المؤلفون: Bouillon-Minois, Jean-Baptiste^{Aff1, Aff2, IDs10140024022064_cor1}, Lambert, Céline, Dutheil, Frédéric, Raconnat, Julien, Benamor, Mouna, Dalle, Batiste, Laurent, Maxime, Adeyemi, Oluwaseun J., Lhoste-Trouilloud, Agnès, Schmidt, Jeannot

المصدر: Emergency Radiology: A Journal of Practical ImagingOfficial Journal of the American Society of Emergency Radiology. 31(2):125-131

المؤلفون: Hu, G., Safranski, C., Sun, J. Z., Hashemi, P., Brown, S. L., Bruley, J., Buzi, L., D'Emic, C. P., Galligan, E., Gottwald, M. G., Gunawan, O., Lee, J., Karimeddiny, S., Trouilloud, P. L., Worledge, D. C.

المصدر: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :10.2.1-10.2.4 Dec, 2022

Relation: 2022 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Worledge, D. C., Safranski, C., Hu, G., Sun, J. Z., Hashemi, P., Brown, S. L., Buzi, L., D'Emic, C. P., Gottwald, M. G., Gunawan, O., Jung, H., Karimeddiny, S., Kim, J., Trouilloud, P. L.

المصدر: 2022 IEEE 33rd Magnetic Recording Conference (TMRC) Magnetic Recording Conference (TMRC), 2022 IEEE 33rd. :1-2 Aug, 2022

Relation: 2022 IEEE 33rd Magnetic Recording Conference (TMRC)

المؤلفون: Safranski, C., Hu, G., Sun, J. Z., Hashemi, P., Brown, S. L., Buzi, L., D'Emic, C. P., Edwards, E. R. J., Galligan, E., Gottwald, M. G., Gunawan, O., Karimeddiny, S., Jung, H., Kim, J., Latzko, K., Trouilloud, P. L., Zare, S., Worledge, D. C.

المصدر: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :288-289 Jun, 2022

Relation: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Hu, G., Lauer, G., Sun, J. Z., Hashemi, P., Safranski, C., Brown, S. L., Buzi, L., Edwards, E. R. J., D'Emic, C. P., Galligan, E., Gottwald, M. G., Gunawan, O., Jung, H., Kim, J., Latzko, K., Nowak, J. J., Trouilloud, P. L., Zare, S., Worledge, D. C.

المصدر: 2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :2.5.1-2.5.4 Dec, 2021

Relation: 2021 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Safranski, Christopher, Kaiser, Jan, Trouilloud, Philip, Hashemi, Pouya, Hu, Guohan, Sun, Jonathan Z

مصطلحات موضوعية: Condensed Matter - Mesoscale and Nanoscale Physics

URL الوصول: http://arxiv.org/abs/2010.14393

المؤلفون: Atmani, H., Merienne, F., Fofi, D., Trouilloud, P.

المصدر: ELCVIA: electronic letters on computer vision and image analysis; 2008: Vol.: 7 Núm.: 3 Special Issue on Quality Control by Artificial Vision; p. 115-128

وصف الملف: application/pdf

Relation: https://www.raco.cat/index.php/ELCVIA/article/view/150404/202304

URL الوصول: https://www.raco.cat/index.php/ELCVIA/article/view/150404

المؤلفون: Edwards, E. R. J., Hu, G., Brown, S. L., D'Emic, C. P., Gottwald, M. G., Hashemi, P., Jung, H., Kim, J., Lauer, G., Nowak, J. J., Sun, J. Z., Suwannasiri, T., Trouilloud, P. L., Woo, S., Worledge, D. C.

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :24.4.1-24.4.4 Dec, 2020

Relation: 2020 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Hu, G., Nowak, J. J., Gottwald, M. G., Brown, S. L., Doris, B., D'Emic, C. P., Hashemi, P., Houssameddine, D., He, Q., Kim, D., Kim, J., Kothandaraman, C., Lauer, G., Lee, H K, Marchack, N., Reuter, M., Robertazzi, R. P., Sun, J. Z., Suwannasiri, T., Trouilloud, P. L., Woo, S., Worledge, D. C.

المصدر: 2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :2.6.1-2.6.4 Dec, 2019

Relation: 2019 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Emmanuel Reynard, Mélanie Clivaz, Séverine Trouilloud

المصدر: Mountain Research and Development, Vol 43, Iss 2, Pp P1-P3 (2023)

مصطلحات موضوعية: interdisciplinary centre for mountain research (cirm), Environmental sciences, GE1-350

وصف الملف: electronic resource

Relation: https://doaj.org/toc/0276-4741; https://doaj.org/toc/1994-7151

URL الوصول: https://doaj.org/article/f34422d1dc254de8bace988771840892