يعرض 1 - 10 نتائج من 141 نتيجة بحث عن '"Trager, J."', وقت الاستعلام: 0.99s تنقيح النتائج
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    مؤتمر

    المصدر: 1997 IEEE 47th Vehicular Technology Conference. Technology in Motion Vehicular technology Vehicular Technology Conference, 1997, IEEE 47th. 3:2201-2205 vol.3 1997

    Relation: 1997 IEEE 47th Vehicular Technology Conference. Technology in Motion

  3. 3
    مؤتمر

    المؤلفون: Trager, J.

    المصدر: International Conference on Microelectronic Test Structures Microelectronic Test Structures, 1990. ICMTS 1990. Proceedings of the 1990 International Conference on. :99-104 1990

    Relation: International Conference on Microelectronic Test Structures

  4. 4
    مؤتمر

    المؤلفون: Mautry, P.G., Trager, J.

    المصدر: International Conference on Microelectronic Test Structures Microelectronic Test Structures, 1990. ICMTS 1990. Proceedings of the 1990 International Conference on. :221-226 1990

    Relation: International Conference on Microelectronic Test Structures

  5. 5
    دورية أكاديمية

    المصدر: IEEE Design & Test of Computers IEEE Des. Test. Comput. Design & Test of Computers, IEEE. 29(4):56-57 Aug, 2012

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    مؤتمر

    المؤلفون: Trager, J., Sorger, U.K.

    المصدر: Proceedings. 1998 IEEE International Symposium on Information Theory (Cat. No.98CH36252) Information theory Information Theory, 1998. Proceedings. 1998 IEEE International Symposium on. :155 1998

    Relation: Proceedings 1998 IEEE International Symposium on Information Theory

  7. 7
    مؤتمر

    المؤلفون: Trager, J., Sorger, U.

    المصدر: Proceedings of IEEE International Symposium on Information Theory Information theory Information Theory. 1997. Proceedings., 1997 IEEE International Symposium on. :474 1997

    Relation: Proceedings of IEEE International Symposium on Information Theory

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    مؤتمر

    المصدر: Proceedings of the IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures, 1988. ICMTS. Proceedings of the 1988 IEEE International Conference on. :50-55 1988

    Relation: Proceedings of the IEEE International Conference on Microelectronic Test Structures

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    دورية أكاديمية

    المصدر: British Cactus & Succulent Journal, 2005 Sep 01. 23(3), 123-127.