المؤلفون: Tsuyoshi Mito, Honoka Kawakami, Toru Ikoma, Yuki Ukai, Mizuho Tsuchiya, Eri Kubo, Hiroshi Sasaki

المصدر: BMC Ophthalmology, Vol 22, Iss 1, Pp 1-5 (2022)

مصطلحات موضوعية: Positive dysphotopsia, Intrascleral intraocular lens fixation, Peripheral iridectomy, Intraocular lens edge, Ophthalmology, RE1-994

وصف الملف: electronic resource

Relation: https://doaj.org/toc/1471-2415

URL الوصول: https://doaj.org/article/e96f2fc926ba4248b1c29d3f320f94db

المؤلفون: Toru Ikoma, Teppei Shibata, Naoko Shibata, Tsuyoshi Mito, Eri Kubo, Hiroshi Sasaki

المصدر: BMC Ophthalmology, Vol 22, Iss 1, Pp 1-5 (2022)

مصطلحات موضوعية: Intense focused ultrasound procedure, Drop-like dense lens opacities, Rosette cataract, Case report, Ophthalmology, RE1-994

وصف الملف: electronic resource

Relation: https://doaj.org/toc/1471-2415

URL الوصول: https://doaj.org/article/c9770302cfb941d19f90f687c8aa6b68

المؤلفون: Hideo Miura, Ken Suzuki, Toru Ikoma, Seiji Samukawa, Hideki Yoshikawa, Shigenori Ueda, Yoshiyuki Yamashita, Keisuke Kobayashi

المصدر: 2008 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2008. IRPS 2008. IEEE International. :713-714 Apr, 2008

Relation: 2008 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Yoshiyuki Yamashita, Hideki Yoshikawa, Shigenori Ueda, Seiji Samukawa, Ken Suzuki, Yuta Ito, Keisuke Kobayashi, Toru Ikoma, Tomonori Kubota, Hideo Miura

المصدر: IEEE International Reliability Physics Symposium, 2009, 47th. 2009:376-381

مصطلحات موضوعية: Point Defects, Residual Stress, Materials science, Analytical chemistry, Oxide, chemistry.chemical_element, Quantum Chemical Molecular Dynamics, Tungsten, Hafnium, Carbide, High-k Gate Dielectrics, chemistry.chemical_compound, Atomic layer deposition, chemistry, Chemical engineering, Band Gap, Thin film, Hafnium Oxide, Layer (electronics), Hafnium dioxide, Synchrotronradiation Photoemission Spectroscopy

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0a1011b9311fa06cc60cd529f7a4c521
http://hdl.handle.net/10097/46403

المؤلفون: Chihiro Taguchi, Seiichi Fukuda, Seiji Samukawa, Kazuhiko Endo, Heiji Watanabe, Toru Ikoma

المصدر: Extended Abstracts of the 2006 International Conference on Solid State Devices and Materials.

مصطلحات موضوعية: Materials science, business.industry, Optoelectronics, Low leakage, Nanotechnology, Current (fluid), business, Beam (structure)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8332d7a8f29ada55f38f6e5887d96df1
https://doi.org/10.7567/ssdm.2006.p-1-24

المؤلفون: Takashi Matsukawa, Seiji Samukawa, Masahiro Yonemoto, Kazuhiko Endo, Toru Ikoma, Meishoku Masahara, Keisuke Sano

المصدر: Japanese Journal of Applied Physics. 48:04C007

مصطلحات موضوعية: Thermal oxidation, Materials science, Physics and Astronomy (miscellaneous), business.industry, Gate dielectric, Transistor, General Engineering, Oxide, General Physics and Astronomy, Equivalent oxide thickness, law.invention, chemistry.chemical_compound, chemistry, law, Lattice plane, MOSFET, Optoelectronics, business, Beam (structure)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::993a647cb7acd5b19e2580673cfa72c7
https://doi.org/10.1143/jjap.48.04c007