المؤلفون: Maniatakos, Michail, Tirumurti, Chandra, Jas, Abhijit, Makris, Yiorgos

المصدر: 2011 Sixteenth IEEE European Test Symposium Test Symposium (ETS), 2011 16th IEEE European. :87-92 May, 2011

Relation: 2011 16th IEEE European Test Symposium (ETS)

المؤلفون: Maniatakos, Michail, Karimi, Naghmeh, Tirumurti, Chandra, Jas, Abhijit, Makris, Yiorgos

المصدر: IEEE Transactions on Computers IEEE Trans. Comput. Computers, IEEE Transactions on. 60(9):1260-1273 Sep, 2011

المؤلفون: Karimi, Naghmeh, Maniatakos, Michail, Jas, Abhijit, Tirumurti, Chandra, Makris, Yiorgos

المصدر: IEEE Transactions on Computers IEEE Trans. Comput. Computers, IEEE Transactions on. 60(9):1274-1287 Sep, 2011

المؤلفون: Karimi, Naghmeh, Maniatakos, Michail, Tirumurti, Chandra, Jas, Abhijit, Makris, Yiorgos

المصدر: 2009 IEEE International Conference on Computer Design Computer Design, 2009. ICCD 2009. IEEE International Conference on. :91-96 Oct, 2009

Relation: 2009 IEEE International Conference on Computer Design (ICCD 2009)

المؤلفون: Maniatakos, Michail, Karimi, Naghmeh, Tirumurti, Chandra, Jas, Abhijit, Makris, Yiorgos

المصدر: 2009 27th IEEE VLSI Test Symposium VLSI Test Symposium, 2009. VTS '09. 27th IEEE. :9-14 May, 2009

Relation: 2009 27th IEEE VLSI Test Symposium (VTS)

المؤلفون: Fang, Hongxia, Chakrabarty, Krishnendu, Jas, Abhijit, Patil, Srinivas, Tirumurti, Chandra

المصدر: 2009 27th IEEE VLSI Test Symposium VLSI Test Symposium, 2009. VTS '09. 27th IEEE. :264-269 May, 2009

Relation: 2009 27th IEEE VLSI Test Symposium (VTS)

المؤلفون: Maniatakos, Michail, Karimi, Naghmeh, Makris, Yiorgos, Jas, Abhijit, Tirumurti, Chandra

المصدر: 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems Defect and Fault Tolerance of VLSI Systems, 2008. DFTVS '08. IEEE International Symposium on. :454-462 Oct, 2008

Relation: 2008 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTVS)

المؤلفون: Asadi, Hossein, Tahoori, Mehdi B., Tirumurti, Chandra

المصدر: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) Defect and Fault-Tolerance in VLSI Systems, 2007. DFT '07. 22nd IEEE International Symposium on. :41-49 Sep, 2007

Relation: 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems

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تسجيل الدخول للوصول الكامل.