المؤلفون: Ahmad, T., Ashraf, A., Truscan, D., Domi, A., Porres, I.

المصدر: IEEE Access Access, IEEE. 8:195000-195020 2020

المؤلفون: Enoiu, Eduard Paul, PhD, Truscan, D., Sadovykh, A., Mallouli, W.

المصدر: ACM International Conference Proceeding Series.

مصطلحات موضوعية: DevOps, monitoring, security, testing, verification, Cryptography, Software testing, Development time, Operation time, Root cause, Security flaws, Security issues, Security requirements, Security verification, Software methodologies, Verification-and-validation

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:mdh:diva-65197
https://doi.org/10.1145/3600160.3605054

المؤلفون: Afzal, W., Bruneliere, H., Di Ruscio, D., Sadovykh, A., Mazzini, S., Cariou, E., Truscan, D., Cabot, J., Field, D., Pomante, L., Smrz, P.

المصدر: 2017 Euromicro Conference on Digital System Design (DSD) DSD Digital System Design (DSD), 2017 Euromicro Conference on. :494-501 Aug, 2017

Relation: 2017 Euromicro Conference on Digital System Design (DSD)

المؤلفون: Virtanen, S., Truscan, D., Paakkulainen, J., Isoaho, J., Lilius, J.

المصدر: International Conference on Field Programmable Logic and Applications, 2005. Field programmable logic and applications Field Programmable Logic and Applications, 2005. International Conference on. :269-274 2005

Relation: Proceedings. 2005 International Conference on Field Programmable Logic and Applications

المؤلفون: Truscan, D., Fernandes, J.M., Lilius, J.

المصدر: Proceedings. 11th IEEE International Conference and Workshop on the Engineering of Computer-Based Systems, 2004. Engineering of computer-based systems Engineering of Computer-Based Systems, 2004. Proceedings. 11th IEEE International Conference and Workshop on the. :388-397 2004

Relation: Proceedings. 11th IEEE International Conference and Workshop on the Engineering of Computer-Based Systems

المؤلفون: Truscan, D.

المصدر: Proceedings Norchip Conference, 2004. Norchip Conference, 2004. Proceedings. :225-228 2004

المؤلفون: Afzal, Wasif, Bruneliere, H., Di Ruscio, D., Sadovykh, A., Mazzini, S., Cariou, E., Truscan, D., Cabot, J., Gómez, A., Gorroñogoitia, J., Pomante, L., Smrz, P.

المصدر: Microprocessors and microsystems. 61:86-95

مصطلحات موضوعية: Design time, Megamodelling, Model-driven engineering, Runtime, Industrial research, Life cycle, Continuous development, Electronic industries, Industrial enterprise, Runtimes, Traceability managements, Research and development management

وصف الملف: electronic

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:mdh:diva-39979
https://mdh.diva-portal.org/smash/get/diva2:1222405/FULLTEXT01.pdf

المؤلفون: Lilius, J., Truscan, D., Virtanen, S.

المصدر: 2003 Design, Automation and Test in Europe Conference and Exhibition Design, automation and test in Europe Design, Automation and Test in Europe Conference and Exhibition, 2003. :158-163 suppl. 2003

Relation: 6th Design Automation and Test in Europe (DATE 03)

المؤلفون: Truscan, D., Virtanen, S., Lilius, J.

المصدر: Signals, Circuits and Systems, 2003. SCS 2003. International Symposium on. 1:309-312 vol.1 2003

Relation: 2003 International Symposium on Signals, Circuits and Systems

المؤلفون: Sadovykh, A., Bagnato, A., Truscan, D., Pierini, P., Bruneliere, H., Gómez, A., Cabot, J., Avila-García, O., Afzal, Wasif

المصدر: Adv. Intell. Sys. Comput.. :265-274

مصطلحات موضوعية: Architecture, Document generation, Model-driven engineering, Modelio, Requirement engineering, SysML, Traceability, UML, Computer programming, Computer science, Application programs

وصف الملف: print

URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:mdh:diva-43179