المؤلفون: Yuzong Chen, Lu Lu, Bongjin Kim, Tony Tae-Hyoung Kim

المصدر: IEEE Open Journal of Circuits and Systems, Vol 2, Pp 210-222 (2021)

مصطلحات موضوعية: Resistive random access memory (ReRAM), ternary content addressable memory (TCAM), computing in-memory (CIM), reconfigurable architecture, Electric apparatus and materials. Electric circuits. Electric networks, TK452-454.4

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9335229/; https://doaj.org/toc/2644-1225

URL الوصول: https://doaj.org/article/e2951a1d57be4889ad87fc4cb25cd9c2

المؤلفون: Ju Eon Kim, Taegeun Yoo, Dong-Kyu Jung, Dong-Hyun Yoon, Kiho Seong, Tony Tae-Hyoung Kim, Kwang-Hyun Baek

المصدر: IEEE Access, Vol 8, Pp 101359-101368 (2020)

مصطلحات موضوعية: Asynchronous, compensation, low power, process voltage temperature (PVT), successive approximation register~(SAR) analog-to-digital converter (ADC), Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9103088/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/408a85f4782d4a5696a6078ff566fd49

المؤلفون: Kiho Seong, Dong-Kyu Jung, Dong-Hyun Yoon, Jae-Soub Han, Ju-Eon Kim, Tony Tae-Hyoung Kim, Woojoo Lee, Kwang-Hyun Baek

المصدر: Sensors, Vol 20, Iss 8, p 2430 (2020)

مصطلحات موضوعية: analog-to-digital converter (ADC), successive approximation register (SAR) ADC, time-interleaved SAR ADC, timing-skew calibration, comparator offset, ultra-wideband (UWB) wireless communication, Chemical technology, TP1-1185

وصف الملف: electronic resource

Relation: https://www.mdpi.com/1424-8220/20/8/2430; https://doaj.org/toc/1424-8220

URL الوصول: https://doaj.org/article/3879131b6b0c4ed9873858142b1a3441

المؤلفون: Mini Jayakrishnan, Alan Chang, Tony Tae-Hyoung Kim

المصدر: Journal of Low Power Electronics and Applications, Vol 9, Iss 1, p 5 (2019)

مصطلحات موضوعية: better than worst case design, error tolerance, slack re-distribution, time borrowing, Applications of electric power, TK4001-4102

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2079-9268/9/1/5; https://doaj.org/toc/2079-9268

URL الوصول: https://doaj.org/article/acbd5a3d25d14c2589ea0779fed94a1e

المؤلفون: Mini Jayakrishnan, Alan Chang, Tony Tae-Hyoung Kim

المصدر: Journal of Low Power Electronics and Applications, Vol 8, Iss 2, p 9 (2018)

مصطلحات موضوعية: variation tolerance, slack balancing, under design, logic reshaping, Applications of electric power, TK4001-4102

وصف الملف: electronic resource

Relation: http://www.mdpi.com/2079-9268/8/2/9; https://doaj.org/toc/2079-9268

URL الوصول: https://doaj.org/article/fd56bf723e964e4bb2fa20798e72a9bf

المؤلفون: Zeinolabedin, Seyed Mohammad Ali, Do, Anh Tuan, Dongsuk Jeon, Sylvester, Dennis, Tony Tae-Hyoung Kim

المصدر: 2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits) VLSI Circuits (VLSI-Circuits), 2016 IEEE Symposium on. :1-2 Jun, 2016

Relation: 2016 IEEE Symposium on VLSI Circuits

المؤلفون: Zhou, Jun, Xin Liu, Chao Wang, Kah-Hyong Chang, Jianwen Luo, Jingjing Lan, Lei Liao, Yat-Hei Lam, Yongkui Yang, Bo Wang, Xin Zhang, Wang Ling Goh, Tony Tae-Hyoung Kim, Minkyu Je

المصدر: 2014 International SoC Design Conference (ISOCC) SoC Design Conference (ISOCC), 2014 International. :70-71 Nov, 2014

Relation: 2014 International SoC Design Conference (ISOCC)

المؤلفون: Yuzong Chen, Junjie Mu, Hyunjoon Kim, Lu Lu, Tony Tae-Hyoung Kim

المصدر: IEEE Transactions on Circuits and Systems I: Regular Papers. 70:2016-2027

مصطلحات موضوعية: Hardware and Architecture, Electrical and Electronic Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::87601a23723fc11860a268ed799ec270
https://doi.org/10.1109/tcsi.2023.3240303

المؤلفون: Hyunjoon Kim, Junjie Mu, Chengshuo Yu, Tony Tae-Hyoung Kim, Bongjin Kim

المصدر: IEEE Transactions on Circuits and Systems I: Regular Papers. 70:1580-1590

مصطلحات موضوعية: Hardware and Architecture, Electrical and Electronic Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::92fa954c607dce38b75b53398e8e0e82
https://doi.org/10.1109/tcsi.2022.3232648

المؤلفون: Yong-Jun Jo, Xin Zhang, Jiahao Liu, Jun Zhou, Yuanjin Zheng, Tony Tae-Hyoung Kim

المصدر: IEEE Solid-State Circuits Letters. 6:81-84

مصطلحات موضوعية: Electrical and Electronic Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c476b0e6e0a14b54d52657a119a7c144
https://doi.org/10.1109/lssc.2023.3260090