10.1117/12.346909 -
8
المؤلفون: Tim Z. Hossain, Brooke M. Noack
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Wafer fabrication, Total internal reflection, Materials science, Optics, Stack (abstract data type), business.industry, Chemical-mechanical planarization, Surface roughness, Wafer, Semiconductor device, Surface finish, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::540312c6db81789843bbf030fd517ff4
https://doi.org/10.1117/12.324416 -
9
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Total internal reflection, Ion implantation, Materials science, business.industry, Nondestructive testing, Analytical chemistry, X-ray fluorescence, Wafer, Luminescence, business, Mass spectrometry, Ion
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1afb2d6da15292d17b942f697ce0bf9d
https://doi.org/10.1117/12.284675 -
10
المؤلفون: Tim Z. Hossain, Dan Posey
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Chemical signature, Die bonding, chemistry, Aluminium, Wafer bonding, Fluorine, Ft ir spectroscopy, Analytical chemistry, chemistry.chemical_element, Water of crystallization, Fourier transform infrared spectroscopy, Composite material
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::17240690ac4a2c154e8d3ae5180eb4de
https://doi.org/10.1117/12.284679