-
1
المؤلفون: Loan Pham-Nguyen, Stephane Denorme, P. Gros, Pascal Gouraud, Pierre Perreau, Sébastien Barnola, Sebastien Haendler, A. Margain, Y. Campidelli, F. Boedt, Olivier Weber, Christian Arvet, Daniel Delprat, J. Vetier, Francois Leverd, Remi Beneyton, C. Fenouillet-Beranger, C. Perrot, Tomasz Skotnicki, Stephane Monfray, Bich-Yen Nguyen, O. Faynot, F. Baron, Konstantin Bourdelle, C. de Buttet, A. Torres, Francois Andrieu, L. Pinzelli, L. Tosti, C. Borowiak, C. Laviron, F. Abbate
المصدر: Solid-State Electronics. 54:849-854
مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, Silicon on insulator, Condensed Matter Physics, Subthreshold slope, Electronic, Optical and Magnetic Materials, PMOS logic, Threshold voltage, Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, business, Metal gate, NMOS logic, High-κ dielectric, Ground plane
-
2
المؤلفون: Remi Beneyton, Simon Deleonibus, Sebastien Haendler, Pascal Gouraud, E. Deloffre, Tomasz Skotnicki, Claire Fenouillet-Beranger, Sébastien Barnola, C. Laviron, X. Garros, L. Tosti, P. Perreau, Nicolas Loubet, M. Casse, T. Salvetat, C. Leyris, Francois Leverd, Mickael Gros-Jean, P. Scheiblin, Francois Andrieu, F. Allain, Stephane Denorme, Loan Pham-Nguyen, Roland Pantel, C. Buj, L. Clement, O. Faynot, M. Marin
المصدر: Solid-State Electronics. 53:730-734
مصطلحات موضوعية: Engineering, business.industry, Electrical engineering, Silicon on insulator, Integrated circuit, Condensed Matter Physics, Subthreshold slope, Noise (electronics), Electronic, Optical and Magnetic Materials, law.invention, law, Low-power electronics, MOSFET, Materials Chemistry, Optoelectronics, Static random-access memory, Electrical and Electronic Engineering, business, Metal gate, Ground plane, High-κ dielectric
-
3
المؤلفون: Tomasz Skotnicki, A. Pouydebasque, Romain Gwoziecki, C. Charbuillet
المصدر: IEEE Transactions on Electron Devices. 54:2723-2729
مصطلحات موضوعية: Engineering, business.industry, Semiconductor device modeling, Hardware_PERFORMANCEANDRELIABILITY, Subthreshold slope, Cathode, Electronic, Optical and Magnetic Materials, law.invention, Transformation (function), CMOS, law, Logic gate, MOSFET, Range (statistics), Electronic engineering, Electrical and Electronic Engineering, business, Hardware_LOGICDESIGN
-
4
المؤلفون: P. Bouillon, Tomasz Skotnicki, R. Gwoziecki, J. Alieu, P. Gentil
المصدر: IEEE Transactions on Electron Devices. 47:871-877
مصطلحات موضوعية: Materials science, Doping, chemistry.chemical_element, Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, Capacitance, Molecular physics, Electronic, Optical and Magnetic Materials, chemistry, Impurity, Ionization, MOSFET, Electrical and Electronic Engineering, Ionization energy, Atomic physics, Helium, Voltage
-
5
المؤلفون: P. Perreau, C. Fenouillet-Beranger, Frederic Boeuf, C. Perrot, Sébastien Barnola, C. de Buttet, F. Boedt, Konstantin Bourdelle, O. Faynot, Olivier Weber, Francois Andrieu, F. Abbate, Tomasz Skotnicki, S. Peru, L. Pinzelli, Thierry Poiroux, Pascal Gouraud, P. Boulenc, Y. Campidelli, L. Tosti, Remi Beneyton, A. Margain, Bich-Yen Nguyen
المصدر: 2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC).
مصطلحات موضوعية: Materials science, business.industry, Bipolar junction transistor, Electrical engineering, Silicon on insulator, Biasing, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Gate oxide, MOSFET, Materials Chemistry, Optoelectronics, Breakdown voltage, sense organs, Electrical and Electronic Engineering, business, Metal gate, High-κ dielectric, Communication channel, Ground plane
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fb4c010aab7814a296036ee1e69c503a
https://doi.org/10.1109/essderc.2011.6044222 -
6
المؤلفون: Christian Denat, Gerard Merckel, Tomasz Skotnicki
المصدر: Solid-State Electronics. 35:717-721
مصطلحات موضوعية: Engineering, Electrostatic discharge, Materials science, business.industry, Negative resistance, Bipolar junction transistor, Electrical engineering, Mechanism analysis, Parasitic bipolar transistor, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Key point, Nuclear magnetic resonance, Snapback, Materials Chemistry, N channel, Field-effect transistor, EPROM, Electrical and Electronic Engineering, business, Practical implications
-
7
المؤلفون: Abderrahman Merrachi, Gerard Merckel, Tomasz Skotnicki
المصدر: Solid-State Electronics. 34:1297-1307
مصطلحات موضوعية: Physics, Condensed matter physics, Field (physics), Computer simulation, business.industry, Electrical engineering, Biasing, Substrate (electronics), Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Materials Chemistry, Field-effect transistor, Electrical and Electronic Engineering, Base (exponentiation), business, Constant (mathematics), Static induction transistor
-
8
المؤلفون: Jean-Damien Chapon, A. Pouydebasque, S. Vadot, Stephane Denorme, C. Laviron, Scott Warrick, K. Romanjek, D. Delille, H. Bernard, Aomar Halimaoui, Franck Arnaud, Francois Leverd, Romain Gwoziecki, B. Dumont, Tomasz Skotnicki, I. Pouilloux, C. Chaton, Pascal Gouraud, M. Bidaud, Frederic Boeuf, Francois Wacquant, Nicolas Planes
المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..
مصطلحات موضوعية: Materials science, business.industry, Annealing (metallurgy), Electrical engineering, Ring oscillator, Laser, PMOS logic, Ion, law.invention, CMOS, law, Optoelectronics, Static random-access memory, business, NMOS logic
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::90b0ca29a4ffd23bb80e55ad2667d71b
https://doi.org/10.1109/iedm.2005.1609438 -
9
المؤلفون: D. Aime, A. Mondot, Julien-Marc Roux, M. Muller, A. Toffoli, Francois Leverd, G. Ribes, Pascal Gouraud, B. Froment, S. Descombes, Yves Morand, Alexandre Talbot, Simone Pokrant, Tomasz Skotnicki
المصدر: Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005..
مصطلحات موضوعية: Materials science, Silicon, business.industry, Transistor, Electrical engineering, chemistry.chemical_element, Single step, Hardware_PERFORMANCEANDRELIABILITY, Epitaxy, PMOS logic, law.invention, Reliability (semiconductor), CMOS, chemistry, law, MOSFET, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, business, Hardware_LOGICDESIGN
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::dbd6ce46f468f008752c62f1ef34de6d
https://doi.org/10.1109/essder.2005.1546682 -
10
المؤلفون: C. Denat, Gerard Merckel, Tomasz Skotnicki
المصدر: [Proceedings] 1993 International Workshop on VLSI Process and Device Modeling (1993 VPAD).
مصطلحات موضوعية: Engineering, business.industry, Subthreshold conduction, Electrical engineering, Optoelectronics, Solid modeling, Mosfet circuits, business, Saturation (magnetic), Subthreshold slope, Threshold voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f16fde2df5cbddb2aa090d8cc43e41c2
https://doi.org/10.1109/vpad.1993.724762