-
1دورية أكاديمية
المؤلفون: Azrif B. Manut, Jian Fu Zhang, Meng Duan, Zhigang Ji, Wei Dong Zhang, Ben Kaczer, Tom Schram, Naoto Horiguchi, Guido Groeseneken
المصدر: IEEE Journal of the Electron Devices Society, Vol 4, Iss 1, Pp 15-21 (2016)
مصطلحات موضوعية: Random Telegraph Noise, RTN, Hot Carriers, defects, fluctuation, instability, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
-
2
المؤلفون: Steven Brems, Souvik Ghosh, Quentin Smets, Marie-Emmanuelle Boulon, Andries Boelen, Koen Kennes, Hung-Chieh Tsai, Francois Chancerel, Clement Merckling, Pieter-Jan Wyndaele, Jean-Francois De Marneffe, Tom Schram, Pawan Kumar, Stefanie Sergeant, Thomas Nuytten, Stefan De Gendt, Henry Medina Silva, Benjamin Groven, Pierre Morin, Gouri Sankar Kar, César Lockhart De la Rosa, Didit Yudistira, Joris Van Campenhout, Inge Asselberghs, Alain Phommahaxay
المصدر: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5bbbbfb500f3632e1fef09b85aeb6972
https://doi.org/10.1109/vlsi-tsa/vlsi-dat57221.2023.10134381 -
3
المؤلفون: Stenfan Kubicek, Tom Schram, Joseph Ervin, Benjamin Vincent, Raghu Hathwar, Jerome Mitard, Eugenio Dentoni Litta, Sylvain Baudot, Mattan Kamon, Steven Demuynck, Thomas Chiarella, Yong Kong Siew, S. A. Chew
المصدر: IEEE Transactions on Electron Devices. 67:5374-5380
مصطلحات موضوعية: 010302 applied physics, Computer science, Design of experiments, Semiconductor device modeling, Process variable, Statistical process control, 01 natural sciences, Subthreshold slope, Electronic, Optical and Magnetic Materials, Process variation, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, Process window, Virtual device, Electrical and Electronic Engineering, Simulation
-
4
المؤلفون: Quentin Smets, Tom Schram, Devin Verreck, Daire Cott, Benjamin Groven, Zubair Ahmed, Ben Kaczer, Jerome Mitard, Xiangyu Wu, Souvik Kundu, Hans Mertens, Dunja Radisic, Arame Thiam, Waikin Li, Emmanuel Dupuy, Zheng Tao, Kevin Vandersmissen, Thibaut Maurice, Dennis Lin, Pierre Morin, Inge Asselberghs, Iuliana Radu
المصدر: 2021 IEEE International Electron Devices Meeting (IEDM)
-
5
المؤلفون: Pierre Morin, Benjamin Groven, Henry Medina, Yuanyuan Shi, Vladislav Voronenkov, Iryna Kandybka, Annelies Delabie, Dries Vranckx, Brecht De Vos, Sebastiaan Nijs, Thibaut Maurice, Daire Cott, Sreetama Banerjee, Quentin Smets, Tom Schram, Xiangyu Wu, Dennis Lin, Inge Asselberghs
المصدر: ECS Meeting Abstracts. :822-822
-
6
المؤلفون: Tom Schram, Surajit Sutar, Iuliana Radu, Inge Asselberghs
المصدر: Advanced Materials. 34:2109796
مصطلحات موضوعية: Mechanics of Materials, Mechanical Engineering, General Materials Science
-
7
المؤلفون: Elyse Hambacher, Dan Lord, Thomas Higginbotham, Beth S. Fornauf, Tom Schram, Kathryn McCurdy, Emilie Mitescu Reagan
المصدر: Teaching and Teacher Education. 80:83-93
مصطلحات موضوعية: Pedagogy, Sociology, Teacher education, Education
-
8
المؤلفون: Romain Ritzenthaler, Naoto Horiguchi, Eddy Simoen, Tom Schram, Barry O'Sullivan, Eugenio Dentoni Litta, Cor Claeys
المصدر: IEEE Transactions on Electron Devices. 65:3676-3681
مصطلحات موضوعية: 010302 applied physics, Input/output, Noise power, Materials science, business.industry, Infrasound, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Noise (electronics), Electronic, Optical and Magnetic Materials, chemistry, Logic gate, 0103 physical sciences, MOSFET, Optoelectronics, Electrical and Electronic Engineering, 0210 nano-technology, Tin, Metal gate, business
-
9
المؤلفون: Guy Vereecke, Naoto Horiguchi, Lars-Ake Ragnarsson, Eugenio Dentoni Litta, Yusuke Oniki, Tom Schram, Harold Dekkers, Frank Holsteyns
المصدر: Solid State Phenomena. 282:132-138
مصطلحات موضوعية: 010302 applied physics, Materials science, 0103 physical sciences, Metallurgy, General Materials Science, 02 engineering and technology, 021001 nanoscience & nanotechnology, 0210 nano-technology, Condensed Matter Physics, 01 natural sciences, Polycrystalline copper, Atomic and Molecular Physics, and Optics
-
10
المؤلفون: E. Dupuy, Steven Brems, Devin Verreck, P. Morin, Cedric Huyghebaert, Goutham Arutchelvan, D. Radisic, Alain Phommahaxay, A. Thiam, Abhinav Gaur, Tom Schram, Matty Caymax, Koen Kennes, Katia Devriendt, Quentin Smets, W. Li, Inge Asselberghs, Thibaut Maurice, Iuliana Radu, Aryan Afzalian, Benjamin Groven, J-F de Marneffe, D. Lin, Daire J. Cott
المصدر: 2020 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: Wafer-scale integration, Materials science, Silicon, business.industry, Transistor, chemistry.chemical_element, law.invention, CMOS, chemistry, law, Logic gate, Optoelectronics, Wafer, business, TO-18, Communication channel
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::10f06bb0ae65bdc27f13c5df6895fabf
https://doi.org/10.1109/iedm13553.2020.9371926