المؤلفون: Wu, Shien-Yang, Chang, C.H., Chiang, M.C., Lin, C.Y., Liaw, J.J., Cheng, J.Y., Yeh, J.Y., Chen, H.F., Chang, S.Y., Lai, K.T., Liang, M.S., Pan, K.H., Chen, J.H., Chang, V.S., Luo, T.C., Wang, X., Mor, Y.S., Lin, C.I., Wang, S.H., Hsieh, M.Y., Chen, C.Y., Wu, B.F., Lin, C.J., Liang, C.S., Tsao, C.P., Li, C.T., Chen, C.H., Hsieh, C.H., Liu, H.H., Chen, P.N., Chen, C.C., Chen, R., Yeo, Y.C., Chui, C.O., Chang, W., Lee, T.L., Huang, K.B., Lin, H.J., Chen, K.W., Tsai, M.H., Chen, K.S., Chen, X.M., Cheng, Y.K., Wang, C.H., Shue, W., Ku, Y., Jang, S. M., Cao, M., Lu, L.C., Chang, T.S.

المصدر: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :27.5.1-27.5.4 Dec, 2022

Relation: 2022 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Chang, Chih-Hao, Chang, V.S., Pan, K.H., Lai, K.T., Lu, J. H., Ng, J.A., Chen, C.Y., Wu, B.F., Lin, C.J., Liang, C.S., Tsao, C.P., Mor, Y.S., Li, C.T., Lin, T.C., Hsieh, C.H., Chen, P.N., Hsu, H.H., Chen, J.H., Chen, H.F., Yeh, J.Y., Chiang, M.C., Lin, C.Y., Liaw, J.J., Wang, C.H., Lee, S.B., Chen, C.C., Lin, H.J., Chen, R., Chen, K.W., Chui, C.O., Yeo, Y.C., Huang, K.B., Lee, T.L., Tsai, M.H., Chen, K.S., Lu, Y.C., Jang, S.M., Wu, S.-Y.

المصدر: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :27.1.1-27.1.4 Dec, 2022

Relation: 2022 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Yang, S.M., Wang, J.Y., Chen, M.D., Tsai, M.H.

المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 19(20):9149-9155 Oct, 2019

المؤلفون: Yang, S.M., Chen, M.D., Tsai, M.H.

المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 19(13):4829-4836 Jul, 2019

المؤلفون: Yang, S.H., Sheu, J.Y., Ieong, M.K., Chiang, M.H., Yamamoto, T., Liaw, J.J., Chang, S.S., Lin, Y.M., Hsu, T.L., Hwang, J.R., Ting, J.K., Wu, C.H., Ting, K.C., Yang, F.C., Liu, C.M., Wu, I.L., Chen, Y.M., Chent, S.J., Chen, K.S., Cheng, J.Y., Tsai, M.H, Chang, W., Chen, R., Chen, C.C., Lee, T.L., Lin, C.K, Yang, S.C., Sheu, Y.M., Tzeng, J.T., Lu, L.C., Jang, S.M, Diaz, C.H., Mii, YJ

المصدر: 2011 IEEE Custom Integrated Circuits Conference (CICC) Custom Integrated Circuits Conference (CICC), 2011 IEEE. :1-5 Sep, 2011

Relation: 2011 IEEE Custom Integrated Circuits Conference - CICC 2011

المؤلفون: Chen, M.D., Wang, J.Y., Yang, S.M., Tsai, M.H.

المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 19(1):58-64 Jan, 2019

المؤلفون: Dehng, G.K., Kuo, C.F., Wang, S.T., Tsai, M.H., Ku, C.C., Yeh, V., Ke, L.W., Hsiao, C.M., Chiu, C., Tzeng, B., Tang, C.C., Bo, J.C., Juan, R., Chuansheng Ren, Hongxi Xue

المصدر: 2004 IEE Radio Frequency Integrated Circuits (RFIC) Systems. Digest of Papers Radio frequency integrated circuits Radio Frequency Integrated Circuits (RFIC) Symposium, 2004. Digest of Papers. 2004 IEEE. :427-430 2004

Relation: 2004 IEE Radio Frequency Integrated Circuits (RFIC) Systems. Digest of Papers

المؤلفون: Shih, C.H., Su, H.W., Lin, C.J., Ko, T., Chen, C.H., Huang, J.J., Chou, S.W., Peng, C.H., Hsieh, C.H., Tsai, M.H., Shue, W., Yu, C.H., Liang, M.S.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :337-340 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Li, C.H., Tu, K.C., Chu, H.C., Chang, I.H., Liaw, W.R., Lee, H.F., Lien, W.Y., Tsai, M.H., Liang, W.J., Yeh, W.G., Chou, H.M., Chen, C.Y., Chi, M.H.

المصدر: 13th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference. Advancing the Science and Technology of Semiconductor Manufacturing. ASMC 2002 (Cat. No.02CH37259) Advanced semiconductor manufacturing Advanced Semiconductor Manufacturing 2002 IEEE/SEMI Conference and Workshop. :21-26 2002

Relation: 13th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference. Advancing the Science and Technology of Semiconductor Manufacturing. ASMC 2002

المؤلفون: Wu, C.C., Leung, Y.K., Chang, C.S., Tsai, M.H., Huang, H.T., Lin, D.W., Sheu, Y.M., Hsieh, C.H., Liang, W.J., Han, L.K., Chen, W.M., Chang, S.Z., Wu, S.Y., Lin, S.S., Lin, H.C., Wang, C.H., Wang, P.W., Lee, T.L., Fu, C.Y., Chang, C.W., Chen, S.C., Jang, S.M., Shue, S.L., Lin, H.T., See, Y.C., Mii, Y.J., Diaz, C.H., Lin, B.J., Liang, M.S., Sun, Y.C.

المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :65-68 2002

Relation: IEEE International Electron Devices Meeting