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المؤلفون: Troya Cagil Koylu, Moritz Fieback, Said Hamdioui, Mottaqiallah Taouil
المصدر: 2022 IEEE 31st Asian Test Symposium (ATS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b1151c6c73692732a9c05141cfe06095
https://doi.org/10.1109/ats56056.2022.00030 -
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المؤلفون: Nevin George, Guilherme Cardoso Medeiros, Junchao Chen, Josie Esteban Rodriguez Conda, Thomas Lange, Aleksa Damljanovic, Raphael Segabinazzi Ferreira, Aneesh Balakrishnan, Xinhui (Anna) Lai, Shayesteh Masoumian, Dmytro Petryk, Troya Cagil Koylu, Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Cemil Cem Gürsoy, Said Hamdioui, Mottaqiallah Taouil, Milos Krstic, Peter Langendoerfer, Zoya Dyka, Marcelo Brandalero, Michael Hübner, Jörg Nolte, Heinrich Theodor Vierhaus, Matteo Sonza Reord, Giovanni Squillero, Luca Sterpone, Jaan Raik, Dan Alexandrescu, Maximilien Glorieux, Georgios Selimis, Geert-Jan Schrijen, Anton Klotz, Christian Sauer, Maksim Jenihhin
مصطلحات موضوعية: Fault-Tolerance, Security, EDA tools, Reliability, Quality, nanoeletronic systems design
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::861be548967445da682d3197a01a7d8a
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المؤلفون: Gursoy, Cemil Cem, Medeiros, Guilherme, Junchao Chen, George, Nevin, Condia, Josie Esteban Rodriguez, Lange, Thomas, Damljanovic, Aleksa, Ferreira, Raphael Segabinazzi, Balakrishnan, Aneesh, Xinhui Anna Lai, Shayesteh Masoumian, Petryk, Dmytro, Troya Cagil Koylu, Silva, Felipe Augusto Da, Bagbaba, Ahmet Cagri, Hamdioui, Said, Motaguillah Taouil, Milos Krstic, Langendoerfer, Peter, Dyka, Zoya, Huebner, Michael, Joerg Nolte, Vierhaus, Heinrich Thoodor, Reorda, Matteo Sonza, Squillero, Giovanni, Sterpone, Luca, Raik, Jaan, Alexandrescu, Dan, Glorieux, Maximilien, Georgis Selimis, Gert-Jan Schrijen, Klotz, Anton, Sauer, Christian, Jenihhin, Maksim
المصدر: University Booth-Design, Automation & Test in Europe Conference & Exhibition (Univerity Booth DATE 2019)
مصطلحات موضوعية: reliability, security, verification, test, fault tolerance, EDA tools, nanoelectronic systems design, H2020 MSCA ITN
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5b28da4ef57e81aef30627d13c807fa3