المؤلفون: Melde, T., Trentzsch, M., Duenkel, S., Richter, R., Otto, M., Giesler, H., Weisbuch, F., Weddeler, N., Beyer, S.

المصدر: 2021 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2021 IEEE International. :1-4 May, 2021

Relation: 2021 IEEE International Memory Workshop (IMW)

المؤلفون: Jourba, S., Bollon, N., Decobert, C., Festes, G., Bertello, B., Zhou, F., Markov, V., Tkachev, Y., Kim, J., Ghazav, P., Liu, X., Do, N., Richter, R., Dunkel, S., Trentzsch, M., Zaka, A., Herrmann, T., Melde, T., Muller, B., Mauersberger, F., Bayha, B., Wittek, S., Duggan, M., Beyer, S.

المصدر: 2020 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2020 IEEE International. :1-4 May, 2020

Relation: 2020 IEEE International Memory Workshop (IMW)

المؤلفون: Lederer, M., Muller, F., Kuhnel, K., Olivo, R., Mertens, K., Trentzsch, M., Dunkel, S., Muller, J., Beyer, S., Seidel, K., Kampfe, T., Eng, L.M.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 41(12):1762-1765 Dec, 2020

المؤلفون: Mulaosmanovic, H., Dunkel, S., Trentzsch, M., Beyer, S., Breyer, E.T., Mikolajick, T., Slesazeck, S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(12):5804-5809 Dec, 2020

المؤلفون: Mulaosmanovic, H., Dunkel, S., Muller, J., Trentzsch, M., Beyer, S., Breyer, E.T., Mikolajick, T., Slesazeck, S.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 41(9):1420-1423 Sep, 2020

المؤلفون: Cagli, C., Perniola, L., Gaillard, F., Duenkel, S., Melde, T., Mueller, B., Trentzsch, M., Wittek, S., Beyer, S.

المصدر: 2019 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2019 IEEE International. :1-4 Mar, 2019

Relation: 2019 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Mulaosmanovic, H., Muller, F., Lederer, M., Ali, T., Hoffmann, R., Seidel, K., Zhou, H., Ocker, J., Mueller, S., Dunkel, S., Kleimaier, D., Muller, J., Trentzsch, M., Beyer, S., Breyer, E.T., Mikolajick, T., Slesazeck, S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(8):3466-3471 Aug, 2020

المؤلفون: Breyer, E.T., Mulaosmanovic, H., Trommer, J., Melde, T., Dunkel, S., Trentzsch, M., Beyer, S., Slesazeck, S., Mikolajick, T.

المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 8:748-756 2020

المؤلفون: Reis, D., Ni, K., Chakraborty, W., Yin, X., Trentzsch, M., Dunkel, S., Melde, T., Muller, J., Beyer, S., Datta, S., Niemier, M.T., Hu, X.S.

المصدر: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits IEEE J. Explor. Solid-State Comput. Devices Circuits Exploratory Solid-State Computational Devices and Circuits, IEEE Journal on. 5(2):103-112 Dec, 2019

المؤلفون: Zhou, H., Ocker, J., Pesic, M., Padovani, A., Trentzsch, M., Dunkel, S., Muller, J., Beyer, S., Larcher, L., Koushan, F., Muller, S., Mikolajick, T.

المصدر: 2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021

Relation: 2021 Symposium on VLSI Technology