يعرض 1 - 10 نتائج من 2,198 نتيجة بحث عن '"Tsuchiya, R"', وقت الاستعلام: 1.13s تنقيح النتائج
  1. 1
    دورية أكاديمية

    المصدر: IEEE Journal of Selected Topics in Quantum Electronics IEEE J. Select. Topics Quantum Electron. Selected Topics in Quantum Electronics, IEEE Journal of. 28(3: Hybrid Integration for Silicon Photonics):1-9 Jun, 2022

  2. 2
    مؤتمر

    المصدر: 2014 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2014 IEEE. :1-4 Nov, 2014

    Relation: 2014 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

  3. 3
    مؤتمر

    المؤلفون: Tsuchiya, R., Muramoto, Y., Shimizu, N.

    المصدر: 2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Electrical Insulation and Dielectric Phenomena (CEIDP), 2014 IEEE Conference on. :800-803 Oct, 2014

    Relation: 2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2014)

  4. 4
    مؤتمر

    المصدر: 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC) Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2013 IEEE. :1-5 Oct, 2013

    Relation: 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC)

  5. 5
    مؤتمر

    المصدر: 2012 IEEE Nuclear Science Symposium and Medical Imaging Conference Record (NSS/MIC) Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2012 IEEE. :1577-1580 Oct, 2012

    Relation: 2012 IEEE Nuclear Science Symposium and Medical Imaging Conference (2012 NSS/MIC)

  6. 6
    مؤتمر

    المؤلفون: Tsuchiya, R., Muramoto, Y., Shimizu, N.

    المصدر: 2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Electrical Insulation and Dielectric Phenomena (CEIDP), 2011 Annual Report Conference on. :796-799 Oct, 2011

    Relation: 2011 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2011)

  7. 7
    مؤتمر

    المصدر: 2010 IEEE International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2010 IEEE International. :1049-1052 May, 2010

    Relation: 2010 IEEE International Reliability Physics Symposium (IRPS)

  8. 8
    مؤتمر

    المصدر: Proceedings of the 2004 IEEE International Conference on Control Applications, 2004. Control applications Control Applications, 2004. Proceedings of the 2004 IEEE International Conference on. 2:1717-1722 Vol.2 2004

    Relation: Proceedings of the 2004 IEEE International Conference on Control Applications

  9. 9
    مؤتمر

    المصدر: 2004 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.04CH37525) VLSI circuits VLSI Circuits, 2004. Digest of Technical Papers. 2004 Symposium on. :288-291 2004

    Relation: 2004 Symposium on VLSI Circuits. Digest of Technical Papers

  10. 10
    مؤتمر

    المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :631-634 2004

    Relation: 2004 International Electron Devices Meeting