المؤلفون: Chang, Ruey-Dar, Liao, Hsueh-Chun, Lin, Jui-Chang, Tsai, Jung-Ruey

المصدر: 2018 22nd International Conference on Ion Implantation Technology (IIT) Ion Implantation Technology (IIT), 2018 22nd International Conference on. :86-89 Sep, 2018

Relation: 2018 22nd International Conference on Ion Implantation Technology (IIT)

المؤلفون: Tsai, Jung-Ruey, Chang, Ruey-Dar, Chou, Cheng-Hui, Liao, Hsueh-Chun, Huang, Sz-Kai, Lin, Sung-Hung, Lin, Jui-Chang

المصدر: 2016 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2016 International Conference on. :168-171 Mar, 2016

Relation: 2016 International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Tsai, Jung-Ruey, Wen, Ting-Ting, Yang, Shao-Ming, Sheu, Gene, Chang, Ruey-Dar, Syu, Yi-Jhen, Liu, Chin-Ping, Chang, Hsiu-Fu, Wei, Zhao-Hui

المصدر: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2015 IEEE 22nd International Symposium on the. :318-321 Jun, 2015

Relation: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Tsai, Jung-Ruey, Chang, Yi-Sheng, Lin, Jui-Chang, Bai, Shu-Ming, Sheu, Gene, Yang, Shao-Ming, Wu, Chun-Hsien, Liao, Hsueh-Chun, Chang, Ruey-Dar

المصدر: 2014 International Symposium on Next-Generation Electronics (ISNE) Next-Generation Electronics (ISNE), 2014 International Symposium on. :1-4 May, 2014

Relation: 2014 International Symposium on Next-Generation Electronics (ISNE)

المؤلفون: Amethystna, Surya Kris, Nidhi, Karuna, Yang, Shao-Ming, Sheu, Gene, Tsai, Jung-Ruey, Siddiqui, Md Imran

المصدر: 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) Semiconductor Electronics (ICSE), 2012 10th IEEE International Conference on. :699-702 Sep, 2012

Relation: 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE)

المؤلفون: Permata, Prima Sukma, Anwar, Mohammed Sadique, Siddiqui, Md. Imran, Yang, Shao-Ming, Tsai, Jung-Ruey, Sheu, Gene

المصدر: 2012 International Conference on Optoelectronics and Microelectronics Optoelectronics and Microelectronics (ICOM), 2012 International Conference on. :519-523 Aug, 2012

Relation: 2012 International Conference on Optoelectronics and Microelectronics (ICOM)

المؤلفون: Prabowo, Briliant Adhi, Amethystna, Surya Kris, Tsai, Jung-Ruey, Yang, Shao-Ming, Sheu, Gene

المصدر: 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the. :1-4 Jul, 2012

Relation: 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012)

المؤلفون: Purwadi, Bai, Shu-Ming, Prabowo, Briliant Adhi, Tsai, Jung-Ruey, Sheu, Gene

المصدر: 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the. :1-4 Jul, 2012

Relation: 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012)

المؤلفون: Prabowo, Briliant Adhi, Anumeha, Prakash, Abijith, Kumar, Raunak, Sheu, Gene, Tsai, Jung-Ruey, Yang, Shao-Ming

المصدر: TENCON 2011 - 2011 IEEE Region 10 Conference. :1356-1360 Nov, 2011

Relation: TENCON 2011 - 2011 IEEE Region 10 Conference

المؤلفون: Tsai Minchin, Sheu Gene, Tsai Jung Ruey, Yang Shaoming

المصدر: IEEE 2011 10th International Conference on Electronic Measurement & Instruments Electronic Measurement & Instruments (ICEMI), 2011 10th International Conference on. 4:5-9 Aug, 2011

Relation: 2011 IEEE 10th International Conference on Electronic Measurement & Instruments (ICEMI)