المؤلفون: Tsu, R., McPherson, J.W., McKee, W.R.

المصدر: 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) Reliability physics Reliability Physics Symposium, 2000. Proceedings. 38th Annual 2000 IEEE International. :348-353 2000

Relation: 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual

المؤلفون: Nicollian, E.H., Chen, S.-S., Tsu, R.

المصدر: IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop Advanced Semiconductor Manufacturing Conference and Workshop, 1990. ASMC 90 Proceedings. IEEE/SEMI 1990. :33-36 1990

Relation: IEEE/SEMI Conference on Advanced Semiconductor Manufacturing Workshop

المؤلفون: Asghar, M, Mahmood, K, Ferguson, IT, Raja, M Yasin A, Xie, YH, Tsu, R, Hasan, M-A

المصدر: Semiconductor Science and Technology. 28(10)

مصطلحات موضوعية: Condensed Matter Physics, Electrical and Electronic Engineering, Materials Engineering, Applied Physics

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/9wc3d3sp

المؤلفون: Asghar, M, Mahmood, K, Ferguson, IT, Raja, MYA, Xie, YH, Tsu, R, Hasan, MA

المصدر: Semiconductor Science and Technology. 28(10)

مصطلحات موضوعية: Applied Physics, Condensed Matter Physics, Materials Engineering, Electrical and Electronic Engineering

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/9wc3d3sp

المؤلفون: Semet, V., Binh, V.T., Zhang, J.P., Yang, J., Khan, M.A., Tsu, R.

المصدر: Technical Digest of the 17th International Vacuum Nanoelectronics Conference (IEEE Cat. No.04TH8737) Vacuum nanoelectronics Vacuum Nanoelectronics Conference, 2004. IVNC 2004. Technical Digest of the 17th International. :264-265 2004

Relation: Technical Digest of the 17th International Vacuum Nanoelectronics Conference

المؤلفون: Tsu, R., Boeringer, D.W., Nicollian, E.H.

المصدر: 1996 54th Annual Device Research Conference Digest Device research Device Research Conference, 1996. Digest. 54th Annual. :178-179 1996

Relation: 1996 54th Annual Device Research Conference Digest

المؤلفون: Khamankar, R., Jiang, B., Tsu, R., Hsu, W.-Y., Nulman, J., Summerfelt, S., Anthony, M., Lee, J.

المصدر: 1995 Symposium on VLSI Technology. Digest of Technical Papers VLSI technology VLSI Technology, 1995. Digest of Technical Papers. 1995 Symposium on. :127-128 1995

Relation: 1995 Symposium on VLSI Technology. Digest of Technical Papers

المؤلفون: Asghar, M., Fatima, K., Ain, Noor Ul, Tsu, R., Mahmood, K.

المصدر: In Materials Today: Proceedings 2015 2(10) Part B:5808-5814

المؤلفون: Tsu, R.^Aff3, Babić, D.^Aff3

المساهمون: Vial, Jean-Claude, editor^Aff1, Derrien, Jacques, editor^Aff2

المصدر: Porous Silicon Science and Technology : Winter School Les Houches, 8 to 12 February 1994. 1:111-119

المؤلفون: Tsu, R.^Aff4, Babic, D.^Aff4

المساهمون: Bensahel, Daniel C., editor^Aff1, Canham, Leigh T., editor^Aff2, Ossicini, Stephano, editor^Aff3

المصدر: Optical Properties of Low Dimensional Silicon Structures. 244:203-210